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1、Relay Systems Associated with Electric Power Apparatus IEEE Std C37.90.1-2002“ (Revision of IEEE Std C37.90.1-1 98gTM) C37.90.1“ IEEE Standard for Surge Withstand Capability (SWC) Tests for Relays and IEEE Power Engineering Society Sponsored by the Power System Relaying Committee Published by The In
2、stitute of Electrical and Electronics Engineers, Inc 3 Park Avenue, New York, NY 10016-5997, USA 31 May2002 Print: SH94987 PDF: SS94987 IEEE Std C37.90.1 -20021M (Revision of IEEE Std C37.90.1-1989TM) IEEE Standard for Surge Withstand Capability (SWC) Tests for Relays and Relay Systems Associated wi
3、th Electric Power Apparatus Sponsor Power System Relaying Committee of the Power Engineering Society Approved 21 March 2002 IEEE-SA Standards Board Abstract: Two types of design tests for relays and relay systems that relate to the immunity of this equipment to repetitive electrical transients are s
4、pecified. Test generator characteristics, test wave- forms, selection of equipment terminals on which tests are to be conducted, test procedures, criteria for acceptance, and documentation of test results are described. This standard has been harmo- nized with IEC standards where consensus could be
5、reached. Keywords: fast transient test, oscillatory test, relay, relay systems, surge withstand capability The Institute of Electrical and Electronics Engineers, Inc 3 Park Avenue, New York, NY 10016-5997, USA Copyright O 2002 by the Institute of Electrical and Electronics Engineers, Inc. All rights
6、 reserved. Published 31 May 2002. Printed in the United States of America. Print: ISBN 0-7381 -3255-1 SH94987 PDF: ISBN 0-7381 -3256-X SS94987 No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publis
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24、Copyright Clearance Center. -,-,- I EEE-SA Trademark UsageKom pl iance Statement Proper usage of the trademark IEEE Std C37.90.1-2002m is mandatory and is to be followed in all refer- ences of the Standard. The mark IEEE is the registered trademark of the Institute of Electrical and Elec- tronics En
25、gineers, Inc., and must be used in bold type. It is to appear with the registered trademark symbol “W the first time “IEEE appears in the text. The use of “BEE Std C37.90.1-2002” should include the trademark symbol “TM (e.g., IEEE Std C37.90.1-2002m) at least the first time it is used in text, unles
26、s the number of the standard is also trademark registered (e.g., 802), then the symbol “W must be used. It is not permissible to use the standard number alone or with “IEEE to indicate conformance or compliance with the associated standard. The user of the Standard should contact the Manager, Standa
27、rds Licensing and Contracts for information concerning issues regarding indicating product compliance with an IEEE standard. To represent that a product has been designed to meet an IEEE standard, it is permissible to state that “the product has been engineered, designed or manufactured with the int
28、ent to meet the requirements of IEEE Std C37.90.1-2002m .” However, it is not permissible to state or refer to a product as “C37.90.1 compliant,” “C37.90.1 certified,” “IEEE C37.90.1 conformant,” “IEEE C37.90.1 certified,” or the like, unless the user has obtained a Certification License from the BE
29、E. Copyright O 2002 IEEE. All rights reserved. . 111 In trod uct ion (This introduction is not part of IEEE Std C37.90.1-2002TM , IEEE Standard for Surge Withstand Capability (SWC) Tests for Relays and Relay Systems Associated with Electric Power Apparatus.) Assurance is needed that electronic relay
30、s and relay systems will operate satisfactorily when installed in the harsh environment of a substation or switchyard. Standard surge tests will provide assurance that the relays and relay systems will withstand a specified surge level. The use of proper grounding and shielding techniques when insta
31、lling the equipment will attenuate the actual surge level impinging on the equipment. However, even with proper grounding and shielding, surges may reach the equipment that are above the test levels specified in this standard. In such cases, the addition by the user of surge suppression devices exte
32、rnal to the relay system may be required. The first standard document to specify an SWC test was ANSUIEEE Std C37.90a-l974/IEEE Std 472-1974 (redesignated ANSILEEE Std C37.90.1-1974), IEEE Guide for Surge Withstand Capability (SWC) Tests. Experience with ANSI/IEEE Std C37.90.1-1974 was good, and in
33、1978 the guide was incorporated as section 9 of ANSI/IEEE Std C37.90-1978, IEEE Standard for Relays and Relay Systems Associated with Electric Power Apparatus. This meant that the oscillatory SWC test became a required test for relays and relay systems containing semiconducting devices. From the beg
34、inning, it was realized that the oscillatory SWC test had limitations and did not adequately represent all conducted transients that may be experienced in substation environments. The need for a complementary test was recognized and the general type of test required was identified. The problem then
35、became one of a search for a circuit that would produce a repeatable, controllable output. During the search, the IEC showering arc test was studied as well as a number of other tests proposed by various organizations. These were not chosen because they were not repeatable or controllable. The combi
36、nation of the fast transient SWC test and the oscillatory SWC test ensure that relays and relay sys- tems will function at a level of immunity in the presence of conducted transients that occur in substations. The fast transient test was therefore incorporated into ANSI/IEEE Std C37.90.1-1989, becau
37、se it is stable, easy to control, and can be performed in a minimum time and at a reasonable cost. A working group was later assembled to harmonize ANSILEEE Std C37.90.1-1989 with corresponding IEC standards and to make the standard more understandable through clarifications and improvements to the
38、document. This working group made extensive revisions such that one set of tests are necessary to reach closer harmonization with the corresponding IEC standards. Participants At the time this standard was approved, the working group had the following membership: Jeff Burnworth Jack Chadwick, Jr. Cl
39、ifford Downs William Higinbotham Jeffrey G. Gilbert, Chair Jim Teague, Vice Chair Jerry Johnson William C. Kotheimer John McConnell Robert D. Pettigrew Mario M. Ranien Mark S. Simon Veselin Skendzic John T. Tengdin iv Copyright O 2002 IEEE. All rights reserved. -,-,- At the time this standard was ap
40、proved, the members of the Relaying Practices and Consumer Interface Sub- committee were Jeffrey G. Gilbert, Chair A. P. Apostolov Munnu Bajpai B. L. Beckwith John R. Boyle Jeff Burnworth Mark W. Carpenter Jack Chadwick, Jr. M. Clark M. W. Conroy Clifford Downs Paul R. Drum Irwin O. Hasenwinkle S .
41、H. Horowitz James D. Huddleston, III James W. Ingleson M. Kezunovic William C. Kotheimer P. A. Kotos E. Knzauskas W. Lowe William J. Marsh, Jr. Michael J. McDonald P. J. McLaren M. Meisinger B. Nelson Robert D. Pettigrew T. Phillippee Mario M. Ranieri M. S . Sachdev Tarlochan Sidhu Mark S . Simon L.
42、 E. Smith James E. Stephens R. Sullivan Malcolm J. Swanson James Teague J. S . Thorp Demetnos A. Tziouvaras Enc A. Udren Y. Young Stan E. Zocholl The following members of the balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. Richard Angle
43、Russell W. Gonnam Roger E. Ray John Appleyard John Kenneth Greene Radhaknshna V. Rebbapragada Munnu Bajpai E. A. Guro Jesus Martinez Rodriguez Robert W. Beckwith Robert W. Haas Minam P. Sanders G. Benmouyal Robert E. Hall Kenneth H. Sebra Hubert Bilodeau Irwin O. Hasenwinkle Tarlochan Sidhu Stuart B
44、orlase Roger A. Hedding Mark S . Simon Stuart H. Bouchey Charles F. Henville Veselin Skendzic John R. Boyle William Higinbotham James E. Stephens James A. Bnght Jerry W. Hohn James E. Stoner Daniel F. Brosnan John J. Horwath William M. Strang John F. Burger James D. Huddleston, III Peter Sutherland
45、Salvatore P. Carfagno Chris R. Huntley Malcolm J. Swanson Mark W. Carpenter James W. Ingleson Glenn Swift Robert C. Carruth K. J. Khunkhun John H. Taylor Stephen P. Conrad Joseph L. Koepfinger Richard P. Taylor Robert L. Copyak William C. Kotheimer James Teague Douglas C. Dawson William J. Marsh, Jr
46、. John T. Tengdin Clifford Downs Michael J. McDonald Stanley Thompson Paul R. Drum M. Meisinger Demetrios A. Tziouvaras Patrick M. Duggan Gary L. Michel Joe T. Uchiyama Walter Elmore Richard B. Miller Eric A. Udren James W. Evans Dean H. Miller Charles L. Wagner Ron J. Farquharson Daleep C. Mohla Ro
47、nald M. Westfall W. E. Feero Charles J. Mozina Philip B. Winston Kenneth Fodero Brian Mugalian Murty V. Yalla Julian Forster George R. Nail John A. Zipp Jeffrey G. Gilbert Arun G. Phadke Stan E. Zocholl Mietek T. Glinkowski Alan C. Pierce John A. Zulaski Mario M. Ranien Copyright O 2002 IEEE. All ri
48、ghts reserved. V -,-,- When the IEEE-SA Standards Board approved this standard on 21 March 2002, it had the following membership: James T. Carlo, Chair James H. Gurney, Vice Chair Judith Gorman, Secretary Sid Bennett H. Stephen Berger Clyde R. Camp Richard DeBlasio Harold E. Epstein Julian Forster*
49、Howard M. Frazier Toshio Fukuda Arnold M. Greenspan Raymond Hapeman Donald M. Heirman Richard H. Hulett Lowell G. Johnson Joseph L. Koepfinger* Peter H. Lips *Member Emeritus Also included is the following nonvoting IEEE-SA Standards Board liaison: Alan Cookson, NIST Representative Satish K. Aggarwal, NRC Representative Noelle D. Humenick IEEE Standards Project Editor Nader Mehravari Daleep C. Mohla Willaim J. Moylan Malcolm V. Thaden Geoffrey O. Thompson Howard L. Wolf
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