JIS-C-2170-2004-ENG.pdf
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1、JIS JAPANESE I NDUSTRIAL STANDARD Translated and Published by Japanese Standards Association JIS C 2170:2004 (IEC 6 1340-2-3 : 2000) Electrostatics-Methods of test for determining the resistance and resistivity of solid planar materials used to avoid electrostatic charge accumulation ICs 17.220.99;2
2、9.020 Reference number JIS C 2170 : 2004 (E) PROTECTED BY COPYRIGHT 11 s C 2170 : 2004 (IEC 61340-2-3 : 20001 Foreword This translation has been made based on the original Japanese Indus- trial Standard established by the Minister of Economy, Trade and In- dustry through deliberations at the Japanes
3、e Industrial Standards Committee in accordance with the Industrial Standard Law: This Standard has been made based on IEC 61340-2-3:2000 Electrostat- ics -Part 2-3 : Methods of test for determining the resistance and resis- tivity of solid planar materials used to avoid electrostatic charge accu - m
4、ulation for the purposes of making it easier to compare this Standard with International Standard; to prepare Japanese Industrial Standard conforming with International Standard; and to propose a draft of an In- ternational Standard which is based on Japanese Industrial Standard. Attention is drawn
5、to the possibility that some parts of this Standard may conflict with a patent right, application for a patent after opening to the public, utility model right or application for registration of utility model after opening to the public which have technical properties. The relevant Minister and the
6、Japanese Industrial Standards Committee are not responsible for identifying the patent right, application for a patent after opening to the public, utility model right or application for registration of utility model after opening to the public which have the said technical properties. Date of Estab
7、lishment: 2004-03-20 Date of Public Notice in Official Gazette: Investigated by: 2004-03-22 Japanese Industrial Standards Committee Standards Board Technical Committee on Electricity Technology JIS C 2170 : 2004, First English edition published in 2005-02 Translated and published by: Japanese Standa
8、rds Association 4-1-24, Akasaka, Minato-ku, Tokyo, 107-8440 JAPAN In the event of any doubts arising as to the contents, the original JIS is to be the final authority. O JSA 2005 All rights reserved. Unless otherwise specified, no part of this publication may be reproduced o r utilized in any form o
9、r by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from the publisher. Printed in Japan PROTECTED BY COPYRIGHT -,-,- C 2170 : 2004 (IEC 61340-2-3 : 2000) Contents Page Introduction 1 1 2 3 3.1 3.2 3.3 3.4 3.5 4 5 6 7 8 8.1 8.2 8.3 8.4 8.5 8.
10、6 9 9.1 9.2 10 11 Scope . 1 Normative references . 2 Definitions 2 volume resistance (QI 2 volume resistivity (Qm) . 2 surface resistance (Q2) 3 surface resistivity(Q2) . 3 measuring electrode . 3 Conditioning and test environment . 3 Selection of test method . 3 Resistance measurements of solid con
11、ductive materials 3 Resistance measurements of solid insulating materials . 4 Resistance measurements of electrostatic dissipative materials (used to avoid electrostatic charge accumulation) 4 Instrumentation . 4 Electrode assemblies 4 Sample preparation and handling . 7 System verification fixtures
12、 for surface resistance . 8 System verification for volume resistance measurements . 10 Test procedures 10 Conversion to resistivity values 12 Surface resistivity ps 12 Volume resistivity pv 13 Repeatability and reproducibility 13 Report . 14 . . . (i PROTECTED BY COPYRIGHT -,-,- JAPANESE INDUSTRIAL
13、 STANDARD JIS C 2170 : 2004 (IEC 61340-2-3 : 2000) Electrostatics-Methods of test for determining the resistance and resistivity of solid planar materials used to avoid electrostatic charge accumulation Introduction This Japanese Industrial Standard has been prepared based on the first edition of IE
14、C 61340-2-3 Electrostatics-Part 2-3 : Methods of test for determining the resistance and resistivity of solid planar materials used to avoid electrostatic charge accumulation published in 2000 without modifying the technical contents. Portions underlined with dots are the matters not stated in the o
15、riginal Interna- tional Standard. Measurements of resistances and related calculations of resistivities belong to the fundamental objectives of electrical measuring techniques along with measurements of voltage and current. Resistivity is the electrical characteristic having the widest range, extend
16、ing over some thirty orders of magnitude from the most conductive metal to almost perfect in- sulators. The basis is Ohms law and is valid for d.c. current and instantaneous values of a.c. current in electron conductors (metals, carbon, etc.). Values of resistance measure- ments using a.c. current c
17、an be influenced by capacitive/inductive reactance, depend- ing on the frequency. Thus, existing national and international standards dealing with resistance measurements of solid materials normally require the application of d.c. current. Most non-metal materials such as plastics are classified as
18、polymers and ion con- ductors. The transport of charges can be dependent upon the applied electrical field strength during the measurement. Beside the measuring current, there exists a charging current that polarizes andor electrostatically charges the material, indicated by an asymptotic decay of t
19、he measuring current with time and causing an apparent change in resistance. If this effect is observed, it will be advisable to repeat the meas- urement immediately after a definite electrification time has elapsed using the reverse polarity for the measuring current and averaging both obtained val
20、ues. 1 Scope This International Standard describes test methods for the determination of the electrical resistance and resistivity of solid materials in the range from lo4 S2 to 1012 S 2 used to avoid electrostatic charge accumulation. It takes account of existing IEC/ISO standards and other publish
21、ed information, and NOTE : The International Standard corresponding to this Standard is as follows. gives recommendations and guidelines on the appropriate method. In addition, symbols which denote the degree of correspondence in the PROTECTED BY COPYRIGHT 2 C 2170 : 2004 (IEC 61340-2-3 : 2000) cont
22、ents between the relevant International Standard and JIS are IDT (identical), MOD (modified), and NEQ (not equivalent) according to ISO/IEC Guide 21. IEC 61340-2-312000, Electrostatics-Part 2-3 : Methods of test for deter- mining the resistance and resistivity of solid planar materials used to a voi
23、d electrostatic charge accu- mulation (IDT) 2 Normative references The following standards contain provisions which, through reference in this Standard, constitute provisions of this Standard. If the indication of the year of publication is given to these referred standards, only the edition of the
24、in- dicated year constitutes the provision of this Standard but the revision and amend- ment made thereafter do not apply. IEC 60093:1980 IEC 6016711964 IEC 60212:1971 IEC 60260:1968 IS0 1853:1998 IS0 2951:1974 IS0 391511981 Methods of test for volume resistivity and surface resistivity of solid ele
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