IEEE-1193-2003.pdf

IEEE Std 1193-2003 (Revision of IEEE Std 1193-1994) IEEE Standards 1193 TM IEEE Guide for Measurement of Environmental Sensitivities of Standard Frequency Generators Published by The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA 12 March 2004 IEEE Standards Coordinating Committee 27 Sponsored by the IEEE Standards Coordinating Committee 27 on Time and Frequency IEEE Standards Print: SH95139 PDF: SS95139 Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:57:46 MDTNo reproduction or networking permitted without license from IHS -,-,- Recognized as an American National Standard (ANSI) IEEE Std 1193-2003 (Revision of IEEE Std 1193-1994) IEEE Guide for Measurement of Environmental Sensitivities of Standard Frequency Generators Sponsor IEEE Standards Coordinating Committee 27 on Time and Frequency Approved 12 June 2003 IEEE-SA Standards Board Approved 17 September 2003 American National Standards Institute Abstract: Standard frequency generators that include all atomic frequency standards, quartz oscillators, dielectric resonator oscillators, yttrium-iron-garnet oscillators, cavity oscillators, sapphire oscillators, and thin-film resonator based oscillators are addressed. Keywords: atomic clock, atomic frequency standard, environmental sensitivities, frequency standard, oscillator, quartz crystal oscillator, standard frequency generator The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright © 2004 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 12 March 2004. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. NOTEAttention is called to the possibility that implementation of this standard may require use of subject mat- ter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patents for which a license may be required by an IEEE standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:57:46 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright © 2004 IEEE. All rights reserved.iii Introduction (This introduction is not part of IEEE Std 1193-2003, IEEE Guide for Measurement of Environmental Sensitivites of Standard Frequency Generators.) Techniques to characterize and measure the frequency and phase instabilities in frequency and time devices and in received radio signals are of fundamental importance to all manufacturers and users of frequency and time technology. In 1988, the IEEE Standards Coordinating Committee 27 (SCC27) Time and Frequency, issued IEEE Std 1139TM-1988, Standard Definitions of Physical Quantities for Fundamental Frequency and Time Metrology, which defined and confirmed those measures of instability in frequency generators that had gained general acceptance by researchers, designers, and users throughout the world. In 1999, the SCC27 issued a revision of this standard, IEEE Std 1139TM-1999. After issuing IEEE Std 1139-1988, SCC27 then embarked on a much more ambitious effort aimed not only at codifying proper terminology, but also at providing guidelines for the characterizations and use of frequency and time standards in realistic environments. In 1994, the SCC27 issued the result of this work, IEEE Std 1193TM-1994, which covered all important environmental conditions to which time and frequency devices are normally exposed. This standard aids the designer and manufacturer in characterizing their product and helps the user to properly accept, test, and confirm the specified behavior of devices in a variety of environmental conditions. This standard is a revision of IEEE Std 1193-1994, which had been prepared by a previous SCC27 consisting of Helmut Hellwig, Chair; John R. Vig, Vice Chair; David Allan; Arthur Ballato; Michael Fischer; Sigfrido Leschiutta; Joseph Suter; Richard Sydnor; Jacques Vanier; and Gernot M. R. Winkler. Many sections of the 1994 standard remain unchanged. Participants The following is a list of participants in the IEEE Standards Coordinating Committee 27 (SCC27) Time and Frequency. Eva S. Ferre-Pikal, Chair John R. Vig, Vice Chair The following members of the balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. James C. Camparo Leonard S. Cutler Christopher Ekstrom Lute Maleki Victor S. Reinhardt William J. Riley Fred L. Walls Joseph D. White Gary Donner Eva S. Ferre-Pikal William George Fossey Fernando GenKuong Robert Graham Yeou-Song Lee Gregory Luri Ahmad MahinFallah Lute Maleki Gary Michel Lisa M. Nelson Charles Ngethe Johannes Rickmann James Ruggieri Steven Tilden Donald Voltz Zhenxue Xu Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:57:46 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright © 2004 IEEE. All rights reserved.iv When the IEEE-SA Standards Board approved this standard on 12 June 2003, it had the following membership: Don Wright, Chair Howard M. Frazier, Vice Chair Judith Gorman, Secretary *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Alan Cookson, NIST Representative Satish K. Aggarwal, NRC Representative Don Messina IEEE Standards Project Editor H. Stephen Berger Joe Bruder Bob Davis Richard DeBlasio Julian Forster* Toshio Fukuda Arnold M. Greenspan Raymond Hapeman Donald M. Heirman Laura Hitchcock Richard H. Hulett Anant Jain Lowell G. Johnson Joseph L. Koepfinger* Tom McGean Steve Mills Daleep C. Mohla William J. Moylan Paul Nikolich Gary Robinson Malcolm V. Thaden Geoffrey O. Thompson Doug Topping Howard L. Wolfman Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:57:46 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright © 2004 IEEE. All rights reserved.v CONTENTS 1.Overview 1 1.1 Scope 1 1.2 Purpose. 1 1.3 Summary 2 1.3.1General considerations in the metrology of environmental sensitivities (refer to Clause 3) 2 1.3.2Acceleration effects (refer to Clause 4). 2 1.3.3Temperature, humidity, and pressure (refer to Clause 5) 2 1.3.4Electric and magnetic fields. 3 1.3.5Ionizing and particle radiation (refer to Clause 7). 3 1.3.6Aging, warm-up time, and retrace (refer to Clause 8). 3 2.References 3 3.General considerations in the metrology of environmental sensitivities and relativistic effects. 4 3.1 General. 4 3.2 Analytical methods 4 3.3 Measurement methods. 7 3.4 Interactions among environmental stimuli 9 3.5 Error budgets 11 3.6 Transient effects and aging 13 3.7 Additional considerations 15 3.7.1Relativistic effects on clocks . 15 3.7.2Testing microprocessor-driven clocks. 15 4.Acceleration effects . 16 4.1 Description of the phenomena. 16 4.2 Effects and test methods 18 4.2.1Quasi-static acceleration 18 4.2.2Vibration effects 20 4.2.3Shock . 23 4.3 Other effects. 24 4.3.1Frequency multiplication. 24 4.3.2Large modulation index. 24 4.3.3Two-sample deviation 24 4.3.4Integrated phase noise, phase excursions, jitter, and wander 25 4.3.5Spectral responses at other than the vibration frequency 26 4.3.6Acceleration effects on crystal filters 26 4.4 Special user notes. 27 4.4.1Interactions with other environmental effects and other pitfalls . 27 4.4.2Safety issues. 28 5.Temperature, humidity, and pressure 29 5.1 Description of the phenomena. 29 5.2 Effects and test methods 30 5.2.1Effects of temperature, humidity, and pressure (THP) 30 5.2.2Test methods for temperature, humidity, and pressure 32 5.2.3Guidelines for documenting results. 33 5.3 Special user notes. 33 5.3.1Device positioning. 33 Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:57:46 MDTNo reproduction or networking permitted without license from IHS -,-,- viCopyright © 2004 IEEE. All rights reserved. 5.3.2Temperature gradients . 34 5.3.3Sealed devices 34 5.3.4Quartz crystals . 34 5.3.5Rubidium devices 35 5.3.6Cesium beam devices. 35 5.3.7Hydrogen masers . 36 5.3.8Frequency drift and THP . 36 5.3.9Some pitfalls 36 6.Electric and magnetic field effects. 37 6.1 Description of the phenomena. 37 6.1.1Electric field effects. 37 6.1.2Magnetic field effects 37 6.1.3Electromagnetic interface (EMI) effects 37 6.2 Effects and test methods 37 6.2.1Electric fields. 37 6.2.2Magnetic fields 38 6.2.3Electromagnetic interference. 40 6.3 Some pitfalls 42 7.Ionizing and particle radiation. 42 7.1 Description of the phenomena. 42 7.1.1General discussion. 42 7.1.2Previous investigations 42 7.2 Effects and test methods 43 7.2.1Total dose due to ionization. 43 7.2.2High dose rate environments . 45 7.2.3Electromagnetic pulse (EMP) effects 45 7.3 Special user notes. 48 7.3.1Response of frequency standards to radiation . 48 7.3.2Test procedures 49 7.3.3Radiation test facilities. 51 7.3.4Single event phenomena 53 8.Aging, warm-up time, and retrace. 54 8.1 Description of the phenomena. 54 8.1.1Aging . 54 8.1.2Warm-up time 55 8.1.3Retrace. 56 8.2 Effects and test methods 56 8.2.1Aging . 56 8.2.2Warm-up time (Twu). 57 8.2.3Retrace. 58 8.3 Special user notes. 59 8.3.1Drift vs aging. 59 8.3.2Crystal oscillators 59 8.3.3Rubidium frequency standards 59 8.3.4Rubidium-crystal oscillators 60 8.3.5Hydrogen masers . 60 8.3.6Cesium-beam frequency standards 60 Annex A(informative) Bibliography 61 Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:57:46 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright © 2004 IEEE. All rights reserved.1 IEEE Guide for Measurement of Sensitivities of Standard Frequency Generators 1. Overview 1.1 Scope Standard frequency generators include atomic frequency standards, quartz oscillators, dielectric resonator oscillators (DROs), yttrium-iron-garnet (YIG) oscillators, cavity oscillators, sapphire oscillators, and thin- film resonator (TFR) based oscillators. Excluded are oscillators with a frequency stability worse than approximately 10-4, as well as all other active and passive electronic equipment such as receivers, amplifiers, filters, and so on. There are three distinctly different areas of concern for environmental testing and specifications listed as follows: a)Fitness for specific user needs and actual environments (tests attempt to mimic the anticipated environments) b)Characterization of the unit (tests attempt to provide “pure” coefficients for the various environments) c)Reliability and survival (tests attempt to stress the unit by either going to extremes of operating ranges or by repeated application of stimuli, e.g., cycling) This document puts emphasis on b) above. It provides guidance and a conceptual framework rather than a prescription of procedures that must be followed. It emphasizes proper methodology and practice; it cautions against pitfalls. It also is concerned with economic issues, i.e., the potential resource requirements and their minimization in test and measurement. In summary, this IEEE guide is not a specification document, but rather a resource document for deriving specification statements. 1.2 Purpose This document describes the nature of the environmental effects, as well as of the test methods to evaluate, quantify, and report (i.e., in specifications) the sensitivity of the frequency of standard frequency generators under environmental influences such as magnetic fields, atmospheric pressure, humidity, shock, vibration, acceleration, temperature, ionizing radiation, and intermittent operation. Its primary purpose is to aid in writing specifications and to verify specified performance through measurement. In addition, this document Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:57:46 MDTNo reproduction or networking permitted without license from IHS -,-,- IEEE Std 1193-2003IEEE GUIDE FOR MEASUREMENT OF ENVIRONMENTAL SENSITIVITIES 2Copyright © 2004 IEEE. All rights reserved. will help to assure consistency and repeatability of environmental sensitivity measurements, and the portability of results on particular frequency sources between the various segments of the time and frequency community. 1.3 Summary The very broad scope of this guide makes it desirable to introduce the many individual environmental phenomena in summary fashion. The following subclauses will assist the user of this guide in rapidly identifying those passages of this document that are relevant. 1.3.1 General considerations in the metrology of environmental sensitivities (refer to Clause 3) Environmental effects on precision oscillators may be evaluated by a)Identification of relevant parameters and transducing factors through correlation and spectral analyses b)Control or removal of systematic effects (through curve-fitting, differentiation, etc.) c)Evaluation of residual random errors by means of two-sample variances and covariances and an error budget analysis Given an adequate measurement system, frequency reference, and control over experimental conditions, optimal data reduction involves choices as to parameter range, sampling time, averaging process, and math- ematical model. Matters may be complicated by nonlinear responses, intercorrelations, different time constants, transient effects, and aging. If quasi-state conditions are not applicable, explicit account should be taken of the temporal and spatial profile of the stimulus. 1.3.2 Acceleration effects (refer to Clause 4) The effects of acc