IEC-PAS-62483-2006.pdf
《IEC-PAS-62483-2006.pdf》由会员分享,可在线阅读,更多相关《IEC-PAS-62483-2006.pdf(34页珍藏版)》请在三一文库上搜索。
1、 PUBLICLY AVAILABLE SPECIFICATION IEC PAS 62483 First edition 2006-09 Test method for measuring whisker growth on tin and tin alloy surface finishes Reference number IEC/PAS 62483:2006(E) Publication numbering As from 1 January 1997 all IEC publications are issued with a designation in the 60000 ser
2、ies. For example, IEC 34-1 is now referred to as IEC 60034-1. Consolidated editions The IEC is now publishing consolidated versions of its publications. For example, edition numbers 1.0, 1.1 and 1.2 refer, respectively, to the base publication, the base publication incorporating amendment 1 and the
3、base publication incorporating amendments 1 and 2. Further information on IEC publications The technical content of IEC publications is kept under constant review by the IEC, thus ensuring that the content reflects current technology. Information relating to this publication, including its validity,
4、 is available in the IEC Catalogue of publications (see below) in addition to new editions, amendments and corrigenda. Information on the subjects under consideration and work in progress undertaken by the technical committee which has prepared this publication, as well as the list of publications i
5、ssued, is also available from the following: IEC Web Site (www.iec.ch) Catalogue of IEC publications The on-line catalogue on the IEC web site (www.iec.ch/searchpub) enables you to search by a variety of criteria including text searches, technical committees and date of publication. On-line informat
6、ion is also available on recently issued publications, withdrawn and replaced publications, as well as corrigenda. IEC Just Published This summary of recently issued publications (www.iec.ch/online_news/ justpub) is also available by email. Please contact the Customer Service Centre (see below) for
7、further information. Customer Service Centre If you have any questions regarding this publication or need further assistance, please contact the Customer Service Centre: Email: custserviec.ch Tel: +41 22 919 02 11 Fax: +41 22 919 03 00 -,-,- Test method for measuring whisker growth on tin and tin al
8、loy surface finishes PUBLICLY AVAILABLE SPECIFICATION IEC PAS 62483 First edition 2006-09 IEC 2006 Copyright - all rights reserved No part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission
9、 in writing from the publisher. International Electrotechnical Commission, 3, rue de Varemb, PO Box 131, CH-1211 Geneva 20, Switzerland Telephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: inmailiec.ch Web: www.iec.ch PRICE CODE U For price, see current catalogue -,-,- PAS 62483 IEC:2006(E)
10、 Page i INTERNATIONAL ELECTROTECHNICAL COMMISSION _ TEST METHOD FOR MEASURING WHISKER GROWTH ON TIN AND TIN ALLOY SURFACE FINISHES FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC
11、National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, P
12、ublicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non- go
13、vernmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IE
14、C on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are acce
15、pted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote internatio
16、nal uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the la
17、tter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with an IEC Publication. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its
18、directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses ar
19、ising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention i
20、s drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. A PAS is a technical specification not fulfilling the requirements for a standard but made available to t
21、he public. IEC-PAS 62483 was submitted by JEDEC and has been processed by IEC technical committee 47: Semiconductor devices. The text of this PAS is based on the following document: This PAS was approved for publication by the P-members of the committee concerned as indicated in the following docume
22、nt Draft PAS Report on voting 47/1842/NP 47/1876/RVN Following publication of this PAS, the technical committee or subcommittee concerned will investigate the possibility of transforming the PAS into an International Standard An IEC-PAS licence of copyright and assignment of copyright has been signe
23、d by the IEC and JEDEC and is recorded at the Central Office. This PAS shall remain valid for an initial maximum period of three years starting from 2006-08. The validity may be extended for a single three-year period, following which it shall be revised to become another type of normative document
24、or shall be withdrawn. Copyright 2005, JEDEC; 2006, IEC Page 1 Test Method for Measuring Whisker Growth on Tin and Tin Alloy Surface Finishes Introduction This document contains a suite of recommended tin whisker growth tests. If these common tests are adopted, then the industry can collect common a
- 配套讲稿:
如PPT文件的首页显示word图标,表示该PPT已包含配套word讲稿。双击word图标可打开word文档。
- 特殊限制:
部分文档作品中含有的国旗、国徽等图片,仅作为作品整体效果示例展示,禁止商用。设计者仅对作品中独创性部分享有著作权。
- 关 键 词:
- IEC PAS 62483 2006
链接地址:https://www.31doc.com/p-3773322.html