IEEE Std 1584-2002 IEEE Guide for Performing Arc-Flash Hazard Calculations.pdf

The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright © 2002 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 23 September 2002. Printed in the United States of America. Print: ISBN 0-7381-3351-5 SH95023 PDF: ISBN 0-7381-3352-3 SS95023 National Electrical Code and NEC are both registered trademarks of the National Fire Protection Association, Inc. IEEE Buff Book, IEEE Green Book, and IEEE Red Book are registered trademarks of the Institute of Electrical and Electronic Engineers, Inc. No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publisher. IEEE Std 1584 -2002 IEEE Guide for Performing Arc-Flash Hazard Calculations Sponsor Petroleum and Chemical Industry Committee of the Industry Applications Society Abstract: This guide provides techniques for designers and facility operators to apply in determining the arc-flash hazard distance and the incident energy to which employees could be exposed during their work on or near electrical equipment. Keywords: arc fault currents, arc-flash hazard, arc-flash hazard analysis, arc-flash hazard marking, arc in enclosures, arc in open air, bolted fault currents, electrical hazard, flash protection boundary, incident energy, personal protective equipment, protective device coordination study, short-circuit study, working distances Authorized licensed use limited to: Peking University. Downloaded on December 26,2010 at 16:49:41 UTC from IEEE Xplore. Restrictions apply. IEEE Standards documents are developed within the IEEE Societies and the Standards Coordinating Commit- tees of the IEEE Standards Association (IEEE-SA) Standards Board. The IEEE develops its standards through a consensus development process, approved by the American National Standards Institute, which brings together volunteers representing varied viewpoints and interests to achieve the fi nal product. Volunteers are not necessarily members of the Institute and serve without compensation. While the IEEE administers the process and establishes rules to promote fairness in the consensus development process, the IEEE does not independently evaluate, test, or verify the accuracy of any of the information contained in its standards. Use of an IEEE Standard is wholly voluntary. The IEEE disclaims liability for any personal injury, property or other damage, of any nature whatsoever, whether special, indirect, consequential, or compensatory, directly or indirectly resulting from the publication, use of, or reliance upon this, or any other IEEE Standard document. The IEEE does not warrant or represent the accuracy or content of the material contained herein, and expressly disclaims any express or implied warranty, including any implied warranty of merchantability or fi tness for a spe- cifi c purpose, or that the use of the material contained herein is free from patent infringement. IEEE Standards documents are supplied “ AS IS .” The existence of an IEEE Standard does not imply that there are no other ways to produce, test, measure, pur- chase, market, or provide other goods and services related to the scope of the IEEE Standard. Furthermore, the viewpoint expressed at the time a standard is approved and issued is subject to change brought about through developments in the state of the art and comments received from users of the standard. Every IEEE Standard is subjected to review at least every fi ve years for revision or reaffi rmation. When a document is more than fi ve years old and has not been reaffi rmed, it is reasonable to conclude that its contents, although still of some value, do not wholly refl ect the present state of the art. Users are cautioned to check to determine that they have the latest edi- tion of any IEEE Standard. In publishing and making this document available, the IEEE is not suggesting or rendering professional or other services for, or on behalf of, any person or entity. Nor is the IEEE undertaking to perform any duty owed by any other person or entity to another. Any person utilizing this, and any other IEEE Standards document, should rely upon the advice of a competent professional in determining the exercise of reasonable care in any given circum- stances. Interpretations: Occasionally questions may arise regarding the meaning of portions of standards as they relate to specifi c applications. When the need for interpretations is brought to the attention of IEEE, the Institute will ini- tiate action to prepare appropriate responses. Since IEEE Standards represent a consensus of concerned interests, it is important to ensure that any interpretation has also received the concurrence of a balance of interests. For this reason, IEEE and the members of its societies and Standards Coordinating Committees are not able to provide an instant response to interpretation requests except in those cases where the matter has previously received formal consideration. Comments for revision of IEEE Standards are welcome from any interested party, regardless of membership affi l- iation with IEEE. Suggestions for changes in documents should be in the form of a proposed change of text, together with appropriate supporting comments. Comments on standards and requests for interpretations should be addressed to: Secretary, IEEE-SA Standards Board 445 Hoes Lane P.O. Box 1331 Piscataway, NJ 08855-1331 USA Authorization to photocopy portions of any individual standard for internal or personal use is granted by the Insti- tute of Electrical and Electronics Engineers, Inc., provided that the appropriate fee is paid to Copyright Clearance Center. To arrange for payment of licensing fee, please contact Copyright Clearance Center, Customer Service, 222 Rosewood Drive, Danvers, MA 01923 USA; +1 978 750 8400. Permission to photocopy portions of any indi- vidual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Note: Attention is called to the possibility that implementation of this standard may require use of subject mat- ter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patents for which a license may be required by an IEEE standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention. Authorized licensed use limited to: Peking University. Downloaded on December 26,2010 at 16:49:41 UTC from IEEE Xplore. Restrictions apply. Copyright © 2002 IEEE. All rights reserved. iii Introduction (This introduction is not part of IEEE Std 1584-2002, IEEE Guide for Performing Arc-Flash Hazard Calculations.) A technical paper by Lee, “The other electrical hazard: electric arc blast burns” B19 provided insight that electrical arc burns make up a substantial portion of the injuries from electrical malfunctions. a He identifi ed that electrical arcing is the term applied to current passing through vapor of the arc terminal conductive metal or carbon material. The extremely high temperatures of these arcs can cause fatal burns at up to about 5 ft and major burns at up to about 10 ft distance from the arc. Additionally, electrical arcs expel droplets of molten terminal material that shower the immediate vicinity, similar to, but more extensive than that from electrical arc welding. These fi ndings started to fi ll a void created by early works that identifi ed electrical shock as the major electrical hazard. Mr. Lees work also helped establish a relationship between time to human tissue cell death and temperature, as well as a curable skin burn time-temperature relationship. Once forensic analysis of electrical incidents focused on the arc-fl ash hazard, experience over a period of time indicated that Ralph Lees formulas for calculating the distance-energy relationship from source of arc did not serve to reconcile the greater thermal effect on persons positioned in front of opened doors or removed covers, from arcs inside electrical equipment enclosures. A technical paper by Doughty, Neal, and Floyd, “Predicting incident energy to better manage the electric arc hazard on 600 v power distribution systems” B4 presented the fi ndings from many structured tests using both “arcs in open air” and “arcs in a cubic box.” These three phase tests were performed at the 600 V rating and are applicable for the range of 16 000 to 50 000 A short-circuit fault current. It was established that the contribution of heat refl ected from surfaces near the arc intensifi es the heat directed toward the opening of the enclosure. The focus of industry on electrical safety and recognition of arc-fl ash burns as having great signifi cance highlighted the need for protecting employees from all arc-fl ash hazards. The limitations on applying the known “best available” formulas for calculating the “curable” and “incurable” burn injuries have been overcome. This guide does that with new, empirically derived models based on statistical analysis and curve fi tting of the overall test data available. Conducting an arc-fl ash hazard analysis has been diffi cult. Not enough arc-fl ash incident energy testing had been done from which to develop models that accurately represent all the real applications. The available algorithms are diffi cult for engineers in offi ces to solve and near impossible for people in the fi eld to apply. This working group has overseen a signifi cant amount of testing and has developed new models of incident energy. The arc-fl ash hazard calculations included in this guide will enable quick and comprehensive solutions for arcs in single- or three- phase electrical systems either of which may be in open air or in a box, regardless of the low or medium voltage available. Warranty THE IEEE DOES NOT WARRANT OR REPRESENT THE ACCURACY OR CONTENT OF THE WORK AND EXPRESSLY DISCLAIMS ANY EXPRESS OR IMPLIED WARRANTY, INCLUDING ANY IMPLIED WARRANTY OF MERCHANTABILITY OR FITNESS FOR A SPECIFIC PURPOSE OR THAT THE USE OF THE WORK IS FREE FROM PATENT INFRINGEMENT. THE WORK IS SUPPLIED ONLY “AS IS.” USE AT YOUR OWN RISK. a The numbers in brackets correspond to those of the bibliography in Annex F. Authorized licensed use limited to: Peking University. Downloaded on December 26,2010 at 16:49:41 UTC from IEEE Xplore. Restrictions apply. iv Copyright © 2002 IEEE. All rights reserved. Acknowledgments Many organizations and individuals made cash or in-kind contributions that enabled the test program on which this guide is based. The IEEE Std 1584-2002 working group and IEEE gratefully acknowledge these contributions. Sponsors Cooper Bussmann Cooper Crouse-Hinds DuPont Nomex Kinectrics Inc. U. S. Navy NAVSEA Command Square D Company Supporters Agrium Inc. The Dow Chemical Company Eastman Kodak L Bruce McClung Contributors Duke Energy Eastman Chemical SKM Systems Sophisticated statistical analysis was required to develop the empirically derived model which is presented in this guide. The IEEE Std 1584-2002 working group recognizes and thanks Dr. David Berengut for his work on this analysis. The “Bolted Fault Calculator” worksheet in the “IEEE_1584_Bolted_Fault_Cal.xls” was contributed by Paul and Dick Porcaro. The IEEE Std 1584-2002 working group recognizes and thanks them for this contribution. The calculators can be accessed via the auxiliary fi les, “IEEE_1584_Bolted_Fault_Cal.xls” and “IEEE_1584_Arc_Flash_Hazard.xls”, and test data can be accessed via the auxiliary fi les, “Data_set.xls”, “Test_results_database.xls”, and “CL_Fuse_test_data.xls” provided with this standard (CD ROM for print versions and spreadsheet fi les for the PDF version). Authorized licensed use limited to: Peking University. Downloaded on December 26,2010 at 16:49:41 UTC from IEEE Xplore. Restrictions apply. Copyright © 2002 IEEE. All rights reserved. v Participants At the time this standard was completed, the working group had the following membership: Craig M. Wellman, Chair L. Bruce McClung, Vice Chair The following members of the balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. Allen H. Bingham James E. Bowen E. William Buss John Cadick Micheal I. Callanan Donald M. Colaberardino Anthony Cortez Greg Crawford Stephen Cress D. Ray Crow Daniel Doan Paul Dobrowsky Mike Doherty Richard L. Doughty Ray Duff John Gallagher Tammy Gammon George D. Gregory Hugh Hoagland Dennis Johnson Jane Jones Ray Jones William C. Jordan Herman (Buddy) Kemp Kevin Lippert Ken Mastrullo Daleep C. Mohla Ali Nasle Tom Neal David ONeill David A. Pace Robert Pettis Melvin K. Sanders Vincent Saporita Brian Savaria Farrokh Shokooh Nathan Spivey Conrad St. Pierre Alan Turner William E. Veerkamp George Weitzenfeld Gary Wetzel Kenneth P. White Kathleen Wilmer Brian Wright Alonza W. Ballard Louis A. Barrios Henry A. Becker James E. Bowen Frederick Bried Kristine K. Buchholz Donald M. Colaberardino Gary DiTroia Daniel Doan Paul Dobrowsky Gary Donner Richard L. Doughty Bruce G. Douglas Kimberly Eastwood H. Landis Floyd George D. Gregory Mark S. Halpin Erling C. Hesla Jim D. Hill Danny Liggett L. Bruce McClung Michael McNeil Daleep C. Mohla William J. Moylan Paul W. Myers Daniel R. Neeser Arthur S. Neubauer David ONeill Ted W. Olsen David A. Pace Lorraine K. Padden Giuseppe Parise John E. Propst Franklin Roberts Melvin K. Sanders Vincent Saporita Sukanta Sengupta Dennis R. Thonsgard Michael K. Toney William E. Veerkamp Michael Wactor Craig M. Wellman Donald W. Zipse Authorized licensed use limited to: Peking University. Downloaded on December 26,2010 at 16:49:41 UTC from IEEE Xplore. Restrictions apply. vi Copyright © 2002 IEEE. All rights reserved. When the IEEE-SA Standards Board approved this standard on 12 September 2002, it had the following membership: James T. Carlo, Chair James H. Gurney, Vice Chair Judith Gorman, Secretary *Member Emeritus Also included is the following nonvoting IEEE-SA Standards Board liaison: Alan Cookson, NIST Representative Satish K. Aggarwal, NRC Representative Noelle D. Humenick IEEE Standards Project Editor Sid Bennett H. Stephen Berger Clyde R. Camp Richard DeBlasio Harold E. Epstein Julian Forster* Howard M. Frazier Toshio Fukuda Arnold M. Greenspan Raymond Hapeman Donald M. Heirman Richard H. Hulett Lowell G. Johnson Joseph L. Koepfi nger* Peter H. Lips Nader Mehravari Daleep C. Mohla William J. Moylan Malcolm V. Thaden Geoffrey O. Thompson Howard L. Wolfman Don Wright Authorized licensed use limited to: Peking University. Downloaded on December 26,2010 at 16:49:41 UTC from IEEE Xplore. Restrictions apply. Copyright © 2002 IEEE. All rights reserved. vii Contents 1.Overview 1 1.1 Scope 1 1.2 Purpose. 1 2.References 2 3.Definitions 2 4.Analysis p