BS-EN-ISO-12085-1998.pdf

BRITISH STANDARD BS EN ISO 12085:1998 Incorporating Amendment No. 1 to BS ISO 12085:1996 (renumbers BS as BS EN ISO 12085:1998) Geometric Product Specification (GPS) Surface texture: Profile method Motif parameters The European Standard EN ISO 12085:1997 has the status of a British Standard ICS 17.040.20 Licensed Copy: sheffieldun sheffieldun, na, Sat Nov 18 04:18:33 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS EN ISO 12085:1998 This British Standard, having been prepared under the direction of the Engineering Sector Board, was published under the authority of the Standards Board and comes into effect on 15 March 1997 © BSI 05-1999 The following BSI references relate to the work on this standard: Committee reference MTE/27 Draft for comment 93/706988 DC ISBN 0 580 27037 8 Committees responsible for this British Standard The preparation of this British Standard was entrusted to Technical Committee MTE/27, Properties and metrology of surfaces, upon which the following bodies were represented: The Association for the Instrumentation, Control and Automation Industry in the UK (GAMBICA) The Gauge and Toolmakers Association (GTMA) Loughborough University National Physical Laboratory (NPL) Society of British Aerospace Companies (SBAC) Society of Motor Manufacturers and Traders (SMMT) University of Birmingham University of Warwick Co-opted members Amendments issued since publication Amd. No.DateComments 9951May 1998Indicated by a sideline in the margin Licensed Copy: sheffieldun sheffieldun, na, Sat Nov 18 04:18:33 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS EN ISO 12085:1998 © BSI 05-1999i Contents Page Committees responsibleInside front cover National forewordii Foreword2 Forewordiii Text of ISO 120851 Licensed Copy: sheffieldun sheffieldun, na, Sat Nov 18 04:18:33 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS EN ISO 12085:1998 ii © BSI 05-1999 National foreword This British Standard reproduces verbatim EN ISO 12085:1997 and implements it as the UK national standard. This British Standard is published under the direction of the Engineering Sector Board whose Technical Committee MTE/27 has the responsibility to: aid enquirers to understand the text; present to the responsible international committee any enquiries on interpretation, or proposals for change, and keep UK interests informed; monitor related international and European developments and promulgate them in the UK. NOTEInternational and European Standards, as well as overseas standards, are available from Customer Services, BSI, 389 Chiswick High Road, London W4 4AL. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, the EN ISO title page, page 2, the ISO title page, pages ii to iv, pages 1 to 15 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover. Licensed Copy: sheffieldun sheffieldun, na, Sat Nov 18 04:18:33 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EUROPEAN STANDARD NORME EUROPÉENNE EUROPÄISCHE NORM EN ISO 12085 December 1997 ICS 17.040.20 Descriptors: See ISO document English version Geometrical product specification (GPS) Surface texture: Profile method Motif parameters (ISO 12085:1996) Spécification géométrique des produits (GPS) Etat de surface: Méthode du profil Paramètres liés aux motifs (ISO 12085:1996) Geometrische Produktspezifikationen (GPS) Oberflächenbeschaffenheit: Tastschnittverfahren Motifkenngrößen (ISO 12085:1996) This European Standard was approved by CEN on 2 November 1997. CEN members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CEN member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CEN member into its own language and notified to the Central Secretariat has the same status as the official versions. CEN members are the national standards bodies of Austria, Belgium, Czech Republic, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and United Kingdom. CEN European Committee for Standardization Comité Européen de Normalisation Europäisches Komitee für Normung Central Secretariat: rue de Stassart 36, B-1050 Brussels © 1997 CEN All rights of exploitation in any form any by any means reserved worldwide for CEN national Members. Ref. No. EN ISO 12085:1997 E Licensed Copy: sheffieldun sheffieldun, na, Sat Nov 18 04:18:33 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EN ISO 12085:1997 © BSI 05-1999 2 Foreword The text of the International Standard from Technical Committee ISO/TC 57 “Metrology and properties of surfaces” of the International Organization for Standardization (ISO) has been taken over as a European Standard by Technical Committee CEN/TC 290 “Dimensional and geometrical product specification and verification”, the secretariat of which is held by DIN. This European Standard shall be given the status of a national standard, either by publication of an identical text or by endorsement, at the latest by June 1998, and conflicting national standards shall be withdrawn at the latest by June 1998. According to the CEN/CENELEC Internal Regulations, the national standards organizations of the following countries are bound to implement this European Standard: Austria, Belgium, Czech Republic, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and the United Kingdom. Endorsement notice The text of the International Standard ISO 12085:1996 has been approved by CEN as a European Standard without any modification. Licensed Copy: sheffieldun sheffieldun, na, Sat Nov 18 04:18:33 GMT+00:00 2006, Uncontrolled Copy, (c) BSI Licensed Copy: sheffieldun sheffieldun, na, Sat Nov 18 04:18:33 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS EN ISO 12085:1998 ii © BSI 05-1999 Contents Page Forewordiii Introduction1 1Scope1 2Normative references1 3Definitions1 3.1General definitions1 3.2Parameter definitions4 4Theoretically exact operator of the motif method5 4.1General5 4.2Conventional limits of motifs5 4.3Depth discrimination5 4.4Identification of roughness and waviness motifs through the combination of motifs7 4.5Procedure for parameter calculation9 5Measuring conditions of parameters11 5.1Convention concerning traversing the primary profile11 5.2Recommended measurement conditions11 5.3Profile quantization step11 5.4Rule for acceptance11 5.5Use of motifs method for analysis of multiprocess surfaces11 5.6Indications on the drawings11 Annex A (normative) Calculation method for combination of motifs12 Annex B (informative) Relation between motif parameters and function of surfaces14 Annex C (informative) Relation to the GPS matrix model14 Annex D (informative) Bibliography15 Figure 1 Local peak of profile2 Figure 2 Local valley of profile2 Figure 3 Roughness motif3 Figure 4 Upper envelope line3 Figure 5 Waviness motif3 Figure 6 Roughness parameters4 Figure 7 Waviness parameters5 Figure 8 Conventional limits of motifs6 Figure 9 Depth discrimination6 Figure 10 Discrimination based on maximum depth7 Figure 11 Combination of motifs8 Figure 12 Illustration of procedure for parameter calculation10 Figure A.1 Combination of motifs13 Figure C.115 Table 111 Table B.114 Licensed Copy: sheffieldun sheffieldun, na, Sat Nov 18 04:18:33 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS EN ISO 12085:1998 © BSI 05-1999iii Foreword ISO (the International Organization for Standardization) is a worldwide federation of national standards bodies (ISO member bodies). The work of preparing International Standards is normally carried out through ISO technical committees. Each member body interested in a subject for which a technical committee has been established has the right to be represented on that committee. International organizations, governmental and non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization. Draft International Standards adopted by the technical committees are circulated to the member bodies for voting. Publication as an International Standard requires approval by at least 75 % of the member bodies casting a vote. International Standard ISO 12085 was prepared jointly by Technical Committees ISO/TC 57, Metrology and properties of surfaces, Subcommittee SC 1, Geometrical parameters Instruments and procedures for measurement of surface roughness and waviness, ISO/TC 3, Limits and fits and ISO/TC 10, Technical drawings, product definition and related documentation, Subcommittee SC 5, Dimensioning and tolerancing. Annex A forms an integral part of this International Standard. Annex B, Annex C and Annex D are for information only. Licensed Copy: sheffieldun sheffieldun, na, Sat Nov 18 04:18:33 GMT+00:00 2006, Uncontrolled Copy, (c) BSI iv blank Licensed Copy: sheffieldun sheffieldun, na, Sat Nov 18 04:18:33 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS EN ISO 12085:1998 © BSI 05-19991 Introduction This International Standard is a Geometrical Product Specification (GPS) standard and is to be regarded as a General GPS standard (see ISO/TR 14638). It influences links 2, 3 and 4 of the surface texture chain of standards on roughness profile and waviness profile. For more detailed information of the relation of this International Standard to other GPS standards, see Annex C. The approach described in this International Standard facilitates the determining roughness and waviness parameters from the primary profile by finding those motifs which characterize the surface under consideration. This method is independent of any profile filter and results in parameters which are based on the depth and spacing of the motifs. These parameters, which are complementary to those defined in ISO 4287, can be used to describe the functional properties of workpieces as indicated in Annex B. 1 Scope This International Standard defines terms and parameters used for determining surface texture by the motif method. It also describes the corresponding ideal operator and measuring conditions. 2 Normative references The following standards contain provisions which, through reference in this text, constitute provisions of this International Standard. At the time of publication, the editions indicated were valid. All standards are subject to revision, and parties to agreements based on this International Standard are encouraged to investigate the possibility of applying the most recent editions of the standards indicated below. Members of IEC and ISO maintain registers of currently valid International Standards. ISO 1302:1992, Technical drawings Method of indicating surface texture. ISO 3274:1996, Geometrical Product Specifications (GPS) Surface texture: Profile method Nominal characteristics of contact (stylus) instruments. ISO 4287:1996, Geometrical Product Specifications (GPS) Surface texture: Profile method Terms, definitions and parameters of surface texture. ISO 4288:1996, Geometrical Product Specifications (GPS) Surface texture: Profile method Rules and procedures for the assessment of surface texture. 3 Definitions For the purposes of this International Standard the following definitions apply. 3.1 General definitions 3.1.1 surface profile (see ISO 4287.) 3.1.2 primary profile (see ISO 3274.) 3.1.3 local peak of profile a part of a profile between two adjacent minima of the profile (see Figure 1) 3.1.4 local valley of profile a part of a profile between two adjacent maxima of the profile (see Figure 2) Licensed Copy: sheffieldun sheffieldun, na, Sat Nov 18 04:18:33 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS EN ISO 12085:1998 2 © BSI 05-1999 3.1.5 motif a portion of the primary profile between the highest points of two local peaks of the profile, which are not necessarily adjacent a motif is characterized by (see Figure 3 and Figure 5): its length, ARi or AWi, measured parallel to the general direction of the profile; its two depths, Hj and Hj + 1, or Hwj and Hwj + 1, measured perpendicular to the general direction of the primary profile; its T characteristic, that is the smallest depth between the two depths. 3.1.6 roughness motif motif derived by using the ideal operator with limit value A (see Figure 3) NOTE 1By this definition, a roughness motif has a length ARi smaller than or equal to A. 3.1.7 upper envelope line of the primary profile (waviness profile) straight lines joining the highest points of peaks of the primary profile, after conventional discrimination of peaks (see Figure 4) 3.1.8 waviness motif motif derived on the upper envelope line by using the ideal operator with limit value B (see Figure 5) Figure 1 Local peak of profile Figure 2 Local valley of profile Licensed Copy: sheffieldun sheffieldun, na, Sat Nov 18 04:18:33 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS EN ISO 12085:1998 © BSI 05-19993 Figure 3 Roughness motif Figure 4 Upper envelope line Figure 5 Waviness motif Licensed Copy: sheffieldun sheffieldun, na, Sat Nov 18 04:18:33 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS EN ISO 12085:1998 4 © BSI 05-1999 3.2 Parameter definitions 3.2.1 mean spacing of roughness motifs, AR the arithmetical mean value of the lengths ARi of roughness motifs, within the evaluation length (see Figure 6), i.e. where n is the number of roughness motifs (equal to the number of ARi values) 3.2.2 mean depth of roughness motifs, R the arithmetical mean value of the depths Hj of roughness motifs, within the evaluation length (see Figure 6), i.e. where m is the number of Hj values NOTE 2The number of Hj values is twice the number of ARi values (m = 2n). 3.2.3 maximum depth of profile irregularity, Rx the largest depth, Hj, within the evaluation length EXAMPLE on Figure 6: Rx = H3 3.2.4 mean spacing of waviness motifs, AW the arithmetical mean value of the lengths AWi of waviness motifs, within the evaluation length (see Figure 7), i.e. where n is the number of waviness motifs (equal to the number of AWi values) Figure 6 Roughness parameters Licensed Copy: sheffieldun sheffieldun, na, Sat Nov 18 04:18:33 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS EN ISO 12085:1998 ©