IEEE-1193-2003.pdf
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1、IEEE Std 1193-2003 (Revision of IEEE Std 1193-1994) IEEE Standards 1193 TM IEEE Guide for Measurement of Environmental Sensitivities of Standard Frequency Generators Published by The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA 12 March 2004 IEE
2、E Standards Coordinating Committee 27 Sponsored by the IEEE Standards Coordinating Committee 27 on Time and Frequency IEEE Standards Print: SH95139 PDF: SS95139 Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standa
3、rds 1/9972545001 Not for Resale, 04/21/2007 11:57:46 MDTNo reproduction or networking permitted without license from IHS -,-,- Recognized as an American National Standard (ANSI) IEEE Std 1193-2003 (Revision of IEEE Std 1193-1994) IEEE Guide for Measurement of Environmental Sensitivities of Standard
4、Frequency Generators Sponsor IEEE Standards Coordinating Committee 27 on Time and Frequency Approved 12 June 2003 IEEE-SA Standards Board Approved 17 September 2003 American National Standards Institute Abstract: Standard frequency generators that include all atomic frequency standards, quartz oscil
5、lators, dielectric resonator oscillators, yttrium-iron-garnet oscillators, cavity oscillators, sapphire oscillators, and thin-film resonator based oscillators are addressed. Keywords: atomic clock, atomic frequency standard, environmental sensitivities, frequency standard, oscillator, quartz crystal
6、 oscillator, standard frequency generator The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2004 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 12 March 2004. Printed in the United States o
7、f America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. NOTEAttention is called to the possibility that implementation of this
8、standard may require use of subject mat- ter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patents for which a license may be re
9、quired by an IEEE standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not
10、for Resale, 04/21/2007 11:57:46 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright 2004 IEEE. All rights reserved.iii Introduction (This introduction is not part of IEEE Std 1193-2003, IEEE Guide for Measurement of Environmental Sensitivites of Standard Frequency Gen
11、erators.) Techniques to characterize and measure the frequency and phase instabilities in frequency and time devices and in received radio signals are of fundamental importance to all manufacturers and users of frequency and time technology. In 1988, the IEEE Standards Coordinating Committee 27 (SCC
12、27) Time and Frequency, issued IEEE Std 1139TM-1988, Standard Definitions of Physical Quantities for Fundamental Frequency and Time Metrology, which defined and confirmed those measures of instability in frequency generators that had gained general acceptance by researchers, designers, and users thr
13、oughout the world. In 1999, the SCC27 issued a revision of this standard, IEEE Std 1139TM-1999. After issuing IEEE Std 1139-1988, SCC27 then embarked on a much more ambitious effort aimed not only at codifying proper terminology, but also at providing guidelines for the characterizations and use of
14、frequency and time standards in realistic environments. In 1994, the SCC27 issued the result of this work, IEEE Std 1193TM-1994, which covered all important environmental conditions to which time and frequency devices are normally exposed. This standard aids the designer and manufacturer in characte
15、rizing their product and helps the user to properly accept, test, and confirm the specified behavior of devices in a variety of environmental conditions. This standard is a revision of IEEE Std 1193-1994, which had been prepared by a previous SCC27 consisting of Helmut Hellwig, Chair; John R. Vig, V
16、ice Chair; David Allan; Arthur Ballato; Michael Fischer; Sigfrido Leschiutta; Joseph Suter; Richard Sydnor; Jacques Vanier; and Gernot M. R. Winkler. Many sections of the 1994 standard remain unchanged. Participants The following is a list of participants in the IEEE Standards Coordinating Committee
17、 27 (SCC27) Time and Frequency. Eva S. Ferre-Pikal, Chair John R. Vig, Vice Chair The following members of the balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. James C. Camparo Leonard S. Cutler Christopher Ekstrom Lute Maleki Victor S. R
18、einhardt William J. Riley Fred L. Walls Joseph D. White Gary Donner Eva S. Ferre-Pikal William George Fossey Fernando GenKuong Robert Graham Yeou-Song Lee Gregory Luri Ahmad MahinFallah Lute Maleki Gary Michel Lisa M. Nelson Charles Ngethe Johannes Rickmann James Ruggieri Steven Tilden Donald Voltz
19、Zhenxue Xu Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:57:46 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright 2004 IEEE. Al
20、l rights reserved.iv When the IEEE-SA Standards Board approved this standard on 12 June 2003, it had the following membership: Don Wright, Chair Howard M. Frazier, Vice Chair Judith Gorman, Secretary *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Alan Co
21、okson, NIST Representative Satish K. Aggarwal, NRC Representative Don Messina IEEE Standards Project Editor H. Stephen Berger Joe Bruder Bob Davis Richard DeBlasio Julian Forster* Toshio Fukuda Arnold M. Greenspan Raymond Hapeman Donald M. Heirman Laura Hitchcock Richard H. Hulett Anant Jain Lowell
22、G. Johnson Joseph L. Koepfinger* Tom McGean Steve Mills Daleep C. Mohla William J. Moylan Paul Nikolich Gary Robinson Malcolm V. Thaden Geoffrey O. Thompson Doug Topping Howard L. Wolfman Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELic
23、ensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:57:46 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright 2004 IEEE. All rights reserved.v CONTENTS 1.Overview 1 1.1 Scope 1 1.2 Purpose. 1 1.3 Summary 2 1.3.1General considerations in the metro
24、logy of environmental sensitivities (refer to Clause 3) 2 1.3.2Acceleration effects (refer to Clause 4). 2 1.3.3Temperature, humidity, and pressure (refer to Clause 5) 2 1.3.4Electric and magnetic fields. 3 1.3.5Ionizing and particle radiation (refer to Clause 7). 3 1.3.6Aging, warm-up time, and ret
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