ISO-10373-6-AMD-2-2003.pdf
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1、 Reference number ISO/IEC 10373-6:2001/Amd.2:2003(E) ISO/IEC 2003 INTERNATIONAL STANDARD ISO/IEC 10373-6 First edition 2001-05-31 AMENDMENT 2 2003-10-01 Identification cards Test methods Part 6: Proximity cards AMENDMENT 2: Improved RF test methods Cartes didentification Mthodes dessai Partie 6: Car
2、tes de proximit AMENDEMENT 2: Mthodes dessai RF amliores Copyright International Organization for Standardization Provided by IHS under license with ISO Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 05/08/2007 08:25:54 MDTNo reproduction or networking permitted without license
3、 from IHS -,-,- ISO/IEC 10373-6:2001/Amd.2:2003(E) PDF disclaimer This PDF file may contain embedded typefaces. In accordance with Adobes licensing policy, this file may be printed or viewed but shall not be edited unless the typefaces which are embedded are licensed to and installed on the computer
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6、tral Secretariat at the address given below. ISO/IEC 2003 All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either
7、ISO at the address below or ISOs member body in the country of the requester. ISO copyright office Case postale 56 CH-1211 Geneva 20 Tel. + 41 22 749 01 11 Fax + 41 22 749 09 47 E-mail copyrightiso.org Web www.iso.org Published in Switzerland ii ISO/IEC 2003 All rights reserved Copyright Internation
8、al Organization for Standardization Provided by IHS under license with ISO Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 05/08/2007 08:25:54 MDTNo reproduction or networking permitted without license from IHS -,-,- ISO/IEC 10373-6:2001/Amd.2:2003(E) ISO/IEC 2003 All rights res
9、erved iii Foreword ISO (the International Organization for Standardization) and IEC (the International Electrotechnical Commission) form the specialized system for worldwide standardization. National bodies that are members of ISO or IEC participate in the development of International Standards thro
10、ugh technical committees established by the respective organization to deal with particular fields of technical activity. ISO and IEC technical committees collaborate in fields of mutual interest. Other international organizations, governmental and non-governmental, in liaison with ISO and IEC, also
11、 take part in the work. In the field of information technology, ISO and IEC have established a joint technical committee, ISO/IEC JTC 1. International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2. The main task of the joint technical committee is to prep
12、are International Standards. Draft International Standards adopted by the joint technical committee are circulated to national bodies for voting. Publication as an International Standard requires approval by at least 75 % of the national bodies casting a vote. Attention is drawn to the possibility t
13、hat some of the elements of this document may be the subject of patent rights. ISO and IEC shall not be held responsible for identifying any or all such patent rights. Amendment 2 to ISO/IEC 10373-6:2001 was prepared by Joint Technical Committee ISO/IEC JTC 1, Information technology, Subcommittee SC
14、 17, Cards and personal identification. Copyright International Organization for Standardization Provided by IHS under license with ISO Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 05/08/2007 08:25:54 MDTNo reproduction or networking permitted without license from IHS -,-,- C
15、opyright International Organization for Standardization Provided by IHS under license with ISO Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 05/08/2007 08:25:54 MDTNo reproduction or networking permitted without license from IHS -,-,- ISO/IEC 10373-6:2001/Amd.2:2003(E) ISO/IEC
16、 2003 All rights reserved 1 Identification cards Test methods Part 6: Proximity cards AMENDMENT 2: Improved RF test methods Page 2, 3.2 Add the following abbreviations and symbols: fcm Frequency of the operating field during the PICC load modulation test H Field strength of the PCD antenna field m M
17、odulation index as defined in 3.3 of ISO/IEC 14443-2 t1, t2 Pulse segments as defined in Figure 2 of ISO/IEC 14443-2 tr, tf Rise and fall times as defined in Figure 4 of ISO/IEC 14443-2 Page 5, 6.1.3 Replace the 2nd note with the following: “NOTE At 13,56 MHz the approximate inductance is 250 nH and
18、 the approximate resistance is 0,4 .“ Page 6, 6.1.3 Add a note after the last note: “NOTE The high impedance oscilloscope probe ground connection should be as short as possible, less than 20 mm or coaxial connection.” Page 6, 6.2 In the 4th sentence, replace the value “50 ” for P1 with the value “10
19、 ”. Page 6, Figure 4 Replace the figure with the following: Copyright International Organization for Standardization Provided by IHS under license with ISO Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 05/08/2007 08:25:54 MDTNo reproduction or networking permitted without lice
20、nse from IHS -,-,- ISO/IEC 10373-6:2001/Amd.2:2003(E) 2 ISO/IEC 2003 All rights reserved identical length twisted pairs or coaxial cables of less than 100 mm 240 1% 240 1% P1 10 PCD antenna to oscilloscope sense coil a sense coil b + - + - + - + - probe NOTE 1 In order to avoid any unintended misali
21、gnment in case of an unsymmetrical set-up the tuning range of the potentiometer P1 is only 10 . If the set-up cannot be compensated by the 10 potentiometer P1 the overall symmetry of the set-up should be checked. NOTE 2 The high impedance oscilloscope probe ground connection should be as short as po
22、ssible, less than 20 mm or coaxial connection. Figure 4 Test set-up (principle) Page 7, 6.2.3 Add the following sentence after the first sentence: “The dimensional tolerance shall be better than 0,5 mm.” Pages 8 and 9, Clause 7 Replace 7.1, 7.2 and 7.3 with the following: 7.1 PICC load modulation am
23、plitude 7.1.1 Purpose The purpose of this test is to determine the amplitude of the PICC load modulation signal within the operating field range Hmin, Hmax as specified in the base standard. Also the functionality of the PICC for Type A and Type B within their corresponding modulation ranges as defi
24、ned in the base standard shall be determined. 7.1.2 Test procedure Step 1: The load modulation test circuit of Figure 4 and the Test PCD assembly of Figure 5 are used. Copyright International Organization for Standardization Provided by IHS under license with ISO Licensee=IHS Employees/1111111001, U
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