IEEE-61523-3-2004.pdf
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1、 INTERNATIONAL STANDARD IEC 61523-3 First edition 2004-09 IEEE 1497 Delay and power calculation standards Part 3: Standard Delay Format (SDF) for the electronic design process Reference number IEC 61523-3(E):2004 IEEE Std. 1497(E):2001 Copyright The Institute of Electrical and Electronics Engineers,
2、 Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:47:33 MDTNo reproduction or networking permitted without license from IHS -,-,- Publication numbering As from 1 January 1997 all IEC publications are issued with a designation in
3、 the 60000 series. For example, IEC 34-1 is now referred to as IEC 60034-1. Consolidated editions The IEC is now publishing consolidated versions of its publications. For example, edition numbers 1.0, 1.1 and 1.2 refer, respectively, to the base publication, the base publication incorporating amendm
4、ent 1 and the base publication incorporating amendments 1 and 2. Further information on IEC publications The technical content of IEC publications is kept under constant review by the IEC, thus ensuring that the content reflects current technology. Information relating to this publication, including
5、 its validity, is available in the IEC Catalogue of publications (see below) in addition to new editions, amendments and corrigenda. Information on the subjects under consideration and work in progress undertaken by the technical committee which has prepared this publication, as well as the list of
6、publications issued, is also available from the following: IEC Web Site (www.iec.ch) Catalogue of IEC publications The on-line catalogue on the IEC web site (www.iec.ch/searchpub) enables you to search by a variety of criteria including text searches, technical committees and date of publication. On
7、-line information is also available on recently issued publications, withdrawn and replaced publications, as well as corrigenda. IEC Just Published This summary of recently issued publications (www.iec.ch/online_news/ justpub) is also available by email. Please contact the Customer Service Centre (s
8、ee below) for further information. Customer Service Centre If you have any questions regarding this publication or need further assistance, please contact the Customer Service Centre: Email: custserviec.ch Tel: +41 22 919 02 11 Fax: +41 22 919 03 00 Copyright The Institute of Electrical and Electron
9、ics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:47:33 MDTNo reproduction or networking permitted without license from IHS -,-,- Delay and power calculation standards Part 3: Standard Delay Format (SDF) for the el
10、ectronic design process INTERNATIONAL STANDARD IEC 61523-3 First edition 2004-09 IEEE 1497 Commission Electrotechnique Internationale International Electrotechnical Commission IEEE 2004 Copyright - all rights reserved IEEE is a registered trademark in the U.S. Patent any IEC National Committee inter
11、ested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance wi
12、th conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested
13、IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible fo
14、r the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between
15、 any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with an IEC Publication. 6) Attention
16、is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC/IEEE 61523-3 has been processed through IEC technical committee 93: Design au
17、tomation. The text of this standard is based on the following documents: IEEE Std FDIS Report on voting 1497 (2001) 93/191/FDIS 93/196/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been dra
18、fted in accordance with the ISO/IEC Directives. The committee has decided that the contents of this publication will remain unchanged until 2006. IEC 61523 consists of the following parts, under the general title Delay and power calculation standards: IEC 61523-1, Part 1: Integrated circuit delay an
19、d power calculation systems Published by IEC under licence from IEEE. 2004 IEEE. All rights reserved. IEC 61523-3:2004(E) IEEE 1497-2001(E) 3 Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 No
20、t for Resale, 04/21/2007 11:47:33 MDTNo reproduction or networking permitted without license from IHS -,-,- IEC 61523-2, Part 2: Pre-layout delay calculation specification of CMOS ASIC libraries IEC/IEEE 61523-3, Part 3: Standard Delay Format (SDF) for the electronic process Published by IEC under l
21、icence from IEEE. 2004 IEEE. All rights reserved. IEC 61523-3:2004(E) IEEE 1497-2001(E) 4 Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:47:33 MDTNo reproduction
22、 or networking permitted without license from IHS -,-,- IEC/IEEE Dual Logo International Standards This Dual Logo International Standard is the result of an agreement between the IEC and the Institute of Electrical and Electronics Engineers, Inc. (IEEE). The original IEEE Standard was submitted to t
23、he IEC for consideration under the agreement, and the resulting IEC/IEEE Dual Logo International Standard has been published in accordance with the ISO/IEC Directives. IEEE Standards documents are developed within the IEEE Societies and the Standards Coordinating Committees of the IEEE Standards Ass
24、ociation (IEEE-SA) Standards Board. The IEEE develops its standards through a consensus development process, approved by the American National Standards Institute, which brings together volunteers representing varied viewpoints and interests to achieve the final product. Volunteers are not necessari
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