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    IEC 6352216 2025.docx

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    IEC 6352216 2025.docx

    1、IEdition1.02025-04INTERNATIONALSTANDARDNORMEINTERNATIONALEElectricalrelays-Testsandmeasurements-Part16:SolderingRelaiselectriques-Essaisetmesurages-Partie16:Brasage?Us)寸OIneoeeeg690山_THISPUBLICATIONISCOPYRIGHTPROTECTEDCopyright2025IEC,Geneva,SwitzerlandAllrightsreserved.Unlessotherwisespecified,nopa

    2、rtofthispublicationmaybereproducedorutilizedinanyformorbyanymeans,electronicormechanical,includingphotocopyingandmicrofilm,withoutpermissioninwritingfromeitherIECorIECsmemberNationalCommitteeinthecountryoftherequester.IfyouhaveanyquestionsaboutIECcopyrightorhaveanenquiryaboutobtainingadditionalright

    3、stothispublication,pleasecontacttheaddressbeloworyourlocalIECmemberNationalCommitteeforfurtherinformation.Droitsdereproductionreserves.Saufindicationcontraire,aucunepartiedecettepublicationnepeutetrereproduiteniUtiliseesousquelqueformequecesoitetparaucunprocede,electroniqueoumecanique,ycomprisIaphot

    4、ocopieetIesmicrofilms,sansaccordecritdeIECouduComitenationaldeIECdupaysdudemandeur.SivousavezdesquestionssurIecopyrightdeIECousivousdesirezobtenirdesdroitsSupplementairessurcettepublication,UtilisezIesCoordonneesci-apresoucontactezIeComitenationaldeIECdevotrepaysderesidence.IECSecretariat3,ruedeVare

    5、mbeCH-1211Geneva20SwitzerlandTel.:+41229190211infoiec.chwww.iec.chAbouttheIECTheInternationalElectrotechnicalCommission(IEC)istheleadingglobalorganizationthatpreparesandpublishesInternationalStandardsforallelectrical,electronicandrelatedtechnologies.AboutIECpublicationsThetechnicalcontentofIECpublic

    6、ationsiskeptunderconstantreviewbytheIEC.Pleasemakesurethatyouhavethelatestedition,acorrigendumoranamendmentmighthavebeenpublished.IECpublicationssearch-webstore.iec.ch/advsearchformTheadvancedsearchenablestofindIECpublicationsbyavarietyofcriteria(referencenumber,text,technicalcommittee,.).Italsogive

    7、sinformationonprojects,replacedandwithdrawnpublications.IECJustPublished-webstore.iec.ch/justpublishedStayuptodateonallnewIECpublications.JustPublisheddetailsallnewpublicationsreleased.Availableonlineandonceamonthbyemail.IECCustomerServiceCentre-webstore.iec.ch/cscIfyouwishtogiveusyourfeedbackonthis

    8、publicationorneedfurtherassistance,pleasecontacttheCustomerServiceCentre:SaleSiec.ch.IECProducts&ServicesPortal-products.iec.chDiscoverourpowerfulsearchengineandreadfreelyallthepublicationspreviews,graphicalsymbolsandtheglossary.Withasubscriptionyouwillalwayshaveaccesstouptodatecontenttailoredtoyour

    9、needs.Electropedia-www.electropedia.orgTheworldsleadingonlinedictionaryonelectrotechnology,containingmorethan22500terminologicalentriesinEnglishandFrench,withequivalenttermsin25additionallanguages.AlsoknownastheInternationalElectrotechnicalVocabulary(IEV)online.AproposdeIECLaCommissionElectrotechniq

    10、ueInternationale(IEC)estIapremiereorganisationmondialequielaboreetpubliedesNormesinternationalespourtoutcequiatraitaelectricite,aelectroniqueetauxtechnologiesapparentees.AproposdespublicationsIECLecontenutechniquedespublicationsIECestConstammentrevu.VeU川ezvousassurerquevouspossedezeditionIaplusrecen

    11、te,uncorrigendumouamendementpeutavoiretepublie.RecherchedepublicationsIEC-webstore.iec.ch/advsearchformLarechercheavanceepermetdetrouverdespublicationsIECenUtilisantdifferentscriteres(numerodereference,texte,comited,etudes,.).ElledonneaussidesinformationssurIesprojetsetIespublicationsremplaceesouret

    12、irees.IECJustPublished-webstore.iec.ch/justpublishedRestezinformesurIesnouvellespublicationsIEC.JustPublisheddetailleIesnouvellespublicationsparues.DisponibleenIigneetunefoisparmoisparemail.ServiceClients-webstore.iec.ch/cscSivousdesireznousdonnerdesCommentairessurcettepublicationousivousavezdesques

    13、tionscontactez-nous:salesiec.ch.IECProducts&ServicesPortal-products.iec.chDecouvreznotrepuissantmoteurderechercheetconsultezgratuitementtousIesaperusdespublications,symbolesgraphiquesetIeglossaire.Avecunabonnement,vousaureztoujoursaccesauncontenuajouradapteavosbesoins.Electropedia-www.electropedia.o

    14、rgLepremierdictionairedelectrotechnologieenIigneaumonde,avecplusde22500articlesterminologiquesenanglaisetenfranais,ainsiqueIestermesequivalentsdans25Ianguesadditionnelles.EgalementappeleVocabulaireElectrotechniqueInternational(IEV)enIigne.Edition1.02025-04INTERNATIONALSTANDARDNORMEINTERNATIONALEElec

    15、tricalrelays-Testsandmeasurements一Part16:SolderingRelaiselectriques-Essaisetmesurages-Partie16:BrasageINTERNATIONALELECTROTECHNICALCOMMISSIONCOMMISSIONELECTROTECHNIQUEINTERNATIONALEICS29.120.70ISBN978-2-8327-0352-6Warning!Makesurethatyouobtainedthispublicationfromanauthorizeddistributor.Attention!Ve

    16、uillezvousassurerquevousavezobtenucettepublicationviaundistributeuragree.RegisteredtrademarkoftheInternationalElectrotechnicalCommissionMarquedeposeedeIaCommissionElectrotechniqueInternationaleCONTENTSFOREWORD31 Scope52 Normativereferences53 Termsanddefinitions54 Testprocedure64.1 Purpose64.2 Proced

    17、ure64.2.1 General64.2.2 Resistancetosolderingheat64.2.3 Resistancetostandardindustrialsolderingprocesses84.2.4 Solderability5wetting-Wettingbalancedmethod94.3 Conditions105 Evaluation105.1 General105.2 Testreport11Bibliography12Figure 1 -Doublewavesolderingprofile8Figure 2 -SMTandthroughholesolderin

    18、gprofile9Table1-TestconditionsfortestTb7INTERNATIONALELECTROTECHNICALCOMMISSIONELECTRICALRELAYS-TESTSANDMEASUREMENTS-Part16:SolderingFOREWORD1) TheInternationalElectrotechnicalCommission(IEC)isaworldwideorganizationforstandardizationcomprisingallnationalelectrotechnicalcommittees(IECNationalCommitte

    19、es).TheobjectofIECistopromoteinternationalco-operationonallquestionsconcerningstandardizationintheelectricalandelectronicfields.Tothisendandinadditiontootheractivities,IECpublishesInternationalStandards,TechnicalSpecifications,TechnicalReports,PubliclyAvailableSpecifications(PAS)andGuides(hereafterr

    20、eferredtoasIECPubIication(三).Theirpreparationisentrustedtotechnicalcommittees;anyIECNationalCommitteeinterestedinthesubjectdealtwithmayparticipateinthispreparatorywork.International,governmentalandnon-governmentalorganizationsliaisingwiththeIECalsoparticipateinthispreparation.IECcollaboratescloselyw

    21、iththeInternationalOrganizationforStandardization(ISO)inaccordancewithconditionsdeterminedbyagreementbetweenthetwoorganizations.2) TheformaldecisionsoragreementsofIEContechnicalmattersexpress,asnearlyaspossible,aninternationalconsensusofopinionontherelevantsubjectssinceeachtechnicalcommitteehasrepre

    22、sentationfromallinterestedIECNationalCommittees.3) IECPublicationshavetheformofrecommendationsforinternationaluseandareacceptedbyIECNationalCommitteesinthatsense.WhileallreasonableeffortsaremadetoensurethatthetechnicalcontentofIECPublicationsisaccurate,IECcannotbeheldresponsibleforthewayinwhichtheya

    23、reusedorforanymisinterpretationbyanyenduser.4) Inordertopromoteinternationaluniformity,IECNationalCommitteesundertaketoapplyIECPublicationstransparentlytothemaximumextentpossibleintheirnationalandregionalpublications.AnydivergencebetweenanyIECPublicationandthecorrespondingnationalorregionalpublicati

    24、onshallbeclearlyindicatedinthelatter.5) IECitselfdoesnotprovideanyattestationofconformity.Independentcertificationbodiesprovideconformityassessmentservicesand,insomeareas,accesstoIECmarksofconformity.IECisnotresponsibleforanyservicescarriedoutbyindependentcertificationbodies.6) Allusersshouldensuret

    25、hattheyhavethelatesteditionofthispublication.7) NoliabilityshallattachtoIECoritsdirectors,employees,servantsoragentsincludingindividualexpertsandmembersofitstechnicalcommitteesandIECNationalCommitteesforanypersonalinjury,propertydamageorotherdamageofanynaturewhatsoever,whetherdirectorindirect,orforc

    26、osts(includinglegalfees)andexpensesarisingoutofthepublication,useof,orrelianceupon,thisIECPublicationoranyotherIECPublications.8) AttentionisdrawntotheNormativereferencescitedinthispublication.Useofthereferencedpublicationsisindispensableforthecorrectapplicationofthispublication.9) IECdrawsattention

    27、tothepossibilitythattheimplementationofthisdocumentmayinvolvetheuseof(八)patent(三).IECtakesnopositionconcerningtheevidence,validityorapplicabilityofanyclaimedpatentrightsinrespectthereof.Asofthedateofpublicationofthisdocument,IEChadnotreceivednoticeof(八)patent(三),whichmayberequiredtoimplementthisdocu

    28、ment.However,implementersarecautionedthatthismaynotrepresentthelatestinformation,whichmaybeobtainedfromthepatentdatabaseavailableathttps:/patents.iec.ch.IECshallnotbeheldresponsibleforidentifyinganyorallsuchpatentrights.IEC63522-16havebeenpreparedbyIECtechnicalcommittee94:Electricalrelays.ItisanInte

    29、rnationalStandard.ThetextofthisInternationalStandardisbasedonthefollowingdocuments:DraftReportonvoting94/1071/FDIS94/1120/RVDFullinformationonthevotingforitsapprovalcanbefoundinthereportonvotingindicatedintheabovetable.ThelanguageusedforthedevelopmentofthisInternationalStandardisEnglish.Thisdocument

    30、wasdraftedinaccordancewithISO/IECDirectives,Part2,anddevelopedinaccordancewithISO/IECDirectives,Part1andISO/IECDirectives,IECSupplement,availableatwww.iec.ch/members_experts/refdocs.ThemaindocumenttypesdevelopedbyIECaredescribedingreaterdetailatwww.iec.ch/publications.AlistofallpartsofIEC63522series

    31、publishedunderthegeneraltitleElectricalrelays-Testsandmeasurements,canbefoundontheIECwebsite.ThisInternationalStandardistobeusedinconjunctionwithIEC63522-0:-Underpreparation.Stageatthetimeofpublication:IECCDV63522-0:2024.Thecommitteehasdecidedthatthecontentsofthisdocumentwillremainunchangeduntilthe

    32、stabilitydateindicatedontheIECwebsiteunderwebstore.iec.chinthedatarelatedtothespecificdocument.Atthisdate,thedocumentwillbe reconfirmed, withdrawn,or revised.ELECTRICALRELAYS-TESTSANDMEASUREMENTS-Part16:Soldering1 ScopeThispartofIEC63522isusedfortestingalongwiththeappropriateseveritiesandconditionsf

    33、ormeasurementsandtestsdesignedtoassesstheabilityofDUTstoperformunderexpectedconditionsoftransportation,storageandallaspectsofoperationaluse.Thisdocumentdefinesastandardtestmethodforresistancetosolderingheatandsolderabilityforstandardsolderingprocesses.2 NormativereferencesThefollowingdocumentsareref

    34、erredtointhetextinsuchawaythatsomeoralloftheircontentconstitutesrequirementsofthisdocument.Fordatedreferences,onlytheeditioncitedapplies.Forundatedreferences,thelatesteditionofthereferenceddocument(includinganyamendments)applies.IEC60068-2-20:2021,Environmentaltesting-Part2-20:Tests-TestTaandTb:Test

    35、methodsforsolderabilityandresistancetosolderingheatofdeviceswithleadsIEC60068-2-69,Environmentaltesting-Part2-69:Tests-TestTe/Tc:Solderabilitytestingofelectroniccomponentsandprintedboardsbythewettingbalance(forcemeasurement)methodIEC61760-1:2020,Surfacemountingtechnology-Part1:Standardmethodforthesp

    36、ecificationofsurfacemountingcomponents(SMDs)IEC63522-0:-Underpreparation.Stageatthetimeofpublication:IECCDV63522-0:2024.3,Electricalrelays-Testsandmeasurements-Part0:GeneralandguidanceIEC63522-1:-Underpreparation.Stageatthetimeofpublication:IECFDIS63522-1:2025.4Under,Electricalrelays-Testsandmeasure

    37、ments-Part1:VisualinspectionandcheckofdimensionsIEC63522-7:-4,Electricalrelays-Testsandmeasurements-Part7:FunctionaltestsIEC63522-11:2025,Electricalrelays-Testsandmeasurements-Part11:EnclosureprotectionanddegreeOfprotection3 TermsanddefinitionsForthepurposesofthisdocument,thetermsanddefinitionsgiven

    38、inClause3ofIEC63522-0:-andthefollowingapply.ISOandIECmaintainterminologydatabasesforuseinstandardizationatthefollowingaddresses: IECElectropedia:availableathttps:/www.electropedia.org/ ISOOnlinebrowsingplatform:availableathttps:/www.iso.org/obp3.1surface-mounteddeviceSMDdevicewheretheelectricalconne

    39、ctiononthesurfaceofaconductivepatternisrealizedwithoututilizingcomponentholes4Testprocedure4.1 PurposeThesestandardmethodsareabasicqualificationfortheresistanceofsolderprocessesunderstandardconditionsorindividuallyasdefinedbythemanufacturer.Thefinalproductfittingtheselectedsolderprocessshallbeinvest

    40、igatedbytheusersundertheirresponsibility.Eachkindofdeviationfromthegiventestconditionsorprocessshallbeexplicitlydescribedinthetestreport.Insuchcaseitisnotallowedtoreferenceatestasaccordingtothisdocument.Ifthereisanydeviation,thetestreportshallbenamedassimilarto.Todetermine theabilityofrelayterminals

    41、toweteasilywithsolder, and/ortheabilityoftherelaytowithstandsolderingheat,solderterminalsandtheirsupportsshallhaveasufficientresistancetoanysolderingheat.Thesetestsareonlyapplicabletorelaysandsocketswherethemanufacturerhasspecifiedtheabilityofterminationstoasolderingprocess.NOTETherearesomeindustria

    42、lrelayswheretheterminalcouldbeusedinconjunctionwithflat-quickconnectoraswellasdirectwiresoldered.4.2 Procedure4.2.1 GeneralThefollowingsolderingheatresistancetestsaredefinedasstandardtestsforrelays.4.2.2 Resistancetosolderingheat4.2.2.1 Method-Solderingironmethod4.2.2.1.1 PurposeTheobjectofthistesti

    43、stoevaluatethesolderabilityofrelayterminationsandabilitytowithstandtheheatingstressproducedbysolderingiron.4.2.2.1.2 ProcedureThetestiscarriedoutaccordingtotestTbofIEC60068-2-20asgiveninTable1formethod2ortheconditionsindividuallyspecifiedbythemanufacturer.TheconditionsofIEC60068-2-20arerecommended,b

    44、utifsolderingisdifficult,theconditionsshallbestatedindividuallybythemanufacturer.AfunctionaltestaccordingtoIEC63522-7shallbeperformedbeforeaswellasafterthesoldering.4.2.2.2 Method-Solderbath4.2.2.2.1 PurposeTheobjectofthistestistodetailastandardtestmethodtoevaluatethesolderabilityofrelayterminations

    45、towithstandtheheatingstressesproducedbyamasssolderingoperation.4.2.2.2.2 Procedure4.2.2.2.2.1 GeneralThetestiscarriedoutaccordingtotestTbofIEC60068-2-20asgiveninTable1.AfunctionaltestaccordingtoIEC63522-7shallbeperformedbeforeaswellasafterthesoldering.Table1-TestconditionsfortestTbSubclausesofIEC600

    46、68-2-20:2021Conditions5.1.2FunctionaltestaccordingtoIEC63522-7asinitialmeasurementMethod15.2.4Method1A:solderbathat(2603)5.2.4Durationofimmersion:(50,5)s5.3.3Method2:solderingironat350Method25.3.1SolderingironofsizeB5.3.3Nocoolingdevice5.3.3Durationofapplicationofthesolderingiron:(101)s4.2.2.2.2.2 S

    47、olderpins(terminals)ThetestiscarriedoutaccordingtotestTbofIEC60068-2-20asgiveninTable1formethod1.Terminalsformountingonprintedcircuitboardsshallbefittedwithathermalscreen(simulatingaprintedboard)of(1,50,1)mmthickness.Duringthetest,immersionshallbeeffectuatedonlyuptothelowersurfaceofthisscreen.Thescr

    48、eenshallbeusedinsteadofaprintedcircuitboard(PCB).NOTEToavoidanyinfluencefromthescreentothewetting,screenswithholediameters1mmlargerthanthepinsizearecommonlyused.4.2.2.2.2.3 Othersolderterminations(e.g.solderinglugs)Thistestshallbecarriedoutasindicatedbythemanufacturerinaccordancewithtestmethod1asgiveninTable1.4.2.2.3 Terminalsforsurfacemounting(SMD)Thistestsh


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