BS-9300-C379-388-1971.pdf

BRITISH STANDARD CONFIRMED NOVEMBER 1986 BS 9300 C379-388 ISSUE 1 MARCH 1971 Electronic parts of assessed quality Silicon stud mounted, power rectifier diodes Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:56:49 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9300 C379-388 ISSUE 1 MARCH 1971 © BSI 04-2000 ISBN 0 580 34373 1 A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, pages 1 to 10 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover. Amendments issued since publication Amd. No.DateComments Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:56:49 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9300 C379-388 ISSUE 1 MARCH 1971 © BSI 04-2000i Contents Page Appendix Life tests for small lot, very expensive testing9 Figure 1 Max. total loss curve7 Figure 2 Derating curve7 Figure 3 Surge current rating for d.c. surges8 Table 1 Group A Inspection3 Table 2 Group B Inspection4 Table 3 Group C Inspection6 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:56:49 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9300 C379-388 ISSUE 1 MARCH 1971 ii © BSI 04-2000 1. Specifications CV7379-CV7388, Issue 1A dated 29 September 1965 with their existing amendments which are reproduced below are hereby adopted as BS 9300 C379-C388. 2. Devices inspected, released and supplied to this specification shall be marked CV7379-CV7388 as appropriate and where applicable, with the letters KB. 3. The references to “Military specification”, “Commercial equivalents”, “Reliability assurance provisions” or requirements and “Preparation for delivery” shall be disregarded. 4. In the Groups A, B and C inspection tables the references in the “K1007/NATO Ref” column shall be superseded by the appropriate reference given in BS 9300 Appendix C (Tables 1 to 5 inclusive). 5. Additional requirements not covered by BS 9300 Appendix C are: 6. Published amendments (consolidated) Page 2. Delete “Joint Services Catalogue Numbers” and substitute “NATO Stock Numbers”. Against each CV type number, delete “5960” and substitute “5961”. Page 1. Amend Note D to read as follows: SL-203-K, SL-403-K, SL-603-K, SL-803-K, SL-1003-K, Stud Anode. SL-203-A to SL-1003-A Stud Cathode. Page 4. Group B. Subgroup 3, Vibration fatigue. Delete reference to “Note 1” under Inspection level 1A (now S-a). Other amendments are superseded by Table 4 of BS 9300 Appendix C. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:56:49 GMT+00:00 2006, Uncontrolled Copy, (c) BSI K1007/CV7379-88 Issue 1A 29th September 1965 © BSI 04-20001 Military specification CV 7379-88 Semiconductor device, rectifier diode Ô Indicates Change Absolute Maximum Ratings: Primary Electrical Characteristics: NOTE 1At appropriate VRW for each type Description:This specification covers the detail requirements for a Silicon, Stud Mounted, Power Rectifier Diode and is in accordance with Specification K1007, Issue 3 except as otherwise stated. Mechanical Dimensions and Outlines: Drawing 10.3.3.2 Connections:Stud-Anode CV7379-7383 Stud-Cathode CV7384-CV7388 Device Ratings VRWVRSIOIFSTcaseTstgVib.Shock UnitVVAA°C°Cgg CV7379 CV7384 Min. See Figure 3. 55 Max.20020010150+ 150 20100Ô CV7380 CV7385 Min. 55 Max.40040010150+ 150 20100Ô CV7381 CV7386 Min. 55 Max.60060010150+ 150 20100Ô CV7382 CV7387 Min. 55 Max.80080010150+ 150 20100Ô CV7383 CV7388 Min. 55 Max.1 0001 00010150+ 150 20100Ô NoteABCÔ Notes:A.At 125 °C stud temperature. For method of measurement see TVC information, sheet 10. The maximum total loss is given in Figure 1. B.See Derating Curve Figure 2 C.Duration 6mSec. D.Commercial equivalent SL-203-3K, SL-403-3K, SL-603-3K SL-803-3K, SL-1003-3K, Stud Anode. SL-203-A, SL-1003-A, Stud Cathode. CharacteristicsVFIRIR UnitV4A4A CV7379-CV7388 Min. Max.1.250500 Conditions Tcase°C2525100 VRVNote 1Note 1 IFA10 Reliability Assurance Requirements:Under discussion. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:56:49 GMT+00:00 2006, Uncontrolled Copy, (c) BSI K1007/CV7379-88 Issue 1A 29th September 1965 2 © BSI 04-2000 Applicable Documents Requirements: Quality Assurance provisions: Preparation for Delivery: Joint Services Catalogue Numbers: This specification has been prepared by, and the Qualification Approval Authority is: Ministry of Aviation, Royal Radar Establishment, Malvern, Worcs., England. T.V.C. Information Sheets Nos. 9 and 10 MarkingThe device shall be marked as K1007, Section B, 1.3.4 as space permits. Destructive TestsThe tests listed in Table 2, Group B Inspection, Sub Group 2, 3 and 4 are considered destructive. Group C InspectionThis inspection shall be conducted on the initial lot, and thereafter every ninety days or every fifth lot, whichever occurs first. PackagingThe device shall be packed according to K1007, Issue 3, Section A, 1.2 c) CV7379=5960-99-037-3349 CV7380=5960-99-037-3350 CV7381=5960-99-037-3351 CV7382=5960-99-037-3352 CV7383=5960-99-037-3353 CV7384=5960-99-037-3354 CV7385=5960-99-037-3355 CV7386=5960-99-037-3356 CV7387=5960-99-037-3357 CV7388=5960-99-037-3358 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:56:49 GMT+00:00 2006, Uncontrolled Copy, (c) BSI K1007/CV7379-88 Issue 1A 29th September 1965 © BSI 04-20003 Table 1 Group A Inspection Examination or Test Test conditions AQL % Insp. Level Symbol Limits Units K1007/NATO Ref.Specific conditionsMin.Max. SUB GROUP 1 Visual and Mechanical Inspection SUB GROUP 2 Forward Voltage Drop Reverse Current (1) SUB GROUP 3 Reverse Current (2) 5.1 8A.3.2 8A.2.2 8A.2.2 Excluding Physical Dimensions IF= 10A Note 2 VRW= CV7379, CV7384, 200V CV7380, CV7385, 400V CV7381, CV7386, 600V CV7382, CV7387, 800V CV7383, CV7388. 1 000V Tcase= 100 °C CV7379, CV7384, 200V CV7380, CV7385, 400V CV7381, CV7386, 600V CV7382, CV7387, 800V CV7383, CV7388, 1 000V 0.65 0.65 2.5 I II I VF IR IR IR IR IR IR IR IR IR IR 1.2 50 50 50 50 50 500 500 500 500 500 V 4A 4A 4A 4A 4A 4A 4A 4A 4A 4A Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:56:49 GMT+00:00 2006, Uncontrolled Copy, (c) BSI K1007/CV7379-88 Issue 1A 29th September 1965 4 © BSI 04-2000 Table 2 Group B Inspection (See Page 2 Quality Assurance Provisions, Destructive Tests) Examination or Test Test conditions AQL % Insp. Level Symbol Limits Units K1007/NATO Ref.Specific ConditionsMin.Max. F F SUB GROUP 1 Physical Dimensions SUb GROUP 2 Temperature Cycling Moisture Resistance SUB GROUP 3 Vibration Fatigue SUB GROUP 4 Torque Test SUB GROUPS 5 & 6 Omitted SUB GROUP 7 High Temperature Life (non-operating) SUB GROUP 8 Operating Life 5.1.2 5.5 5.3.1 5.15.1 5.12.1 6.2.1 6.6.1.2.1 6.3.2 6.6.3 (See Appendix) According to drawing 10.3.3.2 55 °C to + 100 °C Non-operating 15 lbs. ins. Tstg= 100 °C Duration = 1 000 hrs. Tcase= 125 °C min. Io= 10A min Crest working voltage VRW= CV7379, CV7384 200V CV7380, CV7385 400V CV7381, CV7386 600V CV7382, CV7387 800V CV7383, CV7388 1 000V 6.5 4.0 4.0 6.5 4.0 4.0 IC IA IA Note 1 IA I Note 1 IA Ô Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:56:49 GMT+00:00 2006, Uncontrolled Copy, (c) BSI K1007/CV7379-88 Issue 1A 29th September 1965 © BSI 04-20005 Table 2 Group B Inspection Examination or Test Test conditions AQL % Insp. Level Symbol Limits Units K1007/NATO Ref.Specific ConditionsMin.Max. Post Test End Points for Sub-Groups 2, 3, 7 and 8 Forward Voltage Drop Reverse Current (1) 8A.3.2 8A.2.2 As in Group A, Sub-Group 2 As in Group A, Sub-Group 2 VF IR 1.3 60 V 4A Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:56:49 GMT+00:00 2006, Uncontrolled Copy, (c) BSI K1007/CV7379-88 Issue 1A 29th September 1965 6 © BSI 04-2000 Table 3 Group C Inspection See Page 2. Quality Assurance Provisions, Group C Inspection Examination or Test Test conditions AQL % Insp. Level Symbol Limits Units K1007/NATO Ref.Specific ConditionsMin.Max. SUB GROUP 1 Omitted SUB GROUP 2 Shock Post Test End Points Forward Voltage Drop Reverse Current (1) 5.17 8A.3.2 8A.2.2 Non-operating, 5 blows in each of three mutually perpendicular directions. As in Group A. Sub Group 2 As in Group A. Sub Group 2 6.5IA VF IR 1.3 60 V 4A NOTE 1Maximum sample size 125. NOTE 2Stud temperature maintained at a value not exceeding 30 °C Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:56:49 GMT+00:00 2006, Uncontrolled Copy, (c) BSI K1007/CV7379-88 Issue 1A 29th September 1965 © BSI 04-20007 Figure 1 Max. total loss curveFigure 2 Derating curve Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:56:49 GMT+00:00 2006, Uncontrolled Copy, (c) BSI K1007/CV7379-88 Issue 1A 29th September 1965 8 © BSI 04-2000 Figure 3 Surge current rating for d.c. surges Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:56:49 GMT+00:00 2006, Uncontrolled Copy, (c) BSI K1007/CV7379-88 Issue 1A 29th September 1965 © BSI 04-20009 Appendix Life tests for small lot, very expensive testing This procedure is intended for application to Approval for use shall be obtained from the Qualification Approval Authority unless specified in the detail specification. 1 Inspection Level For lot sizes up to 200, at least one device shall be taken from each lot and life tested for 1 000 hours. For lot sizes 201 and over, at least two devices shall be taken from each lot and life tested for 1 000 hours. 2 Classification of Failures Failures are defined as a) inoperatives b) characteristic failures which can be monitored while the life tests is in operation c) characteristic failures which can only be measured when the device is not in operation under the life test conditions. 3 Merit Life Merit Life is defined as the ratio of the accumulated actual life hours to the total accumulated life hours that would have occurred had there been no failures, expressed as a percentage: The merit life shall be computed from either the time when an inoperative occurs or the time when the devices was last recorded within the specified limits. 3.1 Rectifiers and Thyristors The life test shall be arranged to that failures are indicated when they occur. Only (A) and (B) in section 6.6.3.2 above will be specified. 3.2 Transistors and Other Devices The devices on life test shall be tested for the reference parameters at suitable time intervals to ascertain when a device has failed. 3.4 Procedure for continuous production When 1 000 hours have elapsed since the sample drawn from the first lot was placed on life test, there should be at least four additional samples undergoing life test, with various numbers of hours on test. The Merit Life shall be computed for the first five lots. If the Merit Life exceeds 90 %, the first lot is acceptable. When 1 000 hours have elapsed since the sample from the second lot using the test results from the first five lots. If this exceeds 90 % the second lot is acceptable. The acceptability of the third, fourth and fifth lots is determined from the first five lots. If when the sample from one of the first five lots have been life tested for 1 000 hours, the computed Merit Life is 90 % or less, the lot from which the sample was drawn shall be held in store. If when the sample from the subsequent lot has been life tested for 1 000 hours, the computed Merit Life is 90 %, both lots shall be accepted. IF the Merit Life is 90 % or less, both lots shall be held. When the sample from the fifth lot has been life tested for 1 000 hours, if the computed Merit Life for all five samples exceeds 90% all lots being held shall be accepted. If the Merit Life is 90 % or less, all lots being held shall be rejected. When the sample from the sixth lot has been life tested for 1 000 hours, the Merit Life shall be computed for the samples from lots 2 to 6. If this exceeds 90 %, lot 6 shall be accepted: if it is 90 % or less, lot 6 shall be rejected. A similar procedure shall apply for subsequent lots, the Merit Life being computed on the combined results of the completed life tests of the lot under consideration and the previous for consecutive lots. When any sample has passed the prescribed life test period or has failed it shall be removed from test. a) small lot sizes, or b) very expensive devices or c) devices which are expensive to test, e.g. high power devices or for which testing may be of a destructive nature. Merit Life Actual hours run Total possible hours -100 %×= Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:56:49 GMT+00:00 2006, Uncontrolled Copy, (c) BSI K1007/CV7379-88 Issue 1A 29th September 1965 10 © BSI 04-2000 3.5 Reduced Duration When five consecutive lots have been accepted without any of them having been held due to failure to meet the 90 % merit life requirement, reduced duration life testing is applicable, and the Merit Life shall then be computed after the sample from a lot has been life tested for 340 hours. If when a sample from a given lot has been life tested for 340 hours the computed Merit Life is 90 % or less, the lot shall be held in store and the life test of that sample and subsequent samples shall continue to 1 000 hours, the Merit Life being computed after 1 000 hours for each sample. Reduced duration testing shall be again applicable after five consecutive lots have been accepted. 3.6 Single Lot or non-continuous production If production is not continuous (see section 11.1.2) the above procedure cannot be used. In this case the manufacturer shall place at least five devices on life test from a given lot. After 1 000 hours the Merit Life for the sample shall be computed and if this exceeds 90 % the lot shall be accepted. If it is 90 % or less the lot shall be rejected. If production is continuous, (section 11.1.2), but an interval of more than one month occurs between any two lots at the start of a production run, either the manufacturer shall place additional devices on life test from one or more lots, or lots shall be held in store for a period after the sample has completed 1 000 hours of life test, so that the Merit Life is computed from the results of life tests on not less than five devices before a determination of acceptability is made. 3.7 Additional samples The manufacture