IEEE-1671.6-2008.pdf
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1、IEEE Std 1671.6-2008 IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Station Information IEEE 3 Park Avenue New York, NY 10016-5997, USA 17 December 2008 IEEE Standards Coordinating Committee 20 Sponsored by the IEE
2、E Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems 1671.6 TM Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=HP Monitoring/1111111164 Not for Resale, 04/07/2009 19:02:43 MDTNo reproduction or networ
3、king permitted without license from IHS -,-,- Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=HP Monitoring/1111111164 Not for Resale, 04/07/2009 19:02:43 MDTNo reproduction or networking permitted without license from IHS -,-,- I
4、EEE Std 1671.6-2008 IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Station Information Sponsor IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems Approved 26 September 2008 IEEE-S
5、A Standards Board Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=HP Monitoring/1111111164 Not for Resale, 04/07/2009 19:02:43 MDTNo reproduction or networking permitted without license from IHS -,-,- Abstract: An exchange format,
6、 utilizing XML, for identifying all of the hardware, software, and documentation associated with a test station is specified in this document. This test station may be used as a component of a test program set to test and diagnose a unit under test. Keywords: ATML instance document, automatic test e
7、quipment (ATE), Automatic Test Markup Language (ATML), automatic test system (ATS), test station, XML schema The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2008 by the Institute of Electrical and Electronics Engineers, Inc. All right
8、s reserved. Published 17 December 2008. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. C
9、opyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=HP Monitoring/1111111164 Not for Resale, 04/07/2009 19:02:43 MDTNo reproduction or networking permitted without license from IHS -,-,- Introduction This introduction is not part of IE
10、EE Std 1671.6-2008, IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Station Information. The benefits of using standards in test-related applications have long been recognized. The scope for standardization extends
11、from low-level standards associated with test instrument control to high-level standards associated with specifying tests in an implementation-independent manner. In the 1960s, Aeronautical Radio, Incorporated (ARINC) started the development of the Abbreviated Test Language for Avionics Systems (ATL
12、AS). In 1976, management of the ATLAS Standard was passed to the IEEE, and the ATLAS acronym was changed to Abbreviated Test Language for All Systems to reflect its broader field of applications. Within the IEEE, development of ATLAS and ATLAS-related standards was vested in an ad hoc committee, whi
13、ch later became the IEEE Standards Coordinating Committee 20 (SCC20). In the mid- 1980s, SCC20 broadened the scope of its activities to embrace other standards projects related to test and diagnosis, including Automatic Test Program Generation (ATPG), Test Equipment Description Language (TEDL), Arti
14、ficial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE), A Broad Based Environment for Test (ABBET), Software Interface to Maintenance Information and Collection Analysis (SIMICA), Receiver Fixture Interface (RFI), Signal and Test Definition (STD), and Automatic Test Markup
15、 Language (ATML). The parent standard, IEEE Std 1671,-2006,a provides the framework for a family of standards providing specifications for test-related applications and environments. This family incorporates language- independent elements within a wide variety of test environments, including built-i
16、n test (BIT) systems, automatic test systems (ATS), and manual test environments. Each of these interfaces is specified in the form of an XML schema. This child, or “dot,” trial-use standard, also known as an ATML component trial-use standard, provides for the definition of the Test Station XML sche
17、mas, and contains references to examples; both of which accompany this trial-use standard. These XML schemas provide for the identification and definition of a test station. XML schemas define the basic information required within any test application and provide a vehicle for formally defining the
18、test environment by defining a class hierarchy corresponding to these basic information entities and provide several methods within each to enable basic operations to be performed on these entities. ATML component standards within the ATML framework define the particular requirements within the test
19、 environment. a Information on references can be found in Clause 2. iv Copyright 2008 IEEE. All rights reserved. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=HP Monitoring/1111111164 Not for Resale, 04/07/2009 19:02:43 MDTNo re
20、production or networking permitted without license from IHS -,-,- Notice to users Laws and regulations Users of these documents should consult all applicable laws and regulations. Compliance with the provisions of this standard does not imply compliance to any applicable regulatory requirements. Imp
21、lementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights T
22、his document is copyrighted by the IEEE. It is made available for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self- regulation, standardization, and the promotion of engineering practices and methods. By making thi
23、s document available for use and adoption by public authorities and private users, the IEEE does not waive any rights in copyright to this document. Updating of IEEE documents Users of IEEE standards should be aware that these documents may be superseded at any time by the issuance of new editions o
24、r may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. In order to determine whether a given docum
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