IEEE-1226-1998.pdf
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1、 The Institute of Electrical and Electronics Engineers, Inc. 345 East 47th Street, New York, NY 10017-2394, USA Copyright 1999 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 24 June 1999. Printed in the United States of America. Print: ISBN 0-7381-1545-
2、2SH94721 PDF: ISBN 0-7381-1546-0SS94721 No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publisher. IEEE Std 1226-1998 (Revision of IEEE Std 1226-1993) IEEE ABBET IEEE Trial-Use Standard for A Broad
3、- Based Environment for Test (ABBET) Overview and Architecture Sponsor IEEE Standards Coordinating Committee 20 Abbreviated Test Language for All Systems (ATLAS) Approved 8 December 1998 IEEE-SA Standards Board Abstract: The overall concept of A Broad-Based Environment for Test (ABBET) TM is defined
4、, and mandatory requirements for implementation of ABBET are specified. The elements of ABBET and their interrelationships are described. Guidelines and requirements governing the elements of the ABBET set of standards and guides are established, and common terms to be used throughout the set are de
5、fined. Keywords: ABBET TM , product test, diagnostics, software framework Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/25/2007 02:45:02 MDTNo reproduction or networking p
6、ermitted without license from IHS -,-,- IEEE Standards documents are developed within the IEEE Societies and the Standards Coordinating Com- mittees of the IEEE Standards Association (IEEE-SA) Standards Board. Members of the committees serve voluntarily and without compensation. They are not necessa
7、rily members of the Institute. The standards developed within IEEE represent a consensus of the broad expertise on the subject within the Institute as well as those activities outside of IEEE that have expressed an interest in participating in the development of the standard. Use of an IEEE Standard
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18、scope of those patents that are brought to its attention. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/25/2007 02:45:02 MDTNo reproduction or networking permitted without
19、 license from IHS -,-,- Copyright 1999 IEEE. All rights reserved. iii Introduction This introduction is not part of IEEE Std 1226-1998, IEEE Trial-Use Standard for A Broad-Based Environment for Test (ABBET), Overview and Architecture. The benefi ts of using standards in test-related applications hav
20、e long been recognized. The scope for stan- dardization extends from low-level standards associated with test instrument control to high-level standards associated with specifying tests in an implementation-independent manner. In the 1960s, Aeronautical Radio, Incorporated (ARINC) started the develo
21、pment of the Abbreviated Test Language for Avionics Systems (ATLAS). In 1976, management of the ATLAS standard was passed to the IEEE, and the ATLAS acronym was changed to Abbreviated Test Language for All Systems to refl ect its broader fi eld of applications. Within the IEEE, development of ATLAS
22、and ATLAS-related standards was vested in an ad hoc committee, which later became the IEEE Standards Coordinating Committee 20 (SCC20). In the mid-1980s, SCC20 broadened the scope of its activities to embrace other standards projects related to test and diagnosis, includ- ing Automatic Test Program
23、Generation (ATPG), Test Equipment Description Language (TEDL), Artifi cial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE), and A Broad Based Environ- ment for Test (ABBET). This standard provides the framework for a family of standards providing software interface specifi
24、 cations for test-related applications and environments. This family incorporates object-oriented technology and information modeling to specify programming language-independent interfaces between elements within a wide variety of test environments, including built-in test systems (BIT), automatic t
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