IEEE-1122-1998-R2007.pdf

The Institute of Electrical and Electronics Engineers, Inc. 345 East 47th Street, New York, NY 10017-2394, USA Copyright © 1998 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 1998. Printed in the United States of America. ISBN 0-7381-0197-4 No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publisher. IEEE Std 1122-1998 (R2007) (Revision of IEEE Std 1122-1987) IEEE Standard for Digital Recorders for Measurements in High-Voltage Impulse Tests Sponsor Power Systems Instrumentation and Measurement Committee of the IEEE Power Engineering Society Reaffirmed 26 September 2007 Approved 19 March 1998 IEEE-SA Standards Board Abstract: This standard defines the terms specifically related to the digital recorders used for monitoring high-voltage and high-current impulse tests, specifies the necessary performance characteristics for such digital recorders to ensure their compliance with the requirements for high- voltage and high-current impulse tests, and describes the tests and procedures that are necessary to show that these performance characteristics are within the specified limits. Keywords: digital oscilloscope, digital recorder, digitizer, high-impulse current, high-impulse volt- age, impulse tests Copyright The Institute of Electrical and Electronics Engineers, Inc. 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The IEEE shall not be responsible for identifying patents for which a license may be required by an IEEE standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 07/30/2008 05:05:37 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright © 1998 IEEE. All rights reserved. iii Introduction (This introduction is not part of IEEE Std 1122-1998, IEEE Standard for Digital Recorders for Measurements in High- Voltage Impulse Tests.) The fi rst edition of this standard was published in 1987. The International Electrotechnical Commission (IEC) published an equivalent standard in 1991, IEC 1083-1, Digital recorders for measurements in high- voltage impulse testsPart 1: Requirements for digital recorders. From the outset there has been close liaison between the two working groups and it was agreed that each working group would try to provide its parent organization with documents that were substantially and technically the same. Liaison has been maintained with Technical Committee 10 (TC 10) of the IEEE Instrumentation and Measurement Society, Waveform Measurement and Analysis. This edition of the standard incorporates comments and the responses to questions that have been received by the working group since 1987. This standard states the performance requirements for an impulse digitizer and the tests necessary to verify that these performance requirements have been met. When an impulse digitizer is used and maintained in accordance with this standard it will meet the accuracy requirements specifi ed in IEEE Std 4-1995. This standard was developed by the P1122 Working Group of the Digital Techniques in Electrical Measure- ments Subcommittee of the Power Systems Instrumentation and Measurement Committee of the IEEE Power Engineering Society. The P1122 Working Group had the following members: T. R. McComb, Chair This standard was sponsored by the Power Systems Instrumentation and Measurement Committee, which also served as the balloting committee that approved this document for submission to the IEEE Standards Board. The following persons were voting members of the balloting committee: J. Kuffel, Chair S. M. Benda-Berlijn J. Csomay K. Feser G. J. Fitzpatrick E. Gockenbach S. Grzybowski E. Hanique J. Kuffel W. Larzelere A. Lux R. Malewski J. McBride A. Molden G. Rizzi G. Schneider K. Schon Y. Zhang J. M. Belanger J. A. Braun J. M. Carr L. Coffeen S. W. Crampton V. DaGrosa G. J. Fitzpatrick E. Hanique R. E. Hebner R. Hopkins H. Kirkham J. A. Kise S. R. Knudsen W. Larzelere D. W. Lenk D. McAuliff J. McBride T. R. McComb H. M. Millican J. H. Moran O. Petersons R. Reid P. H. Reynolds R. L. Richardson H. M. Schneider J. C. Smith E. So G. E. Stemler D. Train R. S. Turgel C. F. Von Herrmann B. H. Ward Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 07/30/2008 05:05:37 MDTNo reproduction or networking permitted without license from IHS -,-,- iv Copyright © 1998 IEEE. All rights reserved. When the IEEE-SA Standards Board approved this standard on 19 March 1998, it had the following membership: Richard J. Holleman, Chair Donald N. Heirman, Vice Chair Judith Gorman, Secretary *Member Emeritus Valerie E. Zelenty IEEE Standards Project Editor Satish K. Aggarwal Clyde R. Camp James T. Carlo Gary R. Engmann Harold E. Epstein Jay Forster* Thomas F. Garrity Ruben D. Garzon James H. Gurney Jim D. Isaak Lowell G. Johnson Robert Kennelly E. G. “Al” Kiener Joseph L. Koepfi nger* Stephen R. Lambert Jim Logothetis Donald C. Loughry L. Bruce McClung Louis-François Pau Ronald C. Petersen Gerald H. Peterson John B. Posey Gary S. Robinson Hans E. Weinrich Donald W. Zipse Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 07/30/2008 05:05:37 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright © 1998 IEEE. All rights reserved. v Contents 1.Scope 1 2.References 1 3.Definitions 2 4.Conditions of use. 6 4.1 Range of operating conditions. 6 4.2 Reference conditions 6 5.Analysis of the impulse waveform 6 5.1 General. 6 5.2 Equivalent oscillogram method. 6 5.3 Procedures for reading digital records. 7 6.Accuracy requirements for impulse measurements. 8 6.1 Limits on overall uncertainty. 8 6.2 Limits on individual uncertainties . 8 6.3 Input impedance. 11 7.Acceptance tests. 11 7.1 Differential nonlinearity (impulse conditions). 11 7.2 Internal noise level. 11 7.3 Rise time 11 7.4 Interference test 11 7.5 Ripple. 12 7.6 Integral nonlinearity. 12 8.Performance tests. 12 8.1 Pulse calibration. 12 8.2 Alternative method. 13 9.Performance checks. 14 9.1 General. 14 9.2 Pulse calibration. 15 9.3 Alternative check. 15 10.Record of performance 15 Annex A(informative) Bibliography 16 Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 07/30/2008 05:05:37 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright © 1998 IEEE. All rights reserved. 1 IEEE Standard for Digital Recorders for Measurements in High-Voltage Impulse Tests 1. Scope This standard is applicable to digital recorders and digital oscilloscopes used for measurements during tests with high-impulse voltages and high-impulse currents. It covers the measuring characteristics and calibra- tions required to meet the measuring accuracy specifi ed in IEEE Std 4-1995 and IEEE Std C57.98-1993 B10. 1 The characteristics of general-purpose digital recorders are covered in IEEE Std 1057-1994 B9. General methods of pulse measurement are covered in IEC 60469-1 (1987-12) B4 and IEC 60469-2 (1987-12) B5. This standard a) Defi nes the terms specifi cally related to the digital recorders used for monitoring high-voltage and high-current impulse tests; b) Specifi es the necessary performance characteristics for such digital recorders to ensure their compli- ance with the requirements for high-voltage and high-current impulse tests; c)Describes the tests and procedures that are necessary to show that these performance characteristics are within the specifi ed limits. 2. References This standard shall be used in conjunction with the following publication: IEEE Std 4-1995, IEEE Standard Techniques for High-Voltage Testing. 2 1 The numbers in brackets correspond to those of the bibliography in Annex A. 2 IEEE publications are available from the Institute of Electrical and Electronics Engineers, 445 Hoes Lane, P.O. Box 1331, Piscataway, NJ 08855-1331, USA. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 07/30/2008 05:05:37 MDTNo reproduction or networking permitted without license from IHS -,-,- IEEE Std 1122-1998IEEE STANDARD FOR DIGITAL RECORDERS FOR 2 Copyright © 1998 IEEE. All rights reserved. 3. Defi nitions 3.1 actual resolution ( r a ): The logarithm to base 2 of the (maximum value used, , minus the value cor- responding to the baseline, )/(the standard deviation of the noise, times ). NOTEThe rated resolution is the maximum resolution that could be achieved when measuring an impulse whose peak-value is equal to the full-scale range and when there is no reduction in the effective resolution caused by non-ideal behavior of the digital recorder. Reductions in resolution caused by using less than full-scale defl ection can be quantifi ed (e.g., an 8-bit recorder has a rated resolution of 1 in 256). The resolution used to record an impulse is approximately 1 in (maximum value minus minimum value). For a (maximum minus minimum) value of 198 the number of bits is reduced to 7.63 (0.37 lost bits) while for a value of 98 the number of bits is equivalent to 6.61 (1.39 lost bits). The resolution is also reduced by noise and the total reduction in resolution gives an actual resolution which is the logarithm to base 2 of the (maximum value minus minimum value)/(the standard deviation of the noise times ); see equation 97 of IEEE Std 1057-1994 B9. 3.2 automatically processed data: The data available from the digitizer when some processing function cannot be avoided. 3.3 average code bin width (W o ): The product of the full-scale value and the rated resolution. NOTEThe average code bin width is equal to the static scale factor. 3.4 code bin width of code k (W k ): The range of input voltage allocated to code k (see Figure 1). Vmax Vbn12 ralog2 maxb n12× - = 12 Figure 1Quantization characteristic of an ideal 3-bit digitizer Code transition thresholds (T2 and T3), a code bin width (W3=Wo), nominal voltage (Pi) of each code and the straight line joining the mid-points of the code bins Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 07/30/2008 05:05:37 MDTNo reproduction or networking permitted without license from IHS -,-,- IEEE MEASUREMENTS IN HIGH-VOLTAGE IMPULSE TESTSStd 1122-1998 Copyright © 1998 IEEE. All rights reserved. 3 3.5 code k: An integer between 1 and 2 N (or between 0 and 2 N -1 ) where N is