IEEE-C57.13.5-2003.pdf
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1、IEEE Std C57.13.5-2003 IEEE Standards C57.13.5 TM IEEE Trial-Use Standard of Performance and Test Requirements for Instrument Transformers of a Nominal System Voltage of 115 kV and Above Published by The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997,
2、USA 1 August 2003 IEEE Power Engineering Society Sponsored by the Transformer Committee IEEE Standards Print: SH95092 PDF: SS95092 Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resal
3、e, 04/25/2007 02:51:26 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/25/2007 02:51:26 MDTNo repro
4、duction or networking permitted without license from IHS -,-,- The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2003 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 1 August 2003. Printed i
5、n the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Note: Attention is called to the possibility that
6、implementation of this standard may require use of subject mat- ter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patents for wh
7、ich a license may be required by an IEEE standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Stan
8、dards 1/9972545001 Not for Resale, 04/25/2007 02:51:26 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright 2003 IEEE. All rights reserved. iii Introduction (This introduction is not part of IEEE Std C57.13.5-2003, IEEE Trial-Use Standard of Performance and Test Requir
9、e- ments for Instrument Transformers of a Nominal System Voltage of 115 kV and Above.) The mission of Working Group PC57.13.5 is to develop a comprehensive set of performance and test requirements for instrument transformers of a nominal system voltage of 115 kV and above. The objective is to improv
10、e the performance and safety of the instrument transformers in response to the concern indicated in the publication EPRI Workshop on Failed High Voltage Instrument Transformers, held in September 1990. This standard is also intended to introduce a)New tests to reflect our present understanding of fa
11、st high-voltage transient induced on instrument transformers under the operation of system disconnect conditions. b)New tests to verify the protection against internal arc, which has gradually been adopted by some utilities. Suggestions for improvement gained in the use of this standard will be welc
12、ome. They should be sent to the IEEE Standards Department. Participants This standard was produced by the IEEE Working Group PC57.13.5 on the Test Requirements for Instrument Transformers of a Nominal System Voltage of 115 kV and Above, which had the following membership: Joseph K. Ma, Co-Chair Pier
13、re Riffon, Co-Chair Publication of this trial-use standard for comment and criticism has been approved by the Institute of Electrical and Electronics Engineers. Trial-use standards are effective for 24 months from the date of publication. Comments for revision will be accepted for 18 months after pu
14、blication. Suggestions for revision should be directed to the Secretary, IEEE-SA Standards Board, 445 Hoes Lane, P.O. Box 1331, Piscataway, NJ 08855-1331, and should be received no later than 30 January 2005. It is expected that following the 24-month period, this trial-use standard, revised as nece
15、ssary, shall be submitted to the IEEE-SA Standards Board for approval as a full-use standard. Wayne Hansen Anthony Jonnatti Vladimir M. Khalin Paul Millward Ross McTaggart James E. Smith Alejandro Villasenor Loren B. Wagenaar Copyright The Institute of Electrical and Electronics Engineers, Inc. Prov
16、ided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/25/2007 02:51:26 MDTNo reproduction or networking permitted without license from IHS -,-,- iv Copyright 2003 IEEE. All rights reserved. The following members of the balloting committee voted on this
17、standard. Balloters may have voted for approval, disapproval, or abstention. When the IEEE-SA Standards Board approved this standard on 20 March 2003, it had the following membership: Don Wright, Chair Howard M. Frazier, Vice Chair Judith Gorman, Secretary *Member Emeritus Also included are the foll
18、owing nonvoting IEEE-SA Standards Board liaisons: Alan Cookson, NIST Representative Satish K. Aggarwal, NRC Representative Catherine Berger IEEE Standards Project Editor Samuel Aguirre Stan J. Arnot W. J. (Bill) Bergman Thomas Blackburn Alain Bolliger Jeffrey Britton Steven Brown Stephen Conrad Tomm
19、y Cooper James Cross John Crouse Guru Dutt Dhingra Paul Drum Fred Elliott Gary Engmann Jorge Fernandez-Daher Marcel Fortin Harry Gianakouros Randall Groves Bal Gupta Agit Gwal Wayne Hansen Robert Hartgrove Edward Horgan, Jr. James D. Huddleston, III Gael Kennedy Vladimir M. Khalin Stephen R. Lambert
20、 Boyd Leuenberger Maurice Linker Thomas Lundquist Gregory Luri Joseph K. Ma Al Maguire John Matthews Thomas McCaffrey Nigel McQuin Ross McTaggart Joseph Melanson Gary Michel Krste Najdenkoski Bipin Patel Dhiru Patel Wesley Patterson Paulette Payne Carlos Peixoto Donald Platts Thomas Prevost R. Rebba
21、pragada Johannes Rickmann Pierre Riffon James Ruggieri Jordan Shikoski H. Jin Sim Chuck Simmons James E. Smith Joseph Vaschak Loren B. Wagenaar James Wilson H. Stephen Berger Joe Bruder Bob Davis Richard DeBlasio Julian Forster* Toshio Fukuda Arnold M. Greenspan Raymond Hapeman Donald M. Heirman Lau
22、ra Hitchcock Richard H. Hulett Anant Jain Lowell G. Johnson Joseph L. Koepfi nger* Tom McGean Steve Mills Daleep C. Mohla William J. Moylan Paul Nikolich Gary Robinson Malcolm V. Thaden Geoffrey O. Thompson Doug Topping Howard L. Wolfman Copyright The Institute of Electrical and Electronics Engineer
23、s, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/25/2007 02:51:26 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright 2003 IEEE. All rights reserved. v Contents 1. Overview 1 1.1 Scope 1 1.2 Purpose. 1 2.
24、References 1 3.Definitions 3 4.General. 3 4.1 Insulation requirements 3 4.2 Mineral oil requirements 7 4.3 Requirements for accuracy and accuracy calibration systems. 7 4.4 Mechanical performance requirements 8 4.5 Thermal performance requirements. 9 4.6 Ground shield requirements. 9 4.7 Dissolved g
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