JIS-Z-2319-1991-R2007-ENG.pdf
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1、I AIS Z*2339 91 9 4933608 0088354 4 a i UDC 620.179.143 I JAPANESE INDUSTRIAL STANDARD Methods for magnetic leakage flux testing Translated and Published by Japanese Standards Association Printed in Japan Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Emp
2、loyees/1111111001, User=Wing, Bernie Not for Resale, 03/11/2007 08:12:52 MDTNo reproduction or networking permitted without license from IHS -,-,- JIS Z*K2319 91 O 4933608 0088355 6 O In the event of any doubt arising, the original Standard in Japanese is to be final authority. P a . . Copyright Jap
3、anese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/11/2007 08:12:52 MDTNo reproduction or networking permitted without license from IHS -,-,- J I S Zr23L9 91 m 4933608 0088356 8 - UDC 620.179.143 JAPANESE INDUSTRI
4、AL STANDARD J I S Methods for magnetic leakage flux testing Z 2319-1991 1. Scope netic leakage flux intended for automatic detection of surface flaws in round steel bars (10 to 400 mm in diameter) and steel tubular products (10 to 660 mm in outside diameter) (hereafter referred to as the “specimen“)
5、. This Japanese Industrial Standard specifies the general requirements on test methods of mag- Remarks: The applicable standard of this standard is given in the following: JIS Z 2300-Glossary of Terms Used in Nondestructive Testing 2. Definition The definitions of principal terms used in this standa
6、rd shall be as given in JIS Z 2300. 3. 3.1 Classification of flaw detection techniques according to orientation of flaw The classifica- tion of flaw detection techniques according to the orientation of flaws shall be as given in the fol- lowing: Classification of flaw detection techniques (1) Detect
7、ion technique of longitudinally oriented flaw A technique intended for detec- tion of longitudinally oriented flaws in the specimen by circumferential magnetization (see Fig. 1). (2) Detection technique of circumferentially oriented flaw A technique intended for detection of circumferentially orient
8、ed flaws in the specimen by longitudinal magnetiza- tion (see Fig. 2). Fig. 1. Longitudinally oriented Fig. 2. Circumferentially oriented flaw detection flaw detection Flux sensor Specimen 3.2 Classification of flaw detection technique according to location of flaw The classification of flaw detecti
9、on techniques according to the location of flaws shall be as given in the following: (1) Detection technique of outside surface flaw A technique for detection of magnetic leakage flux of the outside surface flaws with a sensor positioned outside the specimen provided that the specimen has been magne
10、tized by d.c. or a.c. from the outside there- of (see Fig. 3). (2) Detection technique of inside and outside surface flaws A technique for detection of magnetic leakage flux of the flaws existing on the outside surface of the specimen or the inside surface of light walled steel pipe with a sensor po
11、sitioned outside the specimen provided that the test object such as steel tubular product has been mag- netized by d.c. from the outside thereof (see Fig. 4). Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for R
12、esale, 03/11/2007 08:12:52 MDTNo reproduction or networking permitted without license from IHS -,-,- J I S Z*E!3L9 91 W 4933608 0088357 T 2 Z 2319-1991 Fig. 3. Outside surface flaw detection Fig. 4. Inside and outside surface flaw detection Flux sensor Magnetizer Specimen Flux sensor & “s$ Flux sens
13、or 4. Designation of requirements ment between the client. The recipient of order of testing shall determine previously the following details upon agree- (1) Type of flaw detection of test apparatus and type of motion (2) Time of test (3) Surface condition of specimen (4) Reference test piece (5) Ac
14、ceptance criteria (6) Necessity of demagnetization The personnel who makes the examination shall have sufficient knowledge and experience on 5. Examination engineer the magnetic leakage flux testing, 6. Test apparatus 6.1 Composition The test apparatus shall be the combination of the magnetizing equ
15、ipment, sensor, scanner, signal processing device, recording device, etc., and shall actuate stably at an operating ambient temperature. 6.2 Magnetizing equipment The magnetizing equipment shall be the combination of the power source assembly for supplying magnetizing current, magnetizer, etc., and
16、shall equip knobs for adjustment of electric current, ammeter, etc., as necessary, for the purpose of set- ting and monitoring of test conditions. 6.3 Sensor The sensor which is appropriate for the purpose of examination and flaw detec- tion technique shall be used. 6.4 Scanner The scanner shall be
17、a device to make scan relatively being kept a constant distance between the sensor and the surface of the specimen, and composed of the adjusting mechanism of sensor position, rotating mechanism of sensor or specimen, helical feeding mechanism, feeding mechanism of travelling, and the like. nation s
18、ystem of the type of motion shall be as given in Table 1. In addition, the mode of movement of the sensor and the specimen, its symbol, and the desig- Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 0
19、3/11/2007 08:12:52 MDTNo reproduction or networking permitted without license from IHS -,-,- J I S Z*E!3I9 91 4933608 0088358 I - 3 Z 2319-1991 Movement of sensor I Movement of test object Mode of movement Symbol Mode of movement H Helical moving Stationary T Travelling R Rotating S Stationary Rotat
20、ing T Travelling Travelling Helical moving S Stationary Circular rotating H Helical moving Table 1, Mode of movement, symbol and designation system Designation system of type of motion . SH ST TR Ts Rir HS CH Symbol S T R H C Rem arks : movement. C : Circular rotating, H : Helical moving, R : Rotati
21、ng, S : Stationary, T : Travelling 6.5 Signal processing afiparatus The signal processing apparatus shall be composec, of the amplifier of the signal turned out from the sensor, electric assemblies that are a filter, etc., dis- play for indication of signal of flaw, and the like, and shall conform t
22、o the following conditions: (1) The apparatus shall have those of display that are the indicator or display to indicate the monitored results of the state of examination, signals from flaws, and the like. (2) When it is necessary to set the test conditions such as gain, filter and marking level, the
23、 apparatus shall equip knobs for adjustment, graticule for indication of the setting value, etc., as necessary. (3) The signal processing apparatus shall be prevented from outside electric noise. 6.6 Marking device The marking device shall be composed of a marker and its control device, and shall be
24、 capable of marking within a designated range such as at the location where flaws in the specimen exist, or at the end thereof, according to the flaw signal. 6.7 Recording device The recording device shall record the digital or analogue output turned out from the signal processing apparatus, and its
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- JIS 2319 1991 R2007 ENG
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