JIS-C-5201-8-1998-R2004-ENG.pdf
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1、JIS JIS C 5201-8:18 JAPANESE I N D U STR I AL STANDARD Translated and Published by Japanese Standards Association Fixed resistors for use in electronic equipment Part 8 : Sectional specification : Fixed chip resistors L ? ICs 31.040.10 Descriptors : power resistors, precision resistors, chipping res
2、istance, electronic Reference number : JIS C 5201-8 : 1998 (E) equipment and components 12s Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/15/2007 20:54:06 MDTNo reproduction or networking permitt
3、ed without license from IHS -,-,- C 5201-8 : 1998 Date of Establishment: 1998-07-20 Date of Public Notice in Official Gazette: 1998-07-21 Investigated by: Japanese Industrial Standards Committee Divisional Council on Electronics JIS C 5201-8 : 1998, First English edition published in 1999-08 Transla
4、ted and published by: Japanese Standards Association 4-1-24, Akasaka, Minato-ku, Tokyo, 107-8440 JAPAN In the event of any doubts arising as to the contents, the original JIS is to be the final authority. O JSA 1999 All rights reserved. Unless otherwise specified, no part of this publication may be
5、reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from the publisher. Printed in Japan Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, Use
6、r=Wing, Bernie Not for Resale, 03/15/2007 20:54:06 MDTNo reproduction or networking permitted without license from IHS -,-,- STD-JIS C 5201-B-ENGL 1998 D 4933608 0556764 976 . C 5201-8 : 1998 Foreword This translation has been made based on the original Japanese Industrial Standard established by th
7、e Minister of International Trade and Industry through deliberations at Japanese Industrial Standards Committee in accordance with the Industrial Standardization Law: Attention shall be drawn to the possibility that a part of this Standard may conflict with a patent right (including those applied be
8、fore 1993-12-311, application for a patent right after opening to the public, utility model right or application for registration of utility model after opening to the public which have technical properties. The Minister of International Trade and Industry and the Japanese Industrial Standards Commi
9、ttee are not responsible for identifying the patent right, application for a patent right after opened, utility model right or application for registration of utility model after opening to the public which have the technical properties of this kind. There is an Annex stated below to JIS C 5201-8. I
10、n this Annex, structure of type designation is specified. Annex (normative) Coding of type designation Group standards The following standards form the specifications for the group of element specified in this Standard. JIS C 5201 JIS C 5201-1 JIS C 5201-2 JIS C 5201-2-1 JIS C 5201-2-2 JIS C 5201-4
11、JIS C 5201-4-1 JZS C 5201-4-2 JIS C 5201-4-3 JIS C 5201-5 JIS C 5201-5-1 JIS C 5201-5-2 b JIS C 5201-6 JIS C 5201-6-1 General rules of fixed resistors for use in electronic equipment Part 1 : Generic specification Part 2 : Sectional specification : Fixed low-power non-wirewound resistors Part 2 :Bla
12、nk detail specification :Fixed low-power non-wirewound resistors. Assessment level E Part 2 : Blank detail specification : Fixed low-power non-wirewound resistors. Assessment level F Part 4 : Sectional Specification : Fixed power resistors Part 4 :Blank detail specification : Fixed power resistors.
13、Assessment level E Part 4 :Blank detail specification :Fixed power resistors. Assessment level F Part 4 :Blank detail specification :Fixed power resistors, heat-sink types. Assessment level H Part 5 : Sectional specification : Fixed precision resistors Part 5 : Blank detail specification : Fixed pre
14、cision resistors. Assessment level E Part 5 : Blank detail specification : Fixed precision resistors. Assessment level F Part 6 : Sectional specification : Fixed resistor networks with individually measurable resistors Part 6 :Blank detail specification :Fixed resistor networks with individually mea
15、surable resistors, all of equal value and equal dissipation. Assessment level E Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/15/2007 20:54:06 MDTNo reproduction or networking permitted without l
16、icense from IHS -,-,- STD.JIS C 5201-8-ENGL 1998 4933608 0556965 802 E C 5201-8 : 1998 JIS C 5201-6-2 JIS C 5201-8 JIS C 5201-8-1 Part 6 : Blank detail specification : Fixed resistor networks with individually measurable resistors, of either different resistance values or different rated dissipation
17、s. Assessment level E Part 8 : Sectional specification : Fixed chip resistors Part 8 : Blank detail specification :Fixed chip resistors. Assessment level E I Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Re
18、sale, 03/15/2007 20:54:06 MDTNo reproduction or networking permitted without license from IHS -,-,- STDmJIS C 520L-ENGL 3998 W 4933b08 055b9bb 749 C 5201-8 : 1998 Contents Page Introduction . Section One-General 1 General 1 . 1 Scope 1 . 2 Object . 1 . 3 Normative references 1.4 Information to be gi
19、ven in a detail specification . 1.4.1 Outline drawing and dimensions 1.4.2 Mounting . 1 . 4 . 3 Style . 1 . 4 . 4 Ratings and characteristics . 1 . 4 . 5 Marking . Section two-Preferred ratings. characteristics and test seventies 2 Preferred ratings. characteristics and test severities 2 . 1 Preferr
20、ed characteristics 2 . 1 . 1 Preferred climatic categories . 2.1.2 Temperature coefficients and temperature characteristics of resistance 2.1.3 Limits for change in resistance . 2.2 Preferred values of ratings 2.2.1 Rated resistance . 2.2.2 Tolerances on rated resistance 2.2.3 Rated dissipation (in
21、the mounted state) 2.2.4 Limiting element voltage . 2.2.5 Insulation resistance (if applicable) . 2.3 Preferred test severities . 2.3.1 Drying 2.3.2 Overload (in the mounted state) . 1 1 1 1 1 2 2 3 3 4 4 5 5 5 5 6 7 7 7 7 7 7 7 7 7 Copyright Japanese Standards Association Provided by IHS under lice
22、nse with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/15/2007 20:54:06 MDTNo reproduction or networking permitted without license from IHS -,-,- C 5201-8 : 1998 Section three-Quality assessment procedures 3 Quality assessment procedures . 3 . 1 3.2 3.2.1 3.2.2 3 . 3 3 .
23、 3 . 1 3.3.2 3.3.3 Annex Structurally similar components Qualification approval Qualification approval on the basis of the fixed sample size procedure sampling . Tests . Quality conformance inspection Formation of inspection lots Test schedule Assessment levels (normative) Coding of styles 8 8 8 8 9
24、 15 15 15 15 17 Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/15/2007 20:54:06 MDTNo reproduction or networking permitted without license from IHS -,-,- STD-JIS C 5201-8-ENGL 1778 4733608 0556768
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