IEEE-C62.32-2004.pdf
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1、IEEE Std C62.32-2004 (Revision of IEEE Std C62.32-1981) IEEE Standards C62.32 TM IEEE Standard Test Methods for Low-Voltage Air Gap Surge-Protective Device Components (Excluding Valve and Expulsion Types) 3 Park Avenue, New York, NY 10016-5997, USA IEEE Power Engineering Society Sponsored by the Sur
2、ge Protective Devices Committee IEEE Standards 11 May 2005 Print: SH95316 PDF: SS95316 -,-,- Recognized as an American National Standard (ANSI) The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2005 by the Institute of Electrical and El
3、ectronics Engineers, Inc. All rights reserved. Published 11 May 2005. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the
4、 Copyright Clearance Center. NOTEAttention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the exist- ence or validity of any patent rights in connectio
5、n therewith. The IEEE shall not be responsible for identifying patents for which a license may be required by an IEEE standard or for conducting inquiries into the legal valid- ity or scope of those patents that are brought to its attention. Copyright 2005 IEEE. All rights reserved. iii Introduction
6、 The low-voltage air gap surge-protective device is a gap-type overvoltage limiter for use on communica- tions, power, and signaling circuits. It has been used in one form or another for many years. With the development of newer and more sophisticated electronic apparatus, which was usually more vul
7、- nerable to the electrical environment, it became evident that there was an industry-wide requirement for improved protective devices. An effort to address this problem was initiated in 1970 when the IEEE Surge Protective Devices Committee formed its Low-Voltage Surge-Protective Devices Working Gro
8、up. It soon became apparent that there were no standard terms to describe these devices or standard tests that would permit comparison with other similar or different devices. The working group first addressed the gas tube arrester and published IEEE Std 465.1-1977 (later redesignated as ANSI/IEEE S
9、td C62.31), IEEE Stan- dard Test Specifications for Gas Tube Surge-Protective Devices. Experts were drawn from any fields ranging from communications and power utilities, through electronics manufacturers, to manufacturers of Air Gap Surge-Protective Devices. The diverse requirements, experi- ences,
10、 and vocabularies of these representatives were melded to produce this standard, which should be of service to all potential users. Notice to users Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/ standards.ieee.org/reading/ieee/updates/errata/inde
11、x.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the possibility that implementation of this standard may requ
12、ire use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patents or patent applications for which a license may b
13、e required to implement an IEEE standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention. This introduction is not a part of IEEE Std C62.32-2004, IEEE Standard Test Methods for Low-Voltage Air Gap Surge-Protective Device Components (Ex
14、cluding Valve and Expulsion Types). -,-,- iv Copyright 2005 IEEE. All rights reserved. Participants For the revision of this document, a new working group was formed in 2000. At the time this standard was approved, the working group had the following membership: Hans-Wolfgang Oertel, Chair Mick Mayt
15、um, Vice Chair Jack Cawley, Secretary* Nisar Chaudhry, Secretary Other former members of the working group who contributed to this standard were: M. Flack, Chair W. W. Hines, Secretary The following members of the individual balloting committee voted on this standard. Balloters may have voted for ap
16、proval, disapproval, or abstention. Richard BentingerBill Curry Benny Lee Donald Turner S. C. Bartolutti S. Demircioglu R. A. Frech F. D. Martzloff V. B. Nolan H. P. Price C. A. Rychetski W. S. Sedlacek P. D. Speranza J. P. Wehle T. D. Zimmerman Richard Bentinger Mark Bushnell James Case Tommy Coope
17、r Carlo Donati Clifford C. Erven James Funke Ernie Gallo William Goldbach William Greason Randall Groves Raymond Hill Ronald Hotchkiss Wilhelm Kapp Benny Lee Jason Lin Al Maguire Jesus Martinez Mark McGranaghan Nigel McQuin Gary Michel Daleep Mohla Charles Ngethe Hans-Wolfgang Oertel Joe Osterhout M
18、ichael Parente Thomas Rozek James Ruggieri David Singleton Hans Steinhoff Antony Surtees Donald Turner Steven Whisenant James Wilson Jonathan Woodworth * Denotes a member of the working group that is deceased. -,-,- Copyright 2005 IEEE. All rights reserved. v When the IEEE-SA Standards Board approve
19、d this standard on 8 December 2004, it had the following membership: Don Wright, Chair Steve M. Mills, Vice Chair Judith Gorman, Secretary *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish K. Aggarwal, NRC Representative Richard DeBlasio, DOE Represe
20、ntative Alan Cookson, NIST Representative Don Messina IEEE Standards Project Editor Chuck Adams Stephen Berger Mark D. Bowman Joseph A. Bruder Bob Davis Roberto de Marca Boisson Julian Forster* Arnold M. Greenspan Mark S. Halpin Raymond Hapeman Richard J. Holleman Richard H. Hulett Lowell G. Johnson
21、 Joseph L. Koepfinger* Hermann Koch Thomas J. McGean Daleep C. Mohla Paul Nikolich T. W. Olsen Ronald C. Petersen Gary S. Robinson Frank Stone Malcolm V. Thaden Doug Topping Joe D. Watson -,-,- vi Copyright 2005 IEEE. All rights reserved. Contents 1.Scope 1 2.Definitions 2 3.Service conditions 3 3.1
22、 Normal service conditions. 3 3.2 Unusual service conditions 3 4.Standard design test criteria. 4 4.1 General. 4 4.2 Ambient conditions 4 4.3 Necessary precautions for testing air gaps. 4 4.4 Current waveform decay time 4 4.5 Insulation resistance measurement and clearing source 5 4.6 DC breakdown v
23、oltage test 5 4.7 Capacitance test . 6 4.8 Insulation resistance test 6 4.9 Initial impulse breakdown voltage test 7 4.10 Impulse breakdown voltage variability test. 8 4.11 Maximum single impulse discharge current test . 9 4.12 Impulse life test 9 4.13 AC discharge current test. 10 4.14 Pulsed AC te
24、st 10 4.15 Alternating follow-on current test 11 4.16 DC holdover test 12 4.17 Failure mode 13 4.18 Fail-safe operation . 14 Annex A (informative) Bibliography. 15 Copyright 2005 IEEE. All rights reserved. 1 IEEE Standard Test Methods for Low-Voltage Air Gap Surge-Protective Device Components (Exclu
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