IEC-TR-61967-4-1-2005.pdf
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1、 TECHNICAL REPORT IEC TR 61967-4-1 First edition 2005-02 Integrated circuits Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 4-1: Measurement of conducted emissions 1 /150 direct coupling method Application guidance to IEC 61967-4 Reference number IEC/TR 61967-4-1:2005(E) Copyright I
2、nternational Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/09/2007 21:03:24 MSTNo reproduction or networking permitted without license from IHS -,-,- Publication numbering As from 1 January 1997 all IEC publi
3、cations are issued with a designation in the 60000 series. For example, IEC 34-1 is now referred to as IEC 60034-1. Consolidated editions The IEC is now publishing consolidated versions of its publications. For example, edition numbers 1.0, 1.1 and 1.2 refer, respectively, to the base publication, t
4、he base publication incorporating amendment 1 and the base publication incorporating amendments 1 and 2. Further information on IEC publications The technical content of IEC publications is kept under constant review by the IEC, thus ensuring that the content reflects current technology. Information
5、 relating to this publication, including its validity, is available in the IEC Catalogue of publications (see below) in addition to new editions, amendments and corrigenda. Information on the subjects under consideration and work in progress undertaken by the technical committee which has prepared t
6、his publication, as well as the list of publications issued, is also available from the following: IEC Web Site (www.iec.ch) Catalogue of IEC publications The on-line catalogue on the IEC web site (www.iec.ch/searchpub) enables you to search by a variety of criteria including text searches, technica
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8、e contact the Customer Service Centre (see below) for further information. Customer Service Centre If you have any questions regarding this publication or need further assistance, please contact the Customer Service Centre: Email: custserviec.ch Tel: +41 22 919 02 11 Fax: +41 22 919 03 00 Copyright
9、International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/09/2007 21:03:24 MSTNo reproduction or networking permitted without license from IHS -,-,- TECHNICAL REPORT IEC TR 61967-4-1 First edition 2005-02 I
10、ntegrated circuits Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 4-1: Measurement of conducted emissions 1 /150 direct coupling method Application guidance to IEC 61967-4 PRICE CODE IEC 2005 Copyright - all rights reserved No part of this publication may be reproduced or utilized i
11、n any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from the publisher. International Electrotechnical Commission, 3, rue de Varemb, PO Box 131, CH-1211 Geneva 20, Switzerland Telephone: +41 22 919 02 11 Telefax: +41 22 919 03 00
12、E-mail: inmailiec.ch Web: www.iec.ch X For price, see current catalogue Commission Electrotechnique Internationale International Electrotechnical Commission Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Bernie
13、Not for Resale, 03/09/2007 21:03:24 MSTNo reproduction or networking permitted without license from IHS -,-,- 2 TR 61967-4-1 IEC:2005(E) CONTENTS FOREWORD.4 1 Scope 6 2 Normative references .6 3 Terms and definitions .7 4 Splitting ICs into IC function modules9 4.1 Background.9 4.2 Benefits.9 4.3 IC
14、 function modules.9 4.4 Example matrix for splitting ICs into IC function modules14 5 Workflow to perform IC EMC emission tests 15 5.1 Emission test philosophy .15 5.2 Flowchart of performing emission tests 15 6 Test configurations for IC function modules.16 6.1 EMC test recommendations for IC funct
15、ion modules .16 6.2 Port selection guide.16 6.3 Test networks at selected ports18 6.4 Supply selection guide.22 6.5 Test networks at selected supplies.23 6.6 Parameter initialization of IC function modules for testing.24 6.7 Test parameter for performing conducted emission measurements .30 7 Test bo
16、ard layout recommendations36 7.1 Common test board recommendations .36 7.2 150 network on 2 layer and multi layer PCB36 7.3 1 network on 2 layer and multi-layer PCB .37 8 Test report .37 Annex A (normative) IEC 61967-4 test network modification .38 Annex B (informative) Trace impedance calculation40
17、 Annex C (informative) Examples for splitting ICs into IC function modules.42 Figure 1 Common definition of an IC function module .8 Figure 2 Flowchart of performing emission tests .15 Figure 3 Test network for IC function module line driver18 Figure 4 Symmetrical line driver without termination (no
18、t required by bus system datasheet) 18 Figure 5 Symmetrical line driver with termination required by bus system datasheet19 Figure 6 Test network for IC function module line driver19 Figure 7 Test network for IC function module high side driver .20 Figure 8 Test network for IC function module low si
19、de driver.21 Figure 9 Conducted emission measurement circuits for IC function module supply 23 Figure 10 Layout recommendation 150 network 36 Figure 11 Layout recommendation 1 network 37 Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/
20、1111111001, User=Wing, Bernie Not for Resale, 03/09/2007 21:03:24 MSTNo reproduction or networking permitted without license from IHS -,-,- TR 61967-4-1 IEC:2005(E) 3 Figure A.1 150 network, attenuation chart of some example capacitor values 38 Figure B.1 Micro stripline .40 Figure B.2 Symmetric str
21、ipline41 Figure B.3 Offset stripline 41 TTable 1 Example matrix for splitting ICs into IC function modulesT.14 TTable 2 EMC test recommendations for IC function modulesT.16 TTable 3 Test port selection tableT17 TTable 4 Creating priority for a subset of supply modulesT.23 TTable 5 Driver toggling de
22、finitionT24 TTable 6 Test initialization software module for cores containing a CPUT.27 TTable 7 Test loop software module for cores containing a CPUT29 TTable 8 Test procedure driver switching noise, with CPUT30 TTable 9 Test procedure driver switching noise, without CPUT.30 TTable 10 Test procedur
23、e port internal crosstalk, with CPUT31 TTable 11 Test procedure regional signal driver supply noise, with CPUT.31 TTable 12 Test procedure regional signal driver supply noise, without CPUT31 TTable 13 Test procedure symmetrical line drivers, with CPUT.32 TTable 14 Test procedure symmetrical line dri
24、vers, without CPUT32 TTable 15 Test procedure high side drivers (without CPU)T.32 TTable 16 Test procedure low side drivers (without CPU)T.33 TTable 17 Test procedure core supply, without CPUT33 TTable 18 Test procedure core to drivers and inputs crosstalk, without CPUT.34 TTable 19 Test procedure c
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