JIS Z 2356：2006 Method of automatic ultrasonic inspection for graphite ingot.pdf

Z 2356：2006 （1） 規格，工業標準化法第 12 条第 1 項規定基，社団法人日本非破壊検査協会(JSNDI)財団 法人日本規格協会(JSA)，工業標準原案具日本工業規格制定申出，日本工業 標準調査会審議経，経済産業大臣制定日本工業規格。 規格一部，技術的性質特許権，出願公開後特許出願，実用新案権，又出願公開後 実用新案登録出願抵触可能性注意喚起。経済産業大臣及日本工業標準調査会 ，技術的性質特許権，出願公開後特許出願，実用新案権，又出願公開後実用新 案登録出願確認，責任。 JIS Z 2356 ，次示附属書。 附属書 1（規定）黒鉛素材超音波特性測定用対比試験片及測定方法 附属書 2（規定）黒鉛素材超音波伝搬特性試験方法 免费标准下载网( w w w . f r e e b z . n e t ) 免费标准下载网( w w w . f r e e b z . n e t ) 无需注册 即可下载 Z 2356：2006 （2） 目 次 1. 適用範囲 適用範囲·········································································································································································1 2. 引用規格 引用規格·········································································································································································1 3. 定義 定義·················································································································································································1 4. 検査原理 検査原理····································································································································································3 5. 試験体及検出対象 試験体及検出対象···········································································································································3 6. 技術者 技術者·············································································································································································3 7. 超音波自動探傷装置構成 超音波自動探傷装置構成·······································································································································4 7.1 装置基本構成 装置基本構成··························································································································································4 7.2 超音波探傷器 超音波探傷器······························································································································································4 7.3 探触子 探触子···········································································································································································4 7.4 走査装置 走査装置 ······································································································································································4 7.5 画像表示収録装置 画像表示収録装置··················································································································································5 8. 超音波自動探傷試験条件設定 超音波自動探傷試験条件設定·······························································································································5 8.1 試験片 試験片···········································································································································································5 8.2 水距離 水距離···········································································································································································5 8.3 軸入射点 軸入射点··························································································································································5 8.4 探傷必要走査及監視範囲 探傷必要走査及監視範囲·····························································································································6 8.5 距離振幅補償方法 距離振幅補償方法······················································································································································6 8.6 見幅測定 見幅測定·········································································································································6 8.7 面走査収録点間隔選定 面走査収録点間隔選定············································································································7 8.8 入射角走査収録点間隔選定 入射角走査収録点間隔選定····································································································7 8.9 探傷感度補正量評価 探傷感度補正量評価·············································································································································7 9. 超音波自動探傷試験手順 超音波自動探傷試験手順·······································································································································7 9.1 試験体 試験体···········································································································································································7 9.2 探傷時期及内容 探傷時期及内容··················································································································································8 10. 超音波自動探傷試験 超音波自動探傷試験··················································································································································9 10.1 試験準備 試験準備····································································································································································9 10.2 一次探傷 一次探傷····································································································································································9 10.3 二次探傷 二次探傷····································································································································································9 11. 合否判定基準 合否判定基準····························································································································································10 12. 記録 記録·············································································································································································10 12.1 試験実施成績書 試験実施成績書······················································································································································10 12.2 走査方法及収録 走査方法及収録·························································································································10 12.3 探傷条件 探傷条件··································································································································································10 12.4 探傷 探傷······························································································································································10 免费标准下载网( w w w . f r e e b z . n e t ) 免费标准下载网( w w w . f r e e b z . n e t ) 无需注册 即可下载 Z 2356：2006 （3） 附属書附属書 1（規定）黒鉛素材超音波特性測定用対比試験片及測定方法（規定）黒鉛素材超音波特性測定用対比試験片及測定方法··························································11 附属書附属書 2（規定）黒鉛素材超音波伝搬特性試験方法（規定）黒鉛素材超音波伝搬特性試験方法···························································································16 免费标准下载网( w w w . f r e e b z . n e t ) 免费标准下载网( w w w . f r e e b z . n e t ) 无需注册 即可下载 日本工業規格 JIS Z 2356：2006 黒鉛素材超音波自動探傷検査方法 Method of automatic ultrasonic inspection for graphite ingot 1. 適用範囲適用範囲 規格，等方性黒鉛材料方位向面状，一探触子使 反射法利用，水中行超音波自動探傷検査方法規定。 2. 引用規格引用規格 次掲規格，規格引用，規格規定一部構成 。引用規格，最新版（追補含。 ）適用。 JIS Z 2300 非破壊試験用語 JIS Z 2305 非破壊検査技術者資格及認証 JIS Z 3070 鋼溶接部超音波自動探傷方法 3. 定義定義 規格用主用語定義，JIS Z 2300 及 JIS Z 3070 3.（定義），次 。 a) 面走査面走査 探触子移動方向及間隔設定方法，試験体入射面沿二次元走査。二種 入射面応 3.b) RX 走査又 3.c) RZ 走査実施。 b) RX 走査走査 面走査，平面試験体上下面入射行試験体回転試験体径 方向走査（図図 1 参照） 。 c) RZ 走査走査 面走査，曲面試験体側面入射行試験体回転試験体高 方向走査（図図 2 参照） 。 d) 入射角走査入射角走査 探触子移動方向及間隔設定方法，面走査入射角順次変更 走査。入射面対応 i1i2走査又 i1off走査，直交走査又千鳥走査 方法実施。 e) i1i2走査走査 入射角走査，試験体上下面入射行上下角（探触子傾斜角）i1水 平角（探触子旋回角）i2走査（図図 1 参照） 。走査点（収録点） RX 走査 行。 f) i1off走査走査 入射角走査，試験体側面入射行上下角（探触子傾斜角）i1 off走査（図図 2 参照） 。走査点（収録点） RZ 走査行。 g) 直交走査直交走査 入射角走査，走査点正方格子描走査。 h) 千鳥走査千鳥走査 入射角走査，走査点数削減，走査点正六角格子描，互違千鳥 模様走査（図図 3 参照） 。 i) 一次探傷一次探傷 二段階探傷始行。 比較的大見幅相当走査， 比較的高探傷感度行，二次探傷部位特定。 j) 二次探傷二次探傷 二段階探傷二番目行。一次探傷特定部位対，比較的小見 免费标准下载网( w w w . f r e e b z . n e t ) 免费标准下载网( w w w . f r e e b z . n e t ) 无需注册 即可下载 2 Z 2356：2006 幅相当走査，端補正一次探傷低探傷感度行，試験体 合否判定行。 k) 2 軸首振走査軸首振走査 基準感度設定平底穴高測定，黒鉛中伝搬超音 波波頭揺補償，入射角 2 軸走査，最大高求走査。 l) 幾何学的屈折角幾何学的屈折角 黒鉛中平均音速用，入射角法則計算屈折角。 ，音速有効数字二概略値使用。 m) 面方向幅面方向幅 検出相当平底穴対面走査行，最大高規定強 度低下内出現面方向範囲。 図図 1 RX 走査模式図 図図 2 RZ 走査模式図 免费标准下载网( w w w . f r e e b z . n e t ) 免费标准下载网( w w w . f r e e b z . n e t ) 无需注册 即可下载 3 Z 2356：2006 図図 3 入射角走査千鳥走査模式図 n) 角度方向幅角度方向幅 検出相当平底穴対角度走査行，最大高規定 強度低下内出現角度方向範囲。 o) 見減衰補正率見減衰補正率 探傷感度設定行，2 軸首振走査波頭揺補償 残対比試験片試験体最大高差，黒鉛素材減衰率差見 行探傷感度補正割合。 4. 検査原理検査原理 探傷検査方法，伝搬超音波波頭揺見素材対象 ，試験体超音波伝搬特性測定行後，試験体全体水没一探触子反 射法用垂直及斜入射超音波自動探傷行。黒鉛焼結体， 方位限定，方位面状検出，一入射面対平 面走査加，独立二入射角変走査。 5. 試験体及検出対象試験体及検出対象 規格用試験体，直径高比 1 対 1 程度任意大 円柱形状，直径及高最大値 225 mm 。検出対象最小寸法，等 価直径 3 mm 以上任意値設定。 備考備考1. 等方性黒鉛，静水圧成形法適用製造。 2. 探傷検査方法前提，設計許容欠陥寸法，位置及方向評価 要求，検出対象最小寸法，許容欠陥寸法以下，等価直径 3 mm 以上任意値設定。 6. 技術者技術者 黒鉛素材超音波探傷試験従事技術者，JIS Z 2305 UT 2 有資格者又 相当技術者，黒鉛材料関知識及探傷十分知識，超音波自動 探傷装置使用関教育及訓練受者。 免费标准下载网( w w w . f r e e b z . n e t ) 免费标准下载网( w w w . f r e e b z . n e t ) 无需注册 即可下载 4 Z 2356：2006 7. 超音波自動探傷装置構成超音波自動探傷装置構成 7.1 装置基本構成装置基本構成 使用装置，超音波探傷器，探触子，走査装置及画像表示収録装置構 成。装置構成，図図 4 示。 図図 4 超音波自動探傷装置構成 7.2 超音波探傷器超音波探傷器 超音波探傷器，JIS Z 3070 6.（超音波自動探傷器必要機能及性能）規 定機能及性能， 7.2.1 示収録機能， 距離振幅補償機能 （DAC 回路） ， 出力及機能使用。 7.2.1 収録収録 最低一収録。 7.2.2 距離振幅補償距離振幅補償 探傷行路程内 6 点以上高 DAC 作成。 DAC 回路，30 dB 以上補償性能。 7.2.3 出力及機能出力及機能 超音波探傷器，各走査条件，収録内最大 高示高及路程出力，A 図形機能 。 7.3 探触子探触子 探触子，長路程間黒鉛素材組織雑音及検出対象最小寸法 等価直径面状対良好 SN 比得目的，公称周波数 12 MHz，振動子公 称直径 25 mm 程度，周波数帯域比較的広非集束水浸探触子使用。 7.4 走査装置走査装置 走査装置，円柱試験体対方位検出対象，XYZ 3 軸加，試験体回転並探触子傾斜及旋回行，垂直入射及斜入射可能駆動機 構水槽用。 7.4.1 走査装置必要機能走査装置必要機能 走査装置，自動及手動次事項制御行。 a) X 軸軸 手動移動及自動走査（及速度） b) Y 軸軸 手動移動及自動走査（及速度） c) Z 軸軸 手動移動及自動走査（及速度） d) 探触子傾斜角探触子傾斜角 i1 手動移動 e) 探触子施回角探触子施回角 i2 手動移動 f) 試験体回転角試験体回転角 R 手動移動及自動走査（及速度） 免费标准下载网( w w w . f r e e b z . n e t ) 免费标准下载网( w w w . f r e e b z . n e t ) 无需注册 即可下载 5 Z 2356：2006 7.4.2 走査装置必要性能走査装置必要性能 走査装置，所定収録点，次走査範囲及精度 。 a) X，Y，Z 軸軸 分解能及最小，0.5 mm 以下。 b) 探触子傾斜角探触子傾斜角 走査範囲，9090°，分解能，0.1°以下。 c) 探触子施回角探触子施回角 走査範囲，0360°，分解能，0.1°以下。 d) 試験体回転角試験体回転角 走査範囲，0360°，分解能及最小，0.2°以下。 7.5 画像表示収録装置画像表示収録装置 画像表示，円柱試験体上下面及側面対 C 表示機能 ，収録内最大示高及路程，並探触子入射点 位置，入射角及試験体回転角収録機能用。 7.5.1 画像表示収録装置必要機能画像表示収録装置必要機能 画像表示収録装置，次機能。 a) 試験体上下面入射時 C 表示 b) 試験体側面入射時 C 表示 c) 収録内最大高示高及路程 d) 収録内最大高位置探触子入射位置 (X， Y， Z) 及入射角(i1， i2) 並試験体回転角(R)記録 e) 収録保存媒体記録 7.5.2 画像表示収録装置必要性能画像表示収録装置必要性能 画像表示収録装置，次性能。 a) 表示高又領域下限，測定後任意高変更表示。 b) C 各座標軸，検出対象最小寸法以下分解能反射源位置表示。 c) 表示反射源，収録高又領域別，2 種類以上濃淡又色合確 認。 8. 超音波自動探傷試験条件設定超音波自動探傷試験条件設定 8.1 試験片試験片 8.1.1 試験片表面処理試験片表面処理 試験片，表面粗（中心線平均粗）Ra3.2 以下機械加工行後，十 分乾燥。 防水処理浸透性小樹脂剤表面薄塗布。 8.1.2 試験機器校正試験機器校正 探傷試験試験機器校正，指定対比試験片用行。 8.1.3 対比試験片対比試験片 次測定項目満対比試験片準備。対比試験片寸法形状及測定方法 ，附属書附属書 1 。 ，減衰補正，8.9 c)基，対比試験片使用，試験体行 。 a) 距離振幅補償距離振幅補償 距離振幅補償方法，8.5 。 b) 見幅見幅 見幅測定，8.6 。 c) 基準感度調整基準感度調整 基準感度調整方法，10.1 a)。 d) 探傷感度補正探傷感度補正 探傷感度補正，8.9 。 8.2 水距離水距離 試験体探触子水距離，試験体内探傷領域内距離振幅曲線乱 条件，S2表面 B1底面路程外設定。 8.3 軸入射点軸入射点 斜入射，探触子幾何学的中心軸延長線試験体交点 軸入射点。 免费标准下载网( w w w . f r e e b z . n e t ) 免费标准下载网( w w w . f r e e b z . n e t ) 无需注册 即可下载 6 Z 2356：2006 8.4 探傷必要走査及監視範囲探傷必要走査及監視範囲 方位面状探傷，試験体上下面及試験 体側面傾約 70°傾探傷。必要走査範囲，次。 8.4.1 試験体上下面入射試験体上下面入射 試験体上下面入射，次。 a) R 軸走査範囲軸走査範囲 0360° b) X 軸走査範囲軸走査範囲 試験体中心試験体側面（距離：試験体半径） c) i1軸走査範囲軸走査範囲 幾何学的屈折角 070° d) i2軸走査範囲軸走査範囲 0360° 8.4.2 試験体側面入射試験体側面入射 a) R 軸走査範囲軸走査範囲 0360° b) Z 軸走査範囲軸走査範囲 試験体上面試験体下面（距離：試験体高） c) i1軸走査範囲軸走査範囲 幾何学的屈折角 070° d) off軸走査範囲軸走査範囲 幾何学的屈折角 070° 8.4.3 監視範囲設定及必要走査範囲確認監視範囲設定及必要走査範囲確認 幾何学的屈折角 0°，10°，20°，30°及 45° 傾対探傷範囲作図，各走査条件監視範囲設定。同時 作図，未探傷領域条件，9.1.1 規定試験体外周幅 5 mm 及端 部 12 mm 角収確認。，附属書附属書 1 5.基全方位探傷確認行。 8.5 距離振幅補償方法 附属書距離振幅補償方法 附属書 1 2.2 基， 試験体上下面垂直入射， 必要 路程，DAC 回路用電子的距離振幅補償行。補償，30 dB 以下。距離振 幅補償，試験体上下面斜入射並試験体側面垂直及斜入射対， 適用。 8.6 見幅測定見幅測定 附属書附属書 1 2.3 及附属書附属書 1 3.2 基，試験体上下面及試験体側 面垂直入射面走査及入射角走査見測定，検出対 象最小寸法応，表表 1 示値基本強度低下対応見幅求。 測定，必要路程対比試験片行，中最小値，面方向及角度方向 一次探傷幅及二次探傷幅。 表表 1 面方向及角度方向一次探傷幅及二次探傷幅対強度低下 単位 dB 検出対象最小寸法一次探傷幅 対強度低下 二次探傷幅 対強度低下 3 mm 以上 5 mm 未満 3 1 5 mm 以上 6 3 8.7 面走査収録点間隔選定面走査収録点間隔選定 試験体上下面入射 RX 走査，試験体 側面入射 RZ 走査行， 8.6 設定面方向一次探傷幅及 面方向二次探傷幅基準，未探傷領域走査条件設定。 R 走査，入 射点間隔面方向幅 1/5 以下角度行，X 走査及 Z 走査，面方向幅以 下探傷行。図図 1 及図図 2 RX 走査及 RZ 走査模式図示。 8.8 入射角走査収録点間隔選定入射角走査収録点間隔選定 試験体上下面入射 i1i2走査， 試験 免费标准下载网( w w w . f r e e b z . n e t ) 免费标准下载网( w w w . f r e e b z . n e t ) 无需注册 即可下载 7 Z 2356：2006 体側面入射 i1off 走査行， 8.6 設定角度方向一次探傷幅 及角度方向二次探傷幅基準，直交走査又千鳥走査（図図 3）用，未探傷領域 走査条件設定。 i1走査，幾何学的屈折角角度方向幅以下探傷 行。i2走査及 off走査， i1最大入射角付近，幾何学的屈折角表示 収録点正方格子（直交走査場合）又正六角格子（千鳥走査場合）描設定。i1小 ，i2及 off探傷大，探傷条件単純化， 1 段 前整数倍以上整数倍変更望。 ，直交走査又千鳥走査未探傷領域，見幅 8.6 設定 角度方向幅 1.42 倍（直交走査場合）又 1.15 倍（千鳥走査場合）必要， 端強度低下 8.9 d)端補正導入。 8.9 探傷感度補正量評価探傷感度補正量評価 探傷感度 GR (dB)，10.2 c)及 10.3 c)規定，10.1 a)求 検出対象最小寸法同直径平底穴（検出対象相当平底穴）高表示器目盛 80 基準感度 GT設定，次補正項測定，付加。 a) 入射面補正入射面補正Gp 附属書附属書 1 4.1 基，平面試験体上下面