IEEE-N42.5-1965-R1991.pdf

IEEE N42.5 65 m 4805702 0055548 4 m ' ANSI N42.5-1965 (Reaffirmed 1977) American National Standard Bases for GM Counter Tubes Approved September 20,1965 as N3.1-1965 Reaffirmed and Redesignated June 16,1971 as N42.5-1965 Reaffirmed November 9,1977 Reaffirmed March 11,1991 American National Standards Institute ANSI N42.6-1980 (Revision of ANSI N4 2.6-196 5 ) American National Standard Interrelationship of Quartz-Fiber Electrometer Type Exposure Meters and Companion Exposure Meter Chargers Secretariat for N42 Institute of Electrical and Electronics Engineers, Inc Approved Februaq 15,1978 Reaffirmed April 30,1985 Reaffirmed March 11,1991 American Nationai Standards institute The Institute of Electrical and Electronics Engineers, Inc 345 East 47th Street, New York, NY 10017 Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/20/2007 08:32:35 MDTNo reproduction or networking permitted without license from IHS -,-,- IEEE NY2.5 6.5 Y805702 00555Y9 h W American National Standard An American National Standard implies a consensus of those sub- stantially concerned with its scope and provisions. An American National Standard is intended as a guide to aid the manufacturer, the consumer, and the general public. The existence of an American National Standard does not in any respect preclude anyone, whether he has approved the standard or not, from manufacturing, marketing, purchasing, or using products, processes, or procedures not conforming to the standard. American National Standards are subject to periodic review and users are cautioned to obtain the latest editions. CAUTION NOTICE: This American National Standard may be revised or withdrawn at any time. The procedures of the American National Standards Institute require that action be taken to reaffirm, revise, or withdraw this standard no later than five years from the date of publication. Purchasers of American National Standards may receive current information on all standards by calling or writing the American National Standards Institute, O Copyright 1980 by The Institute of Electrical and Electronics Engineers, Inc No part o f this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publisher. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/20/2007 08:32:35 MDTNo reproduction or networking permitted without license from IHS -,-,- IEEE N42-5 65 = 4805702 0055550 2 Foreword (This Foreword is not a part of ANSI N42.6-1980, American National Standard Interrelationship of Quartz-Fiber Electrometer Type Exposure Meters and Companion Exposure Meter Chargers.) The first version of this standard was approved as ANSI N3-1965 on September 20, 1965 after being letter ballotted on June 2, 1964 by ANSI Technical Committee N 3 (Now N 42). It was reaf- firmed in 1971, based on N 42 letter ballot of December 14,1970, and w a s redesignated as N 42.6. The standard has been revised and the revision approved by N 42 letter ballot of May 16,1977. At the time it approved this standard, the American National Standards Committee N 42 on Rad- iation Instrumentation had the following personnel: Louis Costreii, Chairman David C. Cook, Secretary Organization Represented Name of Representative American Chemical Society. American Conference of Governmental Industrial Hygienists. Jesse Lieberman American Industrial Hygiene Association. . American Nuclear Society. . Frank W, Manning American Society of Mechanical Engineers. P. E. Greenwood American Society of Safety Engineers. . Atomic Industrial Forum Health Physics Society. . J. B. Homer Kuper Robert L. Butenhoff (Ait) Institute of Electrical and Electronics Engineers . Louis Costrell D. C. Cook (Aft) P. J. Spurgin (Alt) J. Forster (Alt) Instrument Society of America M. T. Slind J. E. Kaveckis (Ait) Lawrence Berkeley Laboratory Lee J . Wagner Manufacturing Chemists Association. National Electrical Manufacturers Association. 1 . Theodore Hamburger Oak Ridge National Laboratory Frank W. Manning D. J. Knowles (Alt) US Department of the Army, Materiel Command Abraham E. Cohen US Department of Commerce, National Bureau of Standards. Louis Costrell US Civil Defense Preparedness Agency. . Carl R. Siebentritt, Jr US Naval Research Laboratorv. David C. Cook Scientific Apparatus Makers Association US Department of Energy. . Members-at-Large . J. G. Bellian O. W. Bilharz S. H. Hanauer John M. Gallagher, Jr Voss A. Moore R. F. Shea E. J. Vallairo C a r l R. Siebentritt, Jr, of the US C i v i l Defense Preparedness Agency served as project leader for this standard and the following constituted the review group: Argonne Nationai Laboratory . Air Force System Command. . Army Electronics Command Baird Atomics Battelle Northwest Laboratory. Brookhaven National Laboratory . Dosimeters,Inc . Nationai Bureau of Standards . Naval Electronic Systems Command . Nuclearhociates . Oak Ridge National Laboratory US Civil Defense Preparedness Agency. . Victoreen Instrument Co Health Physics Division Harley Piltingsrud A. E. Cohen Dosimeter Products Specialist Lyle Carter Charles Meinhold Thomas Jackson Thomas Loftus C. S. Hollander H. Glasser John Auzier E. F. Williams J. G. Johnston Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/20/2007 08:32:35 MDTNo reproduction or networking permitted without license from IHS -,-,- IEEE N42-5 65 4805702 0055553 4 B ANSI N4 2.5-1 965 American National Standard Bases or GM Counter Tubes Standard bases for CM counter tubes shall be as I l 3-Pin “Pee Wee” base (JETEC-A3-1l with the fol- follows: lowing pin connections: - Pin No. Conrlection I Cathode 2 Anode 3 No Connection (2) &Pin “Medium” base (JETEC-AC91 with the fol- lowing pin connections: - Pin No. Connect ion 1 No Connection 2 Anode 3 No Connection 4 Cat hode Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/20/2007 08:32:35 MDTNo reproduction or networking permitted without license from IHS -,-,- IEEE N42-5 65 4805702 0055552 b American National Standard Interrelationship of QuartzXiber Ëleckometer Type Exposure Meters and Companion Exposure Meter Chargers 1. Purpose and Scope The purpose of this standard is to specify interrelating mechanical and electrical prop- erties so that quartz-fiber exposure meters may be used with any charger, Other characteristics peculiar to these devices but not affecting the interrelationship between chargers and ex- posure meters are purposely omitted, These are described in ANSI N13.5-1972. 2. Quartz-Fiber Exposure Meters 2 . 1 zero set voltages. The voltage required for zero set shall be in the range of 140 V to 195 V. 2 . 2 distance to charging electrode. The distance from the end of the exposure meter to the charging electrode shall be 5.59 k 0.76 mm (0.220 f 0.030 in) in the charging position, and 3.81 mm (0.150 in) minimum in the normal position (see Fig i ) . 2 . 3 force to close switch in exposure meter. The charging electrode shall make electrical contact with the internal plectrometer under an applied force of from 2% lb (11 N) to 5% lb (25 N) over a temperature range of -10 “C to 50 “C (14 O F to 122 OF). 2 . 4 charging rece88 diameter. The diameter of the charging recess shall be 9.27 f 0.13 mm (0.365 k 0.005 in) to a depth of at least 4.83 mm (0,190 in). The diameter of the charging recess shall be a minimum of 9.14 mm (0.360 in) to a depth of at least 6.60 mm (0.260 in). 2 . 5 outside diameter. The exposure meter shall be a uniform right cylinder and shall have an outside diameter, exclusive of the clip and marking, of 15.9 mm (0.625 in) maximum and 12.57 mm (0.495 in) minimum. 2 . 6 length. The exposure meter shall not ex- ceed 115 mm (4.5 in) in length. 2 . 7 center electrode diameter. The charging electrode shall have an outside diameter of from 1.02 mm (0.040 in) to 2.54 mm (0.100 in). If a tube, the electrode shall have a wall thickness of at least 0.25 mm (0.010 in) and the tube shall have a closed end. 2 . 8 electrode concentricity. The charging elec- trode shall be coaxial with the charging recess to within 0.13 mm (0.005 in). 3. Exposure Meter Charger 3.1 charger voltage. The charging potential shall be continuously variable between 100 V and 220 V and shall be of positive polarity. 3.2 pedestal height. The overall active height of the pedestal from the top of the charging electrode to the top of the bottoming feature shall be 9.53 1 : 1.91 mm (0.375 2 0,075 in). 3.3 bottom feature. As an exposure meter is moved downward over the charging contact assembly, forces in excess of 8 lb (36 N) shall cause the exposure meter barrel to bottom with the nonmoving mounting of the charging contact assembly. 3.4 charging electrode force. The charging elec- trode shall be capable of applying a force of between 6% and 8 lb (29 N and 36 N) to the charging pin of the exposure meter. In no case shall it be possible to apply more than 8 lb (36 N) to the charging pin of the exposure meter. 3.5 light switch force, The force required to activate the light switch (if included) shall be between 0.250 lb (1.1 N) and 1.5 lb (6.8 N). 5 Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/20/2007 08:32:35 MDTNo reproduction or networking permitted without license from IHS -,-,- IEEE N42.5 65 W LI805702 0055553 8 E ANSI N42.6-1980 INTERRELATIONSHIP OF QUARTZ-FIBER ELECTROMETER TYPE EXPOSURE METERS 3 . 6 pedestai diameter. The outside diameter of the charging pedestal shall be 8.76 ? 0.13 mm (0.345 ? 0.005 in). 3 . 7 charging electrode diameter. The diameter of the contact end of the charging electrode shall be 1.91 4 0.64 mm (0.075 f 0.025 in). 3 . 8 charging electrode height. The charging electrode or cap shall extend above the top of the charging pedestal no less than 0.13 mm (0.005 in) and no more than 1.02 mm (0.040 in). 3 . 9 electrode concentricity. The charging elec- trode shall be coaxial with the pedestal within 0.13 mm (0.005 in). 3.10 light switch travel. The light shall be turned on when an exposure meter is placed in position on the charging contact assembly and is moved downward a distance no greater than 3.18 mm (0.125 in). 3 . 1 1 charging recess. If the pedestal is recessed in a well, the minimum inside diameter of the charging socket well shall be 16 mm (0.630 in). 3.12 contact. The contact resistance between any two surfaces designated to be at the same electrical potential shall not exceed one megohm. 4. Exposure Meter and Charger 4 . 1 contact. During the normal charging opera- tion, the exposure meter and charger shall pro- vide for electrical contacts between both the center electrodes and the shells, or cases of each. At no time during the operation shall the contact resistance between the exposure meter and charger exceed one megohm. 4.2 light. The charging unit shaii permit the position of the indicating element on the scale of the exposure meter to be clearly resolved. If the charger has self-contained illumination, this criterion shall apply over the life of the battery utilized. 6 Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/20/2007 08:32:35 MDTNo reproduction or networking permitted without license from IHS -,-,- AND COMPANION EXPOSURE METER CHARGERS 0.010 MIN. 0.220 f 0.030 (5.59 f 0.76) EXPOSURE METER IEEE N42-5 65 Y805702 0055554 T - ANSI N42.6-1980 CHARGING PEDESTAL NOTE: Dimensions in inches and ( ) mm. Original dimensions in inches. Fig 1 Dimensions for Radiological Exposure Meter and Exposure Meter Charger 7 Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/20/2007 08:32:35 MDTNo reproduction or networking permitted without license from IHS -,-,-