BS-9925-01.0-1984 IEC-60723-2-1983 QC-250100-1983.pdf

BRITISH STANDARD BS 9925-01.0: 1984 IEC 723-2: 1983 QC 250100: 1983 Harmonized system of quality assessment for electronic components Inductor and transformer cores for telecommunications Part 01.0: Sectional specification: Magnetic oxide cores for inductor applications IEC title: Inductor and transformer cores for telecommunications Part 2: Sectional specification: Magnetic oxide cores for inductor applications UDC 621.3.042.1:621.318.435:621.39 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 02:08:43 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9925-01.0:1984 This British Standard, having been prepared under the direction of the Electronic Components Standards Committee, was published under the authority of the Board of BSI and comes into effect on 28 September 1984 © BSI 01-2000 The following BSI references relate to the work on this standard: Committee reference ECL/20 Draft for comment 81/24242 DC ISBN 0 580 14056 3 Committees responsible for this British Standard The preparation of this British Standard was entrusted by the Electronic Components Standards Committee (ECL/-) to Technical Committee ECL/20 upon which the following bodies were represented: Electronic Components Industry Federation Electronic Engineering Association Ministry of Defence National Supervising Inspectorate Telecommunication Engineering and Manufacturing Association (TEMA) Amendments issued since publication Amd. No.Date of issueComments Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 02:08:43 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9925-01.0:1984 © BSI 01-2000i Contents Page Committees responsibleInside front cover National forewordii Section 1. Scope Section 2. General 2.1Related documents1 2.2Classification1 Section 3. Quality assessment procedures 3.1Formation of inspection lots and test methods1 3.2Inspection for qualification approval2 3.3Fixed sample size qualification approval test schedule2 3.4Quality conformance inspection2 Section 4. Additional information Section 5. Blank detail specification 5.1Identification of the specification3 5.2Identification of the core3 5.3Limiting conditions (not for inspection purposes)4 5.4Marking4 5.5Ordering information4 5.6Related documents4 5.7Additional specifications or test details4 5.8Certified test records4 Publications referred toInside back cover Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 02:08:43 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9925-01.0:1984 ii © BSI 01-2000 National foreword This Part of this British Standard has been prepared under the direction of the Electronic Components Standards Committee. It is identical with IEC Publication 723-2(QC 250100) “Inductor and transformer cores for telecommunications Part 2: Sectional specification: Magnetic oxide cores for inductor applications”, published in 1982 by the International Electrotechnical Commission (IEC). This standard is a harmonized specification within the IECQ system of quality assessment for electronic components. Terminology and conventions. The text of the International Standard has been approved as suitable for publication as a British Standard without deviation. Some terminology and certain conventions are not identical with those used in British Standards. NOTEIEC 367-1:1971 has been superseded by the 1982 second edition which contains additional test methods for (effective) amplitude permeability and magnetic properties under pulse conditions. At present there are no corresponding British Standards for the following IEC Publications referred to in the text. IEC 133:1967, IEC 226:1967, IEC 424:1973, IEC 431:1983, IEC 525:1976 and also IEC 367-1:1982 (see note above). The Technical Committee has reviewed the provisions of these IEC Publications and has decided that they are acceptable for use in conjunction with this standard. Cross-references International StandardsCorresponding British Standards IEC 68-1:1982 BS 2011 Basic environmental testing procedures Part 1.1:1983 General and guidance (Identical) IEC 68-2-1:1974Part 2.1A:1977 Tests A. Cold (Identical) IEC 68-2-2:1974Part 2.1B:1977 Tests B. Dry heat (Identical) IEC 205:1966 plus supplements 205A (1968) and 205B (1974) BS 6454:1983 Method for calculation of the effective parameters of magnetic piece parts (Identical) IEC 367-1:1971 plus supplements 367-1A (1973) 367-1B (1973) 367-1C (1974) 367-1D (1977) BS 5938 Cores for inductors and transformers for telecommunications Part 1:1980 Methods of measurement (Identical) IEC 367-2:1972 plus supplement 367-2A (1976) Part 2:1980 Guide to the drafting of performance specifications (Identical) IEC 723-1:1982 (QC 250000:1982) BS 9925 Harmonized system of quality assessment for electronic components. Inductors and transformer cores for telecommunications Part 0:1984 Generic specification (Identical) Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 02:08:43 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9925-01.0:1984 © BSI 01-2000iii A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Summary of pages This document comprises a front cover, an inside front cover, pages i to iv, pages 1 to 4, an inside back cover and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 02:08:43 GMT+00:00 2006, Uncontrolled Copy, (c) BSI iv blank Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 02:08:43 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9925-01.0:1984 © BSI 01-20001 Section 1. Scope This sectional specification lists the characteristics, ratings and also the inspection requirements for magnetic oxide cores of assessed quality consisting of at least two parts forming a substantially closed magnetic circuit intended for inductors and tuned transformers for professional and industrial applications. It selects from the generic specification, IEC Publication 723-1, and from the basic specification, IEC Publication 367-1, the appropriate methods of test to be used in detail specifications derived from this specification, in accordance with the corresponding blank detail specification. The cores covered by this specification may be used with an adjuster to provide a change of inductance for tuning purposes. Section 2. General 2.1 Related documents IEC publications: 2.2 Classification A core is classified by: a) shape: for example Pot-core, X-core, RM-core, .; b) size: for example 18 × 11, X 22, RM 6, .; c) class (combined electromagnetic properties, for example temperature coefficient and losses at given frequencies) or material grade. Since no systematic classification of the electromagnetic properties is available in the IEC, each detail specification shall clearly define the class to which it applies. It may also state the appropriate class designation. Normally, a detail specification will cover cores of one shape, size and class. Section 3. Quality assessment procedures 3.1 Formation of inspection lots and test methods 3.1.1 The tests shall be selected from those given in Section 4 of IEC Publication 723-1 or, failing that, shall be described in the detail specification. 3.1.2 Visual examination and measurement of dimensions may be carried out either on half-cores prior to pairing or on sets (see note). The disaccommodation may be measured either on toroidally wound half-cores, if they have a central hole, or on sets (ungapped or gapped). All other tests shall be carried out on sets (see also Sub-clause 3.4). The temperature coefficient shall be measured on gapped sets. Wherever possible, the permeability temperature factor shall be measured on ungapped sets. NOTEA set is a pair of half-cores. 3.1.3 The mechanical tests for the adjusting device are only applicable when the cores are supplied with the fixed part of the adjusting device attached. Publications Nos. 68-1:Basic Environmental Testing Procedures Part 1: General and Guidance. 68-2-1:Part 2: Tests Tests A: Cold. 68-2-2:Part 2: Tests Tests B: Dry Heat. 133:Dimensions for Pot-cores Made of Ferromagnetic Oxides and Associated Parts. 205:Calculation of the Effective Parameters of Magnetic Piece Parts. 226:Dimensions of Cross Cores (X-cores) Made of Ferromagnetic Oxides and Associated Parts. 367-1:Cores for Inductors and Transformers for Telecommunications Part 1: Measuring Methods. 367-2:Part 2: Guides for the Drafting of Performance Specifications. 424:Guide to the Specification of Limits for Physical Imperfections of Parts Made from Magnetic Oxides. 431:Dimensions of Square Cores (RM-cores) Made of Magnetic Oxides and Associated Parts. 525:Dimensions of Toroids Made of Magnetic Oxides or Iron Powder. 723-1:Inductor and Transformer Cores for Telecommunications Part 1: Generic Specification. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 02:08:43 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9925-01.0:1984 2 © BSI 01-2000 3.1.4 The test coils for inductance, and those for loss tangent or Q-factor measurement shall be fully defined; this may be fulfilled by reference to a national or International Standard (see, for example, IEC Publication 431 for standard inductance measuring coils for RM-cores). 3.1.5 For cores consisting of more than one part, the clamping force in accordance with Clause 4 of IEC Publication 367-1 shall be stated on the understanding that, when the manufacturer specifies a deviating clamping force, the latter shall be used. If required, details of the application of the force shall be given (see, for example, Appendix 1 to IEC Publication 367-2). 3.1.6 The number of specimens of each inductance factor in the sample shall be approximately proportional to the numbers in the inspection lot and no value shall be systematically excluded from testing. 3.2 Inspection for qualification approval 3.2.1 When it is desired to obtain qualification approval by adopting the fixed sample size procedure (see Clause 8 of IEC Publication 723-1) use shall be made of the test schedule given in Sub-clause 3.3 of this specification. The details of the tests are as specified in the quality conformance test schedule (see Sub-clause 3.4). When the blank detail specification contains tests not included in the fixed sample schedule of Sub-clause 3.3, these shall be added either in the appropriate group or in one or more additional groups, and the total number of specimens (Group 0) shall be adjusted accordingly. 3.2.2 When the detail specification covers more than one inductance factor, the sample for qualification approval shall include approximately equal quantities of the highest value, the lowest value and a value near the middle of the range for which approval is sought. As a general guide, the sample for each group (1, 2, etc.) for qualification approval shall be equivalent to the corresponding group of the quality conformance test schedule and shall allow acceptance when one defective occurs in the sample. The sample size for group 0 shall be the sum of the sample sizes of the other groups plus two specimens to replace one possible defective in group 0 and one due to mishandling. There is at present no agreed procedure for the qualification approval of cores including an adjusting device. 3.3 Fixed sample size qualification approval test schedule The following sample size shall be used for carrying out qualification approval tests. For test conditions and other details see Sub-clause 3.4 of this specification and Table I of the appropriate blank detail specification (as in IEC Publication 723-2-1: Inductor and Transformer Cores for Telecommunications, Part 2: Blank Detail Specification: Magnetic Oxide Cores for Inductor Applications. Assessment Level A). 1) Cores without adjusting device 2) Cores with adjusting device There is at present no agreed schedule for these components. 3.4 Quality conformance inspection The following characteristics shall be included as a minimum in all blank detail specifications and for all assessment levels: 3.4.1 Physical a) Visual examination. b) Marking. c) Dimensions (primary and secondary). NOTEPrimary dimensions are the dimensions controlled by the gauge(s) defined in the appropriate IEC publication, for example, for pot-cores: IEC Publication 133. Secondary dimensions are all those dimensions shown in the appropriate IEC publication but not controlled by the gauge(s). Group 0: 41 specimens (1 defective allowed) 12.1Visual examination 12.2Marking 12.3Primary dimensions 13.3Inductance factor 13.7Residual and eddy current loss Group 1: 13 specimens (1 defective allowed) 12.4Secondary dimensions 13.8Hysteresis loss 14.1Compressive strength Group 2: 13 specimens (1 defective allowed) 13.5Variation of permeability with temperature Group 3: 13 specimens (1 defective allowed) 13.4Disaccommodation 14.2.1 Expulsion force (when applicable) Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 02:08:43 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9925-01.0:1984 © BSI 01-20003 3.4.2 Electrical a) Inductance factor (in nanohenrys nH) with tolerance (as a percentage). b) Losses at low flux density: Residual plus eddy current loss at one or more frequencies depending upon the extent of the frequency range of the application. This may be given in terms of: for ungapped sets: loss factor for gapped sets: tangent of loss angle tan ¸r+F or, where correction for coil loss would result in unacceptable error, quality factor Qr+F Hysteresis loss at one frequency. This may be given in terms of: for ungapped sets: hysteresis material constant ½B for gapped and ungapped sets: tangent of loss angle tan ¸h c) Variation of permeability with temperature. This may be given in terms of: for gapped and ungapped sets: temperature factor aF for gapped sets: temperature coefficient aL d) Disaccommodation factor DF. NOTEIt is preferable for this measurement to be made on ungapped sets or on single cores. 3.4.3 Mechanical a) Compressive strength. b) Expulsion force (when applicable, see Sub-clause 3.1.3). Section 4. Additional information Additional information, for example on application, in the form of curves, graphs, typical values, etc., may be included or separately given by the manufacturers. This is supplied for information only and shall not be used for inspection purposes. Section 5. Blank detail specification The following information and requirements shall be included in each detail specification, together with the required values: 5.1 Identification of the