IEEE-C37.09-AMD-1-2005-R2007.pdf
IEEE Std C37.09a-2005 (Amendment to IEEE Std C37.09-1999) C37.09a TM IEEE Standard Test Procedure for AC High-Voltage Circuit Breakers Rated on a Symmetrical Current Basis Amendment 1: Capacitance Current Switching 3 Park Avenue, New York, NY10016-5997, USA IEEE Power Engineering Society Sponsored by the Switchgear Committee 16 September 2005 Print: SH95336 PDF: SS95336 The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright © 2005 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 16 September 2005. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. NOTEAttention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the exist- ence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patents for which a license may be required by an IEEE standard or for conducting inquiries into the legal valid- ity or scope of those patents that are brought to its attention. -,-,- Copyright © 2005 IEEE. All rights reserved. iii Introduction The capacitance current switching standards have been completely revised. A joint IEEE/IEC task force developed a revised approach to capacitance current switching standardization. IEC has published this task forces work as part of IECs new circuit breaker standard, designated IEC 62271-100. IEC 62271-100 replaces the old IEC 56. In the interest of harmonization of high-voltage circuit breaker standards, a joint meeting of the IEC 17A, the IEEE/PES Switchgear Committee, and the IEEE/PES Substations Committee was held in Vienna VA, in May 1995. One of the outcomes of that meeting was a decision to form a joint IEEE/IEC task force to revise the standards for capacitance current switching. The task force was given the IEC designation “IEC SC17A WG21 TF10.” It was agreed that the work of this task force (TF10) would serve as the basis for capacitance current switching standards in IEC and IEEE. The task force had two 2-day meetings, one in Clamart, France in September 1995 and one in Berlin Germany in December 1995. The task force was comprised of the following: The work of the above task force has been incorporated into the new IEC circuit breaker standard IEC 62271-100 (formerly IEC 56) published in May 2001. The IEEE version is comprised of IEEE Std C37.04a , IEEE Std C37.09a, and a revised set of tables in ANSI C37.06. Slight modifications to the IEC version have been made to reflect North American practice. Additionally, slight modifications to the text have been made for the North American reader, such as “Earth” is replaced by “Ground.” Most of the text is the same and certain usage may be unfamiliar, but is understandable to the discriminating reader. In keeping with IEC Circuit Breaker Standard philosophy, the capacitance current switching ratings have been “unbundled.” A “basic” circuit breaker has either an overhead line switching rating (outdoor circuit breaker), or a cable switching rating (indoor circuit breaker) Capacitor bank ratings, both single bank and back to back, or additional OH or cable ratings must be specified separately. Three classes of circuit breaker regarding restriking performance are specified. “Class C0” has a probability of restrike up to one restrike per operation, and its capacitance current switching performance can be com- pared to the former “general purpose circuit breaker” defined in IEEE Std C37.04 -1979. “Class C1” has a restriking performance similar to the old “definite purpose circuit breaker” defined in IEEE Std C37.04- 1979 and is called “low probability of restrike.” Class C2 is intended to have a very low probability of restriking, about 1/10 or less than that of a class C1 circuit breaker. A probability of restrike classification is applicable to each capacitance current switching rating. For circuit breakers rated 362 kV and above, a single phase test voltage factor of 1.4 (recovery voltage of 2.8 p.u.) is required for the overhead line switching test duties. (This is an option in IEC 62271-100.) The pur- pose of this requirement is to acknowledge the long transmission lines and low coefficient of grounding, common in North America. This is an increase from the 1.2 single phase test voltage factor (2.4 p.u. recov- ery voltage) requirement in IEEE Std C37.04-1979. For circuit breakers rated 72.5 kV and below the same 1.4 single phase test voltage factor is required for all capacitance current switching duties. This is to allow for the many ungrounded systems that exist at 72.5 kV and below. IEC 62271-100 requires this only at R. W. Alexander (IEEE) D. Dufournet (IEEE and IEC) R. Jeanjean (IEEE and IEC) H. Kempen (IEC) R. O' Leary (IEEE) P. Riffon (IEC) M. Seeger (IEC) N. Trapp (IEC) This introduction is not part of IEEE Std C37.09a-2005, IEEE Standard Test Procedure for AC High-Voltage Circuit Breakers Rated on a Symmetrical Current BasisAmendment 1: Capacitance Current Switching. iv Copyright © 2005 IEEE. All rights reserved. 52 kV and below. This is a slight decrease in the requirement for a 1.5 single phase test voltage factor (3.0 p.u. recovery voltage) for capacitance current testing in IEEE Std C37.09-1999. IEEE Std C37.012 “IEEE Application Guide for Capacitance Current Switching for AC High-Voltage Cir- cuit Breakers Rated on a Symmetrical Current Basis” is being revised to align with this new approach and to alert the user concerning these changes. Notice to users Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/ standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patents or patent applications for which a license may be required to implement an IEEE standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention. Copyright © 2005 IEEE. All rights reserved. v Participants At the time this standard was completed, the members of the working group included: Roy W. Alexander, Chair The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. Robert Behl Stan Billings Anne Bosma John Brunke Pat DiLillo Randy Dotson Denis Dufournet Tom Field David Galicia Ruben Garzon Mietek Glinkowski Keith I. Gray Chuck Hampe Harry Hirz Luther Holloman Richard Jackson Robert Jeanjean Steven R. Lambert Franco Lo Monaco R. William Long Anthony Mannarino Mark Mcvey Peter Meyer Georges F. Montillet Richard Moore Yasin I. Musa Jeffrey H. Nelson R. Kirkland Smith Mel Smith Rao Sunkara Charles L. Wagner Richard York Roy W. Alexander W. J. (Bill) Bergman Stan Billings Anne Bosma Lyne Brisson John Brunke Ted Burse Carlos Cabrera-Rueda Guru Dutt Dhingra Alexander Dixon Denis Dufournet Doug Edwards Marcel Fortin Ruben Garzon Harry Gianakouros Randall Groves John E. Harder Harold L. Hess Edward Horgan Richard Jackson Aftab Khan Joseph L. Koepfinger Stephen R. Lambert Ward E. Laubach George Lester Albert Livshitz Franco Lomonaco R. William Long Gregory Luri Antonio Mannarino Nigel McQuin Steven Meiners Peter Meyer Gary Michel Daleep Mohla Georges Montillet Yasin Musa Kyaw Myint Jeffrey Nelson Miklos Orosz T. W. Olsen Jeanjean Robert Hugh Ross Joseph Rostron James Ruggieri E. William Schmunk Devki Sharma David Singleton R. Kirkland Smith David Stone Rao Sunkara Stanton Telander Norbert Trapp Michael Wactor Charles Wagner Jeffrey Williams James Wilson Larry Yonce Richard York Jan Zawadzki -,-,- vi Copyright © 2005 IEEE. All rights reserved. When the IEEE-SA Standards Board approved this standard on 20 March 2005, it had the following membership: Don Wright, Chair Steve M. Mills, Vice Chair Judith Gorman, Secretary *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish K. Aggarwal, NRC Representative Richard DeBlasio, DOE Representative Alan Cookson, NIST Representative Don Messina IEEE Standards Project Editor Chuck Adams Stephen Berger Mark D. Bowman Joseph A. Bruder Bob Davis Roberto de Marca Boisson Julian Forster* Arnold M. Greenspan Mark S. Halpin Raymond Hapeman Richard J. Holleman Richard H. Hulett Lowell G. Johnson Joseph L. Koepfinger* Hermann Koch Thomas J. McGean Daleep C. Mohla Paul Nikolich T. W. Olsen Ronald C. Petersen Gary S. Robinson Frank Stone Malcolm V. Thaden Doug Topping Joe D. Watson Copyright © 2005 IEEE. All rights reserved. vii Contents 3.Definitions 1 4.Design tests 2 4.10 Capacitance current switching tests. 2 4.10.1 Applicability 2 4.10.2 General. 2 4.10.3 Characteristics of supply circuits. 3 4.10.4 Grounding of the supply circuit. 3 4.10.5 Characteristics of the capacitive circuit to be switched. 4 4.10.6 Waveform of the current 5 4.10.7 Test voltage 6 4.10.8 Test current 7 4.10.9 Test-duties 7 4.10.10Tests with specified TRV. 16 4.10.11Criteria to pass the test. 17 Annex C (informative) Capacitance Current Switching 21 Annex D (informative) Bibliography. 26 -,-,- Copyright © 2005 IEEE. All rights reserved. 1 IEEE Standard Test Procedure for AC High-Voltage Circuit Breakers Rated on a Symmetrical Current Basis Amendment 1: Capacitance Current Switching NOTEThe editing instructions contained in this amendment define how to merge the material contained herein into the existing base standard and its amendments to form the comprehensive standard. The editing instructions are shown in bold italic. Four editing instructions are used: change, delete, insert, and replace. Change is used to make small corrections in existing text or tables. The editing instruction specifies the location of the change and describes what is being changed by using strikethrough (to remove old material) and underscore (to add new material). Delete removes existing material. Insert adds new material without disturbing the existing material. Insertions may require renumbering. If so, renumbering instructions are given in the editing instruction. Replace is used to make large changes in existing text, subclauses, tables, or figures by removing existing material and replacing it with new material. Editorial notes will not be carried over into future editions because the changes will be incorporated into the base standard. 3. Definitions Replace the text in Clause 3 with the following: For the purposes of this standard, the following terms and definitions apply. These definitions are not intended to embrace all possible meanings of the terms. They are intended solely to establish the meanings of terms used in power switchgear. IEEE Std C37.100 and IEEE Std C37.04a B4 1 should be referenced for terms not defined in this clause. 3.1 Close-open time: Interval of time between the instant when the contacts touch in the first pole during a closing operation and the instant when the arcing contacts have separated in all poles during the subsequent opening operation. NOTEUnless otherwise stated, it is assumed that the opening release incorporated in the circuit-breaker is energized at the instant when the 52a contacts close in the trip circuit during the closing operation. This represents the minimum close-open time. 2 1 The numbers in brackets correspond to those of the bibliography in Annex D. 2 Notes in text, tables, and figures are given for information only and do not contain requirements needed to implement the standard. -,-,- IEEE Std C37.09a-2005IEEE STANDARD TEST PROCEDURE FOR AC HIGH-VOLTAGE CIRCUIT BREAKERS RATED ON 2 Copyright © 2005 IEEE. All rights reserved. 3.2 Non-sustained disruptive discharge (NSDD): A disruptive discharge associated with current interrup- tion that does not result in the resumption of power frequency current or, in the case of capacitance current interruption, does not result in current at the natural frequency of the circuit. NOTEOscillations following NSDDs are associated with the stray capacitance and inductance local to, or of the cir- cuit breaker itself. NSDDs may also involve the stray capacitance to ground of nearby equipment. 4. Design tests Replace the title of 4.10 with the following: 4.10 Capacitance current switching tests Replace the text in 4.10 with the following: 4.10.1 Applicability Capacitance current switching tests are applicable to all circuit-breakers since line charging interrupting cur- rent is assigned to all outdoor circuit breakers, and cable charging interrupting current is assigned to all indoor breakers. Tests are required to demonstrate the following ratings when assigned: Rated line-charging breaking current (required for all outdoor circuit breakers, optional for indoor circuit breakers) Rated cable-charging breaking current (required for indoor circuit breakers, optional for outdoor cir- cuit breakers) Rated single-capacitor bank breaking current (optional for all circuit breakers) Rated back-to-back capacitor bank breaking current (optional for all circuit breakers) Rated back-to-back capacitor bank inrush making current (optional for all circuit breakers) Preferred values of rated capacitance switching currents are given in Tables 1C, 2C, 3E of ANSI C37.06 B1. NOTE 1The determination of overvoltages when switching capacitor currents is not covered by this standard. See IEEE Std 1036 B6 for guidance. NOTE 2An explanatory note on capacitance current switching is given in C.3. 4.10.2 General Re-ignitions during the capacitance current switching tests are permitted. Three classes of circuit-beakers are defined according to their restrike performances: Class C2: very low probability of restrike during capacitance current breaking as demonstrated by specific type tests (4.10.9.1). Class C1: low probability of restrike during capacitance current breaking as demonstrated by specific type tests (4.10.9.2). Class C0: unspecified probability of restrike during capacitance current breaking allows up to one restrike per operation. Suitabi
