IEEE-1241-2000.pdf

IEEE Std 1241-2000 IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters Sponsor Waveform Measurement and Analysis Technical Committee of the IEEE Instrumentation and Measurement Society Approved 7 December 2000 IEEE-SA Standards Board Abstract: IEEE Std 1241-2000 identifies analog-to-digital converter (ADC) error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset errors. This standard also presents terminology and definitions to aid the user in defining and testing ADCs. Keywords: ADC, A/D converter, analog-to-digital converter, digitizer, terminology, test methods The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright ? 2001 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 13 June 2001. Printed in the United States of America. Print: ISBN 0-7381-2724-8SH 94902 PDF: ISBN 0-7381-2725-6SS 94902 No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publisher. of the IEEE Standards documents are developed within the IEEE Societies and the Standards Coordinating Committees of the IEEE Standards Association (IEEE-SA) Standards Board. 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To arrange for payment of licensing fee, please contact Copyright Clearance Center, Customer Service, 222 Rosewood Drive, Danvers, MA 01923 USA; (978) 750-8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Introduction (This introduction is not a part of IEEE Std 1241-2000, IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters.) This standard defi nes the terms, defi nitions, and test methods used to specify, characterize, and test analog-to-digital converters (ADCs). It is intended for the following: Individuals and organizations who specify ADCs to be purchased Individuals and organizations who purchase ADCs to be applied in their products Individuals and organizations whose responsibility is to characterize and write reports on ADCs available for use in specifi c applications Suppliers interested in providing high-quality and high-performance ADCs to acquirers This standard is designed to help organizations and individuals Incorporate quality considerations during the defi nition, evaluation, selection, and acceptance of supplier ADCs for operational use in their equipment DeterminehowsupplierADCsshouldbeevaluated,tested,andacceptedfordeliverytoendusers This standard is intended to satisfy the following objectives: Promote consistency within organizations in acquiring third-party ADCs from component suppliers Provide useful practices on including quality considerations during acquisition planning Provide useful practices on evaluating and qualifying supplier capabilities to meet user requirements Provide useful practices on evaluating and qualifying supplier ADCs Assist individuals and organizations judging the quality and suitability of supplier ADCs for referral to end users Several standards have previously been written that address the testing of analog-to-digital converters either directly or indirectly. These include IEEE Std 1057-1994a, which describes the testing of waveform recorders. This standard has been used as a guide for many of the techniques described in this standard. IEEE Std 746-1984 B16b, which addresses the testing of analog-to-digital and digital-to- analog converters used for PCM television video signal processing. JESD99-1 B21, which deals with the terms and defi nitions used to describe analog-to-digital and digital-to-analog converters. This standard does not include test methods. IEEE Std 1241-2000 for analog-to-digital converters is intended to focus specifi cally on terms and defi nitions as well as test methods for ADCs for a wide range of applications. Copyright ? 2001 IEEE. All rights reserved.iii aInformation on references can be found in Clause 2. bThe numbers in brackets correspond to those in the bibliography in Annex C. As of October 2000, the working group had the following membership: Steve Tilden, Chair Philip Green, Secretary hence, the procedure should be tailored for each unique characterization plan. 1.4 Manufacturer-supplied information 1.4.1 General information Manufacturers shall supply the following general information: a)Model number b)Physical characteristics: dimensions, packaging, pinouts c)Power requirements d) Environmental conditions: Safe operating, non-operating, and specifi ed performance tempera- ture range; altitude limitations; humidity limits, operating and storage; vibration tolerance; and compliance with applicable electromagnetic interference specifi cations e)Any special or peculiar characteristics f) Compliance with other specifi cations g)Calibration interval, if required by ISO 10012-2:1997 B19 h)Control signal characteristics i)Output signal characteristics j)Pipeline delay (if any) k)Exceptions to the above parameters where applicable 1.4.2 Minimum specifications The manufacturer shall provide the following specifi cations (see Clause 3 for defi nitions): a)Number of digitized bits b)Range of allowable sample rates c)Analog bandwidth d)Input signal full-scale range with nominal reference signal levels e)Input impedance f)Reference signal levels to be applied g)Supply voltages h)Supply currents (max, typ) i)Power dissipation (max, typ) 1.4.3 Additional specifications a)Gain error b) Off set error c) Diff erential nonlinearity d)Harmonic distortion and spurious response e)Integral nonlinearity f)Maximum static error g)Signal-to-noise ratio h) Eff ective bits i)Random noise j)Frequency response Copyright ? 2001 IEEE. All rights reserved.5 IEEE FOR ANALOG-TO-DIGITAL CONVERTERSStd 1241-2000 IEEE FOR ANALOG-TO-DIGITAL CONVERTERSStd 1241-2000 IEEE FOR ANALOG-TO-DIGITAL CONVERTERSStd 1241-2000 k)Settling time l)Transition duration of step response (rise time) m) Slew rate limit n)Overshoot and precursors o)Aperture uncertainty (short-term time-base instability) p)Crosstalk q)Monotonicity r)Hysteresis s)Out-of-range recovery t)Word error rate u)Common-mode rejection ratio v)Maximum common-mode signal level w) Diff erential input impedance x)Intermodulation distortion y)Noise power ratio z) Diff erential gain and phase 1.4.4 Critical ADC parameters Table 1 is presented as a guide for many of the most common ADC applications. The wide range of ADC applications makes a comprehensive listing impossible. This table is intended to be a helpful starting point for users to apply this standard to their particular applications. 6Copyright ? 2001 IEEE. All rights reserved. Table 1Critical ADC parameters Typical applicationsCritical ADC parametersPerformance issues AudioSINAD, THDPower consumption. Crosstalk and gain matching. Automatic controlMonotonicity Short-term settling, long-term stability Transfer function. Crosstalk and gain matching. Temperature stability. Digital oscilloscope/waveform recorder SINAD, ENOB Bandwidth Out-of-range recovery Word error rate SINAD for wide bandwidth amplitude resolution. Low thermal noise for repeatability. Bit error rate. GeophysicalTHD, SINAD, long-term stabilityMillihertz response. Image processingDNL, INL, SINAD, ENOB Out-of-range recovery Full-scale step response DNL for sharp-edge detection. High-resolution at switching rate. Recovery for blooming. Radar and sonarSINAD, IMD, ENOB SFDR Out-of-range recovery SINAD and IMD for clutter cancellation and Doppler processing. Spectrum analysisSINAD, ENOB SFDR SINAD and SFDR for high linear dynamic range measurements. Spread spectrum communication SINAD, IMD, ENOB SFDR, NPR Noise-to-distortion ratio IMD for quantization of small signals in a strong interference environment. SFDR for spatial fi ltering. NPR for interchannel crosstalk. Telecommunication personal communications SINAD, NPR, SFDR, IMD Bit error rate Word error rate Wide input bandwidth channel bank. Interchannel crosstalk. Compression. Power consumption. IEEE Std 1241-2000IEEE STANDARD FOR TERMINOLOGY AND TEST METHODS IEEE Std 1241-2000IEEE STANDARD FOR TERMINOLOGY AND TEST METHODS IEEE Std 1241-2000IEEE STANDARD FOR TERMINOLOGY AND TEST METHODS 2. References This standard shall be used in conjunction with the following publications. When the following specifi cations are superseded by an approved revision, the revision shall apply. IEC 60469-2 (1987-12), Pulse measurement and analysis, general considerations.1 IEEE Std 1057-1994, IEEE Standard for Digitizing Waveform Recorders.2 3. Definitions and symbols For the purposes of this standard, the following terms and defi nitions apply. The Authoritative Dictionary of IEEE Standards Terms B15 should be referenced for terms not defi ned in this clause. 3.1 Definitions 3.1.1 AC-coupled analog-to-digital converter: An analog-to-digital converter utilizing a network which passes only the varying ac portion, not the static dc portion, of the analog input signal to the quantizer. 3.1.2 alternation band: The range of input levels which causes the converter output to alternate between two adjacent codes. A property of some analog-to-digital converters, it is the complement of the hysteresis property. 3.1.3 analog-to-digital converter (ADC): A device that converts a continuous time signal into a discrete-time discrete-amplitude signal. 3.1.4 aperture delay: The delay from a threshold crossing of the analog-to-digital converter clock which causes a sample of the analog input to be taken to the center of the aperture for that sample. Copyright ? 2001 IEEE. All rights reserved.7 COMINT ¼ communications intelligence DNL ¼ diff erential nonlinearity ENOB ¼ eff ective number of bits ELINT ¼ electronic intelligence NPR ¼ noise power ratio INL ¼ integral nonlinearity DG ¼ diff erential gain error SIGINT ¼ signal