IEEE-1450.6-2005.pdf
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1、IEEE Std 1450.6-2005 IEEE Standard Test Interface Language (STIL) for Digital Test Vector DataCore Test Language (CTL) I E E E 3 Park Avenue New York, NY 10016-5997, USA 5 April 2006 IEEE Computer Society Sponsored by the Test Technology Standards Committee Copyright The Institute of Electrical and
2、Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:34:25 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright The Institute of Electrical and Electronics Engineers, Inc. Provid
3、ed by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:34:25 MDTNo reproduction or networking permitted without license from IHS -,-,- Recognized as an American National Standard (ANSI) IEEE Std 1450.6-2005 IEEE Standard Test Interface Language
4、(STIL) for Digital Test Vector DataCore Test Language (CTL) Sponsor Test Technology Standards Committee of the IEEE Computer Society Approved 29 December 2005 American National Standards Institute Approved 17 November 2005 IEEE-SA Standards Board Copyright The Institute of Electrical and Electronics
5、 Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:34:25 MDTNo reproduction or networking permitted without license from IHS -,-,- The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY
6、 10016-5997, USA Copyright 2006 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 5 April 2006. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any indi- vidual
7、 standard for educational classroom use can also be obtained through the Copyright Clearance Center. NOTEAttention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with
8、respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patents for which a license may be required by an IEEE standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its a
9、ttention. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:34:25 MDTNo reproduction or networking permitted without license from IHS -,-,- ivCopyright 2006 IEEE. A
10、ll rights reserved. Introduction CTL started as a language in the IEEE Std 1500TM-2005 standardization activity for core test. This activity provided a representation mechanism for test information that exchanges hands between a core provider and the system integrator. Thus, the language had a chart
11、er to provide a mechanism for reuse of test patterns and information that allows for successful design for test and automatic test pattern generator activities on the SoC. As part of IEEE Std 1500-2005, CTL was designed to represent details about the IEEE 1500 wrapper. As CTL and the wrapper technol
12、ogy matured, it became apparent that the two activities should be separated into two standard documents. As a result of this decision, CTL, the language, became IEEE Std 1450.6 activity, and the information model for cores that uses CTL remained in IEEE Std 1500-2005. Notice to users Errata Errata,
13、if any, for this and all other standards can be accessed at the following URL: http:/ standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standar
14、ds.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent r
15、ights in connection therewith. The IEEE shall not be responsible for identifying patents or patent applications for which a license may be required to implement an IEEE standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention. Participa
16、nts The following is a list of participants in the CTL Working Group: Rohit Kapur, Chair When the CTL Working Group approved this standard, it had the following short-term membership: Mike Collins Douglas Kay Brion KellerMaurice Lousberg Paul Reuter Bill ChownYuhai Ma This introduction is not part o
17、f IEEE Std 1450.6-2005, IEEE Standard Test Interface Language (STIL) for Digital Test Vector DataCore Test Language (CTL). Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21
18、/2007 11:34:25 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright 2006 IEEE. All rights reserved.v The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention: When the IEEE-SA
19、Standards Board approved this standard on 17 November 2005, it had the following membership: Steve M. Mills, Chair Richard H. Hulett, Vice Chair Don Wright, Past Chair Judith Gorman, Secretary *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish K. Agga
20、rwal, NRC Representative Richard DeBlasio, DOE Representative Alan H. Cookson, NIST Representative Jennie M. Steinhagen IEEE Standards Project Editor Ken-ichi Anzou Luis Basto Sudipta Bhawmik Dwayne Burek Chen-Huan Chiang Keith Chow Bill Chown Antonio M. Cicu Luis Cordova Jason Doege Geir Eide Grady
21、 Giles Alan Hales Peter Harrod Mitsuaki Ishikawa Rohit Kapur Jake Karrfalt Douglas Kay Brion Keller Adam Ley Dennis Lia Maurice Lousberg Yuhai Ma Ryan Madron Erik Jan Marinissen Denis Martin Gregory Maston Yinghua Min Mehdi Mohtashemi James Monzel Narayanan Murugesan Benoit Nadeau-Dostie Charles Nge
22、the Jim OReilly Adam Osseiran Klaus Rapf Paul Reuter Mike Ricchetti Gordon Robinson Gil Shultz Douglas E. Sprague Tony Taylor Tom Waayers Gregg Wilder T. W. Williams Li Zhang Mark D. Bowman Dennis B. Brophy Joseph Bruder Richard Cox Bob Davis Julian Forster* Joanna N. Guenin Mark S. Halpin Raymond H
23、apeman William B. Hopf Lowell G. Johnson Herman Koch Joseph L. Koepfinger* David J. Law Daleep C. Mohla Paul Nikolich T. W. Olsen Glenn Parsons Ronald C. Petersen Gary S. Robinson Frank Stone Malcolm V. Thaden Richard L. Townsend Joe D. Watson Howard L. Wolfman Copyright The Institute of Electrical
24、and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:34:25 MDTNo reproduction or networking permitted without license from IHS -,-,- viCopyright 2006 IEEE. All rights reserved. Contents 1.Overview 1 1.1 Ge
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