IEEE-982.1-2005.pdf
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1、IEEE Std 982.1-2005 (Revision of IEEE Std 982.1-1988) IEEE Standard Dictionary of Measures of the Software Aspects of Dependability I E E E 3 Park Avenue New York, NY 10016-5997, USA 8 May 2006 IEEE Computer Society Sponsored by the Software Engineering Standards Committee IEEE Std 982.1-2005 (Revis
2、ion of IEEE Std 982.1-1988) IEEE Standard Dictionary of Measures of the Software Aspects of Dependability Sponsor Software Engineering Standards Committee of the IEEE Computer Society Approved 8 November 2005 IEEE-SA Standards Board Abstract: A standard dictionary of measures of the software aspects
3、 of dependability for assessing and predicting the reliability, maintainability, and availability of any software system; in particular, it applies to mission critical software systems. Keywords: availability, dependability, maintainability, reliability _ The Institute of Electrical and Electronics
4、Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2006 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 8 May 2006. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission
5、to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Introduction This introduction is not part of IEEE Std 982.1-2005, IEEE Standard Dictionary of Measures of the Software Aspects of Dependability. Rationale for
6、revision: In accordance with Software Engineering Standards Committee (SESC) policy, the first standard (this document) is a small document with just a few core measures dealing with reliability, maintainability, and availability. This will be followed by a second standard that will address safety,
7、confidentially, and integrity. This standard has not been revised since 1988. It was reaffirmed in 1996, but there were significant negative comments. It has been revised because many of the original measures had the following undesirable characteristics: Unrealistic (i.e., there was naivety about t
8、he necessary data, personnel capabilities, and training to effectively use the measures) Did not measure what they purported to measure Complex equations that were hard to understand and implement Immature (i.e., they were not widely used) Little field data to back up claims for benefits History Thi
9、s standard is 15 years old, and additional information on the topic has been developed since that time. This project updated the standard to include such information and to expand the scope of the standard. Specifically, the following topics were included in the standard: a) Determined specific crit
10、eria for inclusion of measures in the standard b) Performed a measure-by-measure review of the measures in the standard, with the following goals: 1) Determined whether the measure should be modified, retained, or deleted, based on the criteria. The modified and retained measures are identified in t
11、his standard by their numbers from the original IEEE 982.1 standard (i.e., IEEE 982 #X). 2) Added any additional information on the measures developed since 1988. 3) Clarified definition and implementation conventions. 4) Identified and incorporated, where appropriate, new measures that have appeare
12、d since 1988. 5) Formulated generic measure classes and categorized the measures into these classes. These classes are reliability, maintainability, and availability. iv Copyright 2006 IEEE. All rights reserved. Notice to users Errata Errata, if any, for this and all other standards can be accessed
13、at the following URL: http:/ standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Atte
14、ntion is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be resp
15、onsible for identifying patents or patent applications for which a license may be required to implement an IEEE standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention. Participants At the time this standard was completed, the P982 Wor
16、king Group had the following membership: Allen Nikora, Chair Thomas Antczak William Everett William Farr Jairus Hihn J. Dennis Lawrence John Munson Norman Schneidewind George Stark Linda Wilbanks The following members of the individual balloting committee voted on this standard. Balloters may have v
17、oted for approval, disapproval, or abstention. Richard Biehl Mitchell Bonnett Juris Borzovs Antonio M Cicu Rita Creel Geoffrey Darnton Einar Dragstedt Sourav Dutta John Emrich William Eventoff John Fendrich Yaacov Fenster Jon Hagar John Harauz Mark Henley John Horch William Junk Ron Kenett Thomas M.
18、 Kurihara J. Dennis Lawrence Denis Meredith Rajesh Moorkath Lou Pinto Garry Roedler Terence Rout James Ruggieri Robert Schaaf Hans Schaefer Robert W Shillato Mitchell Smith Joyce Statz Udo Voges Paul Wolfgang Oren Yuen Janusz Zalewski Charles Zumba v Copyright 2006 IEEE. All rights reserved. When th
19、e IEEE-SA Standards Board approved this application guide on 8 November 2005, it had the following membership: Steve M. Mills, Chair Richard H. Hulett, Vice Chair Don Wright, Past Chair Judith Gorman, Secretary Mark D. Bowman Dennis B. Brophy Joseph Bruder Richard Cox Bob Davis Julian Forster* Joann
20、a N. Guenin Mark S. Halpin Raymond Hapeman William B. Hopf Lowell G. Johnson Herman Koch Joseph L. Koepfinger* David J. Law Daleep C. Mohla Paul Nikolich T. W. Olsen Glenn Parsons Ronald C. Petersen Gary S. Robinson Frank Stone Malcolm V. Thaden Richard L. Townsend Joe D. Watson Howard L. Wolfman *M
21、ember Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish K. Aggarwal, NRC Representative Richard DeBlasio, DOE Representative Alan H. Cookson, NIST Representative Don Messina IEEE Standards Project Editor vi Copyright 2006 IEEE. All rights reserved. vii Copyr
22、ight 2006 IEEE. All rights reserved. Contents 1. Overview 1 1.1 General 1 1.2 Scope. 2 1.3 Purpose 2 1.4 Compliance 2 1.5 Interaction with other standards. 3 2. Definitions 3 3. New reliability measures 4 3.1 General 4 3.2 Time to next failure (s) (Lyu B12) 4 3.3 Risk factor regression model (Schnei
23、dewind B22). 5 3.4 Remaining failures (Keller and Schneidewind B11). 6 3.5 Total test time to achieve specified remaining failures (Schneidewind B20). 7 3.6 Network reliability (Schneidewind B19) 8 4. Modified reliability measures. 10 4.1 Defect density (982 #2) (Fenton and Pfleeger B5 and Nikora et
24、 al. B17) 10 4.2 Test coverage index (982 #5) (Binder B2) 11 4.3 Requirements compliance (982 #23) (Fischer and Walker B6) 11 4.4 Failure rate (982 #31) (Lyu B12) 12 5. Retained reliability measures 13 5.1 Fault density (982 #1) (Musa B14 and Nikora and Munson B16) . 13 5.2 Requirements traceability
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