BS-EN-120006-1993.pdf

BRITISH STANDARD BS EN 120006:1993 Incorporating Amendment No. 1 Specification for Harfmonized system of quality assessment for electronic components Blank detail specification Pin-photodiodes for fibre optic applications The European Standard EN 120006:1992 has the status of a British Standard Licensed Copy: sheffieldun sheffieldun, na, Sat Oct 28 15:43:58 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS EN 120006:1993 © BSI 09-1999 ISBN 0 580 35544 6 Amendments issued since publication Amd. No.Date of issueComments 8005October 1993Indicated by a sideline in the margin Licensed Copy: sheffieldun sheffieldun, na, Sat Oct 28 15:43:58 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS EN 120006:1993 © BSI 09-1999i Contents Page National forewordii Foreword2 Text of EN 1200061 Licensed Copy: sheffieldun sheffieldun, na, Sat Oct 28 15:43:58 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS EN 120006:1993 ii © BSI 09-1999 National Foreword This British Standard has been prepared under the direction of the Electronic Components Standards Committee. It is identical with CENELEC Electronic Components Committee (CECC) 20006:1986 “Harmonized system of quality assessment for electronic components Blank detail specification: Pin-photodiodes for fibre optic applications”. This standard is a harmonized specification within the CECC system. In 1992 the CENELEC Electronics Components Committee (CECC) accepted CECC 20006:1986 as European Standard EN 120006:1992. Terminology and conventions. The text of the CECC specification has been approved as suitable for publication as a British Standard without deviation. Some terminology and certain conventions are not identical with those used in British Standards; attention is drawn especially to the following. The comma has been used as a decimal marker. In British Standards it is current practice to use a full point on the baseline as the decimal marker. Cross-references. The British Standard which implements CECC 00100 is BS 9000: “General requirements for a system for electronic components of assessed quality” Part 2:1983 “Specification for national implementation of CECC basic rules and rules of procedure”. The Technical Committee has reviewed the provisions of IEC 191-2, to which reference is made in the text, and decided that they are acceptable for use in conjunction with this standard. IEC 191-2 is related to BS 3934:1965 “Specification for dimensions of semiconductor devices and integrated electronic circuits”. Scope. This standard lists the ratings, characteristics and inspection requirements which shall be included as mandatory requirements in accordance with BS CECC 20000 in any detail specification for these devices. Detail specification layout. The front page layout of detail specifications released to BS CECC family or blank detail specifications will be in accordance with BS 9000 Circular Letter No. 15. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. International Standard1)Corresponding British Standard CECC 20000BS CECC 20000:1983 Harmonized system of quality assessment for electronic components: Generic specification: Semiconductor optoelectronic and liquid crystal devices (Identical) CECC 00200PD 9002:1987 BS 9000, BS CECC and IECQ qualified products list (Technically equivalent for UK approvals only) 1) Undated in text. Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, the EN title page, page 2, the CECC title page, page ii, pages 1 to 8, and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover. Licensed Copy: sheffieldun sheffieldun, na, Sat Oct 28 15:43:58 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EUROPEAN STANDARD NORME EUROPÉENNE EUROPÄISCHE NORM EN 120006 July 1992 UDC:Supersedes CECC 20006 Issue 1:1986 Descriptors: Quality, electronic components, photodiodes English version Blank Detail Specification: PIN-photodiodes for fibre optic applications Spécification Particulière Cadre: Photodiodes PIN pour fibres optiques Vordruck für Bauartspezifikation: PIN-Photodioden für faseroptische Anwendungen (LWL) This European Standard was approved by the CENELEC Electronic Components Committee (CECC) on 27 January 1992. CENELEC members are bound to comply with CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the General Secretariat of the CECC or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CECC General Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland, and United Kingdom. The membership of the CECC is identical, with the exception of the national electrotechnical committees of Greece, Iceland and Luxembourg. CECC European Committee for Electrotechnical Standardization Comité Européen de Normalisation Electrotechnique Europäisches Komitee für Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B-1050 Brussels © 1992 Copyright reserved to CENELEC members Ref. No. EN 120006:1992 E Licensed Copy: sheffieldun sheffieldun, na, Sat Oct 28 15:43:58 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EN 120006:1992 © BSI 09-1999 2 Foreword The CENELEC Electronic Components Committee (CECC) is composed of those member countries of the European Committee for Electrotechnical Standardization (CENELEC) who wish to take part in a harmonized System for electronic components of assessed quality. The object of the System is to facilitate international trade by the harmonization of the specifications and quality assessment procedures for electronic components, and by the grant of an internationally recognized Mark, or Certificate, of Conformity. The components produced under the System are thereby acceptable in all member countries without further testing. This European Standard was prepared by CECC WG 20, “Opto-Electronic Components and Liquid Crystal Devices”. The text of the draft based on document CECC 20006 Issue 1:1986 was submitted to the formal vote for conversion to a European Standard; together with the voting report, circulated as document CECC(Secretariat)3008 the following documents were approved by CECC as EN 120006 on 27 January 1992: CECC 20006 Issue 1:1986 with Amendment 1 The following dates were fixed: Contents Page Foreword2 1Mechanical description1 2Short description1 3Level(s) of quality assessment1 4Limiting values (Absolute maximum rating system)1 5Electrical and optical characteristics See clause 8 of this specification for inspection requirements (Groups A and C)2 6Marking Information actually marked on the device and on the primary pack.2 7Ordering information2 8Test conditions and inspection requirements3 9Additional information7 Appendix Endurance test conditions8 latest date of announcement of the EN at national level(doa)1992-12-22 latest date of publication of an identical national standard(dop)1993-06-22 latest date of declaration of national standards obsolescence1993-06-22 latest date of withdrawal of conflicting national standards(dow)2002-12-22 Licensed Copy: sheffieldun sheffieldun, na, Sat Oct 28 15:43:58 GMT+00:00 2006, Uncontrolled Copy, (c) BSI Licensed Copy: sheffieldun sheffieldun, na, Sat Oct 28 15:43:58 GMT+00:00 2006, Uncontrolled Copy, (c) BSI ii blank Licensed Copy: sheffieldun sheffieldun, na, Sat Oct 28 15:43:58 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EN 120006:1992 © BSI 09-19991 PIN PHOTODIODES FOR FIBRE OPTIC APPLICATIONS Name (address) of responsible ONH (and possible of body from which specification is available) ePage ofCECC 20006 CECC detail specification number plus issue number and/or date f ELECTRONIC COMPONENT OF ASSESSED QUALITY IN ACCORDANCE WITH: CECC 20000, issue .and national references if different gNational number of detail specification. This box may not be used if national number includes CECC number h 1 Mechanical description kDetail specification for:i Either outline references (code A) or base and case references (codes B + C): from IEC 191-2: national if desired Type number(s) of relevant device(s) and, if appropriate structurally similar devices Ordering information: see clause 7 of this specification OUTLINE DRAWING AND CONNECTIONS (Terminal connected to case, if any) Characteristics of the optical port of the device, defined in relation with its mechanical axis. Information on input optical fibre (pigtail fibre) structure, fibre minimum bend radius, fibre maximum pull strength, and the end preparation of the optical fibre including connector (fibre type core diameter, numerical aperture and length of the input optical fibre). 2 Short description j PIN PHOTODIODE WITH/WITHOUT FIBRE PIGTAIL Semiconductor material: S1/InGaAs/. Encapsulation: metal/glass/plastic/. Fibre type, coating: (if appropriate) Some important quick reference data my be added may be transferred to, or given with more details, in clause 9 of this specification MARKING: letters and figures/colour code see 2.5 of CECC 20000 and/or clause 6 of this specification Polarity indication if special method is used. 3 Level(s) of quality assessment l if relevant 4 Limiting values (Absolute maximum rating system) These apply over the operating temperature range unless otherwise stated. X denotes that a value shall be inserted in the detail specification m Clause CECC 20006 Repeat only clause numbers used, with text. Additional values, if any, shall be given at the appropriate place without clause number(s). Curves should preferably be given in clause 9 of this specification Symbol Value min.max. Unit 4.1 4.2 4.3 4.4 4.5.1 or 4.5.2 Operating ambient temperatures Storage temperatures Soldering temperature Soldering time and minimum distance to case shall be given Recommended mounting conditions (temperature, duration.) may be given in clause 9.1 of this specification. Reverse voltage Admissible irradiance Admissible radiant flux into the fibre pigtail core Tamb Tstg Tsld VR Ee 8e X X X X X X X X °C °C °C V W/mm2 mW Information about manufacturers who have components qualified to this detail specification is available in the current CECC 00200: Qualified Products List. Licensed Copy: sheffieldun sheffieldun, na, Sat Oct 28 15:43:58 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EN 120006:1992 2 © BSI 09-1999 5 Electrical and optical characteristics See clause 8 of this specification for inspection requirements (Groups A and C) Signs between brackets correspond to characteristics given as “where appropriate” or as alternatives: Those characteristics marked “where appropriate” in this clause and in the inspection section shall either be omitted or, if specified, shall then be measured. For equivalent characteristics given as alternatives, the choice should preferably be left open to allow the use of the same detail specification by different manufacturers or countries. Repeat only clause numbers used, with text. Any additional characteristics to be given at appropriate place but without clause number. When several devices are defined in the same detail specification, the relevant values should be given on successive lines, where possible avoiding repetition of identical values. 6 Marking Information actually marked on the device and on the primary pack. Any particular information other than given in box k on front page and/or 2.5 of CECC 20000 shall be specified here. 7 Ordering information The following minimum information is necessary to order a specific device, unless otherwise specified: type number CECC reference of detail specification with issue number and/or date when relevant any other particular. Clause CECC 20006 MeasuredCharacteristics and conditions, at Tamb = 25 °C and VR specified unless otherwise stated SymbolValue min.max.Unit 5.1 5.2 5.3 5.4 5.5 5.6 A2b A2b C2b A2a C2a Responsivity at specified 2p, %2 (see note 4) Dark current at Ee or 8e = 0 (see note 4) Dark current at Tamb = Tamb max. and Ee or 8e = 0 (see note 4) Forward voltage at IF specified Capacitance at specified f and Ee or 8e = 0 (see note 4) In addition, a curve may also be given: see 9.2. Noise characteristic at specified 2p, %2 or spectral distribution and specified IR RL (if other than 50 7), f0 and %fN s IR(1) IR(2) VF Ctot X(X) X X X X A/W nA 4A V pF 5.6.1 or 5.6.2 C2a C2a Noise equivalent power Noise current where appropriateNEP IN X X pW/Hz; pA/Hz; either: 5.7.1 and 5.7.2 or 5.7.3 5.8 5.9 C2a C2a C2a Rise time at specified IR(H) or IR(E), VR, RL, tw, $, 2p and %2 of the source radiation Fall time (same conditions as for 5.7.1) Cut-off frequency at specified RL, 2p, %2 and Ee or 8e (see note 4) In addition, a curve for the frequency response of the device may be given. Directional characteristic at specified Ee or 8e (see note 4) see 9.3 Relative responsivity versus wavelength at specified Ee or 8e (see note 4) see 9.4 tr tf fcX X X ns ns MHz Licensed Copy: sheffieldun sheffieldun, na, Sat Oct 28 15:43:58 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EN 120006:1992 © BSI 09-19993 8 Test conditions and inspection requirements These are given in the following tables, where the values and exact test conditions to be used should be specified as required for a given type, and as required by the relevant test in CECC 20000. X shows that a value is to be inserted in the detail specification. When several devices are included in the same detail specification, the relevant conditions and/or values should be given on successive lines, where possible avoiding repetition of identical conditions and/or values. The choice between alternative tests should preferably be left open, unless very sound technical reasons forbid this. Although such tests are not strictly equivalent, they are meant to achieve the same results which are to assess the correct manufacture of a device. Alternatives are provided to take into account different equipments or methods of measurement used in various countries. In this section, references to clause numbers are made with respect to CECC 20000, unless otherwise stated. Group A Lot by lot All tests are non destructive (3.5.6) Examination or test (Ref. 4.3.4/.) Conditions at