JIS-B-0651-2001-R2005-ENG.pdf
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1、J IS JAPANESE I N DU STR I AL STANDARD Translated and Published by Japanese Standards Association Geometrical Product Specifications (G PS)-S u r f ace text u re : Profile method- Nominal characteristics of contact (stylus) instruments ICs 17.040.20; 17.040.30 Descriptors : surface-roughness measure
2、ment, roughness (surface), smoothness Reference number : JIS B 0651 : 2001 (E) (surface), surface treatment PROTECTED BY COPYRIGHT 1 4 S Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/15/2007 20:2
3、5:04 MDTNo reproduction or networking permitted without license from IHS -,-,- B 0651 : 2001 (IS0 3274 : 1996) Foreword This translation has been made based on the origina Japanese Industrial Standard revised by the Minister of Economy, Trade and Industry through deliberations at the Japanese Indust
4、rial Standards Committee, as the result of proposal for revision of Japanese Industrial Standard submitted by the Japanese Standards Association (JSA) with the draft being attached, based on the provision of Article 12 Clause 1 of the Industrial Standard- ization Law. Consequently JIS B 0651 : 1996
5、is replaced with this Standard. As the original International Standard does not contain descriptions on inspections, some part of the previous version of JIS B 0651 : 1996 has been modified and attached as annex 3 (informative). Date of Establishment: 1955-04-14 Date of Revision: 2001-01-20 Date of
6、Public Notice in Official Gazette: 2001-01-22 Investigated by: Japanese Industrial Standards Committee Divisional Council on Machine Elements JIS B 0651 : 2001, First English edition published in 2002-08 Translated and published by: Japanese Standards Association 4-1-24, Akasaka, Minato-ku, Tokyo, 1
7、07-8440 JAPAN In the event of any doubts arising as to the contents, the original JIS is to be the final authority. O JSA 2002 All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including p
8、hotocopying and microfilm, without permission in writing from the publisher. Printed in Japan PROTECTED BY COPYRIGHT Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/15/2007 20:25:04 MDTNo reproduct
9、ion or networking permitted without license from IHS -,-,- B 0651 : 2001 (IS0 3274 : 1996) Contents Page Introduction . 1 1 Scope 1 2 Normative references 2 3 Definitions 3 4 Nominal values for instrument characteristics . 10 Annex A (informative) Instruments conforming to JIS E 0651 : 1976 . 12 Ann
10、ex B (informative) Background for the improvements introduced in this Standard 13 Annex C (informative) Relation to the GPS matrix model 15 Annex D (informative) Bibliography 16 Annex 1 (informative) Standard characteristics . 17 Annex 2 (informative) Standard performances . 19 Annex 3 (informative)
11、 Inspection items and procedures . 20 (i) PROTECTED BY COPYRIGHT Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/15/2007 20:25:04 MDTNo reproduction or networking permitted without license from IHS
12、 -,-,- JAPANESE INDUSTRIAL STANDARD JIS B 0651 : 2001 (IS0 3274 : i996) Geometrical Product Specifications (GPS)- Surface texture : Profile method- Nominal characteristics of contact (stylus) instruments Introduction This Japanese Industrial Standard has been prepared based on IS0 3274 Geometrical P
13、roduct Specifications (GPS)-Surface texture : Profile method- Nominal characteristics of contact (stylus) instruments published in 1996 without modifying the technical contents. This Standard is a Geometrical Product Specification (GPS) standard and is to be regarded as a General GPS standard (see T
14、R B 0007). It influences chain link 5 of the chain of standards for roughness profile, waviness profile and primary profile. For more detailed information of the relation of this Standard to other standards and the GPS matrix model, see annex C. Filters for profile meters according to IS0 3274 : 197
15、5 were realized as a series connection of two analog RC filters. This led to considerable phase shifts in the tran- sition of the profile and therefore to asymmetrical profile distortions. The influence of this distortion on the parameters Ra and Rz are normally negligible if the sam- pling lengths
16、(cut-off wavelength) according to IS0 4288 : 1985 are used. There- fore, analog instruments according to IS0 3274 : 1975 or instruments using 2RC filters may be used for assessment of Ru and Rz (see annex A). However, for other param- eters the distortion is relevant. As the original International S
17、tandard does not contain description on inspec- tions, some part of the previous version of JIS B 0651 : 1996 has been modified and attached as annex 3 (informative). The portions sidelined or underlined with dots in this Standard are the matters not stated in the original International Standard. Re
18、marks : TR B 0007 is identical with ISOPTR 14638 : 1995 Geometrical Prod- uct Specifications (GPS)-Master plan. 1 Scope This Standard defines profiles and the general structure of contact (sty- lus) instruments for measuring surface roughness and waviness, enabling existing International Standards t
19、o be applied to practical profile evaluation. It specifies the properties of the instrument which influence profile evaluation and it provides the basics of the specification of contact (stylus) instruments (profile meter and pro- file recorder). Notes 1 A data sheet dealing with characteristics of
20、contact (stylus) instruments to be completed by the instrument makers is under preparation and will be introduced in a future standard on calibration procedures. 2 The relationships between the waviness cut-off Af, tip radius and wavi- ness cut-off ratio are under consideration and will be added to
21、this Stan- dard as an amendment. 3 The International Standard corresponding to this Standard is as fol- lows. PROTECTED BY COPYRIGHT Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/15/2007 20:25:04
22、 MDTNo reproduction or networking permitted without license from IHS -,-,- 2 B 0651 : 2001 (IS0 3274 : 1996) In addition, symbols which denote the degree of correspondence in the contents between the relevant International Standard and JIS are IDT (identical), MOD (modified), and NEQ (not equivalent
23、) according to ISO/IEC Guide 21. IS0 3274 : 1996 Geometrical Product Specifications (GPSI-Surface tex- ture : Profile method-Nominal characteristics of con- tact (stylus) instruments (IDT) 2 Normative references The following standards contain provisions which, through reference in this Standard, co
24、nstitute provisions of this Standard. If the indication of the year of publication is given to these referred standards, only the edition of indicated year constitutes the provision of this Standard but the revision and amend- ment made thereafter are not applied. The normative references without th
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