IEEE-300-1988-R2006.pdf
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1、Recognized as an American National Standard (ANSI) Copyright 1988 by The Institute of Electrical and Electronics Engineers, Inc 345 East 47th Street, New York, NY 10017, USA No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior w
2、ritten permission of the publisher IEEE Std 300-1988(R2006) (Revision of IEEE Std 300-1982) IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors Sponsor Nuclear Instruments and Detectors Committee of the IEEE Nuclear and Plasma Sciences Society Reaffirmed March 30, 2006 Approve
3、d June 9, 1988 IEEE Standards Board Approved February 7, 1989 American National Standards Institute Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/25/2007 03:32:07 MDTNo re
4、production or networking permitted without license from IHS -,-,- IEEE Standards documents are developed within the Technical Committees of the IEEE Societies and the Standards Coordinating Committees of the IEEE Standards Board. Members of the committees serve voluntarily and without compensation.
5、They are not necessarily members of the Institute. The standards developed within IEEE represent a consensus of the broad expertise on the subject within the Institute as well as those activities outside of IEEE which have expressed an interest in participating in the development of the standard. Us
6、e of an IEEE Standard is wholly voluntary. The. existence of an IEEE Standard does not imply that there are no other ways to produce, test, measure, purchase, market, or provide other goods and services related to the scope of the IEEE Standard. Furthermore, the viewpoint expressed at the time a sta
7、ndard is approved and issued is subject to change brought about through developments in the state of the art and comments received from users of the standard. Every IEEE Standard is subjected to review at least once every Five years for revision or reafrmation. When a document is more than ve years
8、old, and has not been reafrmed, it is reasonable to conclude that its contents, although still of some value, do not wholly reect the present state of the art. Users are cautioned to check to determine that they have the latest edition of any IEEE Standard. Comments for revision of IEEE Standards ar
9、e welcome from any interested party, regardless of membership afliation with IEEE. Suggestions for changes in documents should be in the form of a proposed change of text, together with appropriate supporting comments. Interpretations: Occasionally questions may arise regarding the meaning of portio
10、ns of standards as they relate to specic applications. When the need for interpretations is brought to the attention of IEEE, the Institute will initiate action to prepare appropriate responses. Since IEEE Standards represent a consensus of all concerned interests, it is important to ensure that any
11、 interpretation has also received the concurrence of a balance of interests. For this reason IEEE and the members of its technical committees are not able to provide an instant response to interpretation requests except in those cases where the matter has previously received formal consideration. Co
12、mments on standards and requests for interpretations should be addressed to: Secretary, IEEE Standards Board 345 East 47th Street New York, NY 10017 USA IEEE Standards documents are adopted by the Institute of Electrical and Electronics Engineers without regard to whether their adoption may involve
13、patents on articles, materials, or processes. Such adoption does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the standards documents. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license w
14、ith IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/25/2007 03:32:07 MDTNo reproduction or networking permitted without license from IHS -,-,- iii Foreword (This Foreword is not a part of IEEE Std 300-1988, IEEE Standard Test Procedures for Semiconductor Charged-Particle Detect
15、ors.) This standard provides standard test procedures for semiconductor charged-particle detectors for ionizing radiation. It supersedes the previous edition, ANSI/IEEE Std 300-1982. The standard has been modied and rened based on the experience gained in using the earlier edition over a number of y
16、ears, taking into account advances in the technology. Companion documents are ANSI/IEEE Std 301-1988, Test Procedures for Ampliers and Preampliers Used with Detectors of Ionizing Radiation, and ANSI/ IEEE Std 759-1984, IEEE Standard Test Procedures for Semiconductor X- ray Energy Spectrometers. This
17、 standard was prepared by the Nuclear Instruments and Detectors Committee of the IEEE Nuclear and Plasma Sciences Society. When this standard was approved the members of the committee were: Sanford Wagner , Chair Louis Costrell , Secretary Muzaffer Atac J. G. Bellian J. A. Coleman D. C. Cook J. F. D
18、etko Edward Fairstein* F. S. Goulding Ronald Keyser F. A. Kirsten H. W. Kraner G. L. Miller D. E. Persyk P. L. Phelps K. L. Swinth J. H. Trainor S. Wagner F. J. Walter *Served as project leader for this revision. At the time this standard was published it was under consideration for approval as an A
19、merican National Standard. The American National Standards Committee N42 on Radiation Instrumentation had the following members at the time this document was sent to letter ballot. Louis Costrell , Chair David C. Cook , Secretary American Conference of Governmental Industrial HygienistsJesse Lieberm
20、an Battelle Pacic Northwest Laboratories.J. M. Selby Health Physics Society.J. B. Horner Kuper J. M. Selby ( Alt ) Institute of Electrical and Electronics Engineers.Louis Costrell D. C. Cook ( Alt ) A. J. Spurgin ( Alt ) J. Forster ( Alt ) Lawrence Berkeley LaboratoryL. J. Wagner Nuclear Suppliers A
21、ssociationK. F. Sinclair Oak Ridge National LaboratoryH. R. Brashear D. J. Knowles ( Alt ) US Nuclear Regulatory Commission.E. C. Wenzinger US Department of Energy.Gerald Goldstein US Department of the Army Materiel CommandBasil Markow US Department of Commerce, National Bureau of Standards Louis Co
22、strell US Federal Emergency Management Agency . Carl R. Siebentritt, Jr Members-at-Large.J. G. Bellian D. C. Cook John M. Gallagher, Jr D. A. Mack E. J. Vallario Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Stand
23、ards 1/9972545001 Not for Resale, 04/25/2007 03:32:07 MDTNo reproduction or networking permitted without license from IHS -,-,- iv The following persons were on the balloting committee that approved this document for submission to the IEEE Standards Board. A. Atac J. G. Bellian J. A. Coleman D.C. Co
24、ok L. Costrell J. Detko E. Fairstein F.S. Goulding R. Keyser F. A. Kirsten H.W. Kraner G. L. Miller D. E Persyk P.L. Phelps J.A. Trainor K.L. Swinth S. Wagner F.J. Walter When the IEEE Standards Board approved this standard on June 9, 1988, it had the following membership: Donald C. Fleckenstein , C
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