IEEE-1450.3-2007.pdf
IEEE Std 1450.3-2007 IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Tester Target Specification IEEE 3 Park Avenue New York, NY 10016-5997, USA 7 September 2007 IEEE Computer Society Sponsored by the Test Technology Standards Committee 1450.3 TM Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 10/05/2007 04:42:47 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 10/05/2007 04:42:47 MDTNo reproduction or networking permitted without license from IHS -,-,- Recognized as an American National Standard (ANSI) IEEE 1450.3-2007 IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450TM-1999) for Tester Target Specification Sponsor Test Technology Standards Committee of the IEEE Computer Society Approved 24 August 2007 American National Standards Institute Approved 8 March 2007 IEEE SA-Standards Board Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 10/05/2007 04:42:47 MDTNo reproduction or networking permitted without license from IHS -,-,- The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright © 2007 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 7 September 2007. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 10/05/2007 04:42:47 MDTNo reproduction or networking permitted without license from IHS -,-,- ivCopyright © 2007 IEEE. All rights reserved. Introduction STIL is a collection of standards with the base standard being 1450 and the dotted extensions used to define additional syntax for addressing additional areas; i.e., this standard addresses tester rules. The extensions follow the same conventions as the base standard. The base and the extensions are developed so as to work together; i.e., STIL is a single language that is defined (and has been developed) as separate IEEE standards. Notice to users Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/ standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patents or patent applications for which a license may be required to implement an IEEE standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention. Participants The following is a list of participants in the STIL Working Group. Tony Taylor, Chair John V. Cosley David Dowding Oleg Erlich Yung D. Fan Dave Gallagher Bruce Kaufman Ken Mandl Gregory Maston Gary Murray Chris J. Nelson Ken Posse Paul J. Reuter Jose M. Santiago Doug Sprague Allen Yeats This introduction is not part of IEEE 1450.3-2007, Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450TM-1999) for Tester Target Specification. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 10/05/2007 04:42:47 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright © 2007 IEEE. All rights reservedv The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. When the IEEE-SA Standards Board approved this standard on 8 March 2007, it had the following membership: Steve M. Mills, Chair Robert M. Grow, Vice Chair Don Wright, Past Chair Judith Gorman, Secretary *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish K. Aggarwal, NRC Representative Richard DeBlasio, DOE Representative Alan H. Cookson, NIST Representative Michelle D. Turner IEEE Standards Program Manager, Document Development Michael D. Kipness IEEE Standards Program Manager, Technical Program Development Keith Chow Tommy P. Cooper John V. Cosley Sourav K. Dutta Yung D. Fan Randall C. Groves Kazumi Hatayama Werner Hoelzl Chi Tin Hon Dennis Horwitz Hirofumi Kamitokusari Mark J. Knight Susan K. Land Adam W. Ley G. L. Luri Gregory Maston Tom Micek Gary L. Michel Yinghua Min Chris J. Nelson Michael S. Newman Noriaki Okumiya Ulrich Pohl Paul J. Reuter Robert A. Robinson Jose M. Santiago Bartien Sayogo Roger J. Sowada Walter Struppler K. S. Subrahmanyam Tony Taylor Srinivasa R. Vemuru Thomas M. Wandeloski Gregg Wilder Oren Yuen Alex Gelman William R. Goldbach Arnold M. Greenspan Joanna N. Guenin Julian Forster* Kenneth S. Hanus William B. Hopf Richard H. Hulett Hermann Koch Joseph L. Koepfinger* John Kulick David J. Law Glenn Parsons Ronald C. Petersen Tom A. Prevost Narayanan Ramachandran Greg Ratta Robby Robson Anne-Marie Sahazizian Virginia C. Sulzberger Malcolm V. Thaden Richard L. Townsend Howard L. Wolfman Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 10/05/2007 04:42:47 MDTNo reproduction or networking permitted without license from IHS -,-,- viCopyright © 2007 IEEE. All rights reserved. Contents 1.Overview 1 1.1 Scope 2 1.2 Purpose. 2 1.3 TRC limitations 3 2.Normative references. 3 3.Definitions . 3 4.Structure of this standard. 4 4.1 Formats from STIL.0. 4 4.2 Additional formatting conventions 5 4.3 Dependencies on IEEE Std 1450.1 5 5.STIL syntax description. 6 5.1 Additional reserved words. 6 5.2 Keywords used in a TRC block. 6 6.Statement usage and organization by flow 7 6.1 TRC usage for ATE constraint specification. 8 6.2 TRC usage for design/pattern constraints 9 6.3 TRC usage for pattern reporting 9 6.4 TRC usage for tester targetting 10 7.STIL statement. 10 7.1 STIL syntax 11 7.2 STIL example 11 8.Variables block extensions 11 8.1 Variables block syntax. 11 8.2 Variables example 12 9.Resource statement 13 9.1 Resource statement syntax. 13 10.TRC: TestResourceConstraints block 14 10.1 TRC syntax 15 10.2 TRC example. 18 10.3 TRC block sharing rules 19 11.TRC: SignalAttributes . 19 11.1 TRC: SignalAttributessyntax. 19 11.2 TRC: SignalAttributesexamples 21 Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 10/05/2007 04:42:47 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright © 2007 IEEE. All rights reserved.vii 12.TRC: DCResourceAttributes. 22 12.1 TRC: DCResourceAttributessyntax. 22 12.2 TRC: DCResourceAttributesexample 24 13.TRC: PeriodAttributes. 25 13.1 TRC: PeriodAttributessyntax. 25 13.2 TRC: PeriodAttributesexamples 26 14.TRC: WaveformAttributes 26 14.1 TRC: WaveformAttributessyntax 27 14.2 TRC: WaveformAttributesexamples . 31 15.TRC: WaveformDescriptions 32 15.1 TRC - WaveformDescriptionssyntax. 32 15.2 TRC: WaveformDescriptionsexamples. 34 16.TRC: PatternAttributes 35 16.1 TRC: PatternAttributessyntax 35 16.2 TRC: PatternAttributesexamples. 38 17.TRC: NameChecks block 39 17.1 NameChecks blocksyntax 39 17.2 NameChecksexamples. 40 Annex A (informative) Glossary . 42 Annex B (informative) Fluid concepts in parameter specification 48 Annex C (informative) Tester channel map 50 Annex D (informative) Example of TRC for a simple tester model . 52 Annex E (informative) Example of TRC used to define waveforms and timing 54 Annex F (informative) Example of TRC used for resource reporting. 58 Annex G (informative) Example of tester targeting and tester loading. 61 Annex H (informative) Example of vector memory checking 66 Annex I (informative) Waveform generator model. 69 Annex J (informative) File encryption. 75 Annex K (informative) Regular expression reference. 76 Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 10/05/2007 04:42:47 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 10/05/2007 04:42:47 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright © 2007 IEEE. All rights reserved.1 IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450TM-1999) for Tester Target Specification 1. Overview The STIL environment supports transferring tester-independent test programs to a specific automated testing equipment (ATE) system. Although native STIL data are tester independent, the actual process of mapping the test program onto tester resources may be critical, and it is necessary to be able to completely and unambiguously specify how the STIL programs and patterns are mapped onto the tester resources. TRC (which stands for either tester resource constraints or tester rules checking, depending on the usage) is an extension to the STIL language to facilitate this operation. Figure 1 shows the usage model for tester targeting. The four ways that the TRC statements come into play in the flow of data from design to test are indicated by the circled numbers in the diagram. These four uses are defined as follows: a)Tester rules checking: As early as possible in the process of inserting “Design for Test” logic and generation of test patterns, the rules of the target tester are identified by means of the TRC file defining the target tester. b)Tester resource reporting: As part of the pattern generation process, a report of resources required for the pattern may be created in TRC format. This information is available for test planning purposes, such as 1) when a pattern is for an embedded core to be integrated into a chip or 2) for tester scheduling purposes. Each resource report is associated with a particular STIL file/stream. The resource report data may be a separate file (as implied in the above diagram) or may be included in the STIL pattern file. c)Tester resource targeting: The process of tester targeting is that of adding additional information into the STIL file/streams that specifies how the resources of a given tester are to be assigned. Note the bars on the left side of the diagram, which indicate that this targeting operation can be done in one of three places: 1) by the EDA software that generates the patterns, 2) by software created by the test user, or 3) by the ATE sofware that loads the STIL patterns. d)Tester resource loading: The tester loader is a process that maps the device-oriented STIL data to the resources of the tester. There may or may not be targeting information provided. If targeting information is not present, then the loader is expected to do the job of assigning resources. If targeting information is present, then it is to be used to direct the resource assignment. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 10/05/2007 04:42:47 MDTNo reproduction or networking permitted without license from IHS -,-,- IEEE Std 1450.3-2007IEEE STANDARD FOR EXTENSIONS TO STIL 2Copyright © 2007 IEEE. All rights reserved. Note that the semantics of the various TRC statements change, based on which flow is being addressed; i.e., in a constraint flow, the TRC statements provide a set of rules that are to be applied to a set of data and an error shall be generated if the test pattern data does not conform to the rules; in a report flow, the same TRC statements are providing a summary of test pattern data regardless of whether it conforms to any given TRC constraints. Most TRC statements can be used in either context. The definitions in this standard are written from the constraint point of view. 1.1 Scope Define structures in STIL for the specification of resource mapping of ATE hardware architectures. An example of resource mapping is the assignment of tester resources to waveform characters that are used in STIL vectors. Define structures in STIL for including ATE-specific instructions in-line with the STIL data. Define structures in STIL that allow for “incremental processing” whereby, a set of STIL files may be targeted to multiple ATE systems by allowing separately identified ATE data to coexist. Define structures in STIL for defining tester rules checks to ensure that the set of generated STIL files conform to the selected resources on one or more ATE systems. Define structures in STIL for the specification of the resources required for the execution of a set of STIL files on a given ATE system. 1.2 Purpose Transferring “tester independent” test program/pattern data as represented in STIL to a specific ATE system is a desired capability. It is required to be able to completely and unambiguously specify how the STIL program/patterns are mapped onto a specific testers resources. Because of the various different use models for the creation and consumption of test data, it is necessary to enable certain operations (such as rules For each target tester ATE Software User Software - Generic - Device oriented - Generic - Device oriented - Tester directed Modules comprising a test
